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Statistical Analysis of Electroplated Indium (III) Sulfide (In2S3) Films, a Potential
Buffer Material for PV (Heterojunction Solar Cells) Systems, using Organic
Electrolytes
Maqsood Ali Mughal*
, Michael Jason Newell*
, Joshua Vangilder*
, Shyam Thapa*
, John Hall***
, David
McNew***
, Frederick Felizco**
, Kayla Wood***
, Dr. Robert Engelken*,***
, Dr. B. Ross Carroll****
, and Dr.
J. Bruce Johnson****
*
Environmental Sciences Graduate Program
**
Engineering Management Graduate Program
***
Electrical Engineering Program
****
Physics Program
Arkansas State University, State University (Jonesboro), AR 72467
(870)972-3227 (Telephone); (870)972-3948 (FAX); bdengens@astate.edu (email)
ABSTRACT
In2S3 has received attention as an alternative to CdS as
the buffer layer in heterojunction solar cells. Although
having a bandgap of 2.0 eV relative to 2.5 eV for CdS, the
lower toxicity and environmental impact of indium relative
to cadmium, and significant photosensitivity, compel
ongoing research [1]. Indium sulfide thin films were
deposited onto molybdenum-coated glass (SiO2) substrates
by electrodeposition from organic baths (ethylene glycol-
based) containing indium chloride (InCl3), sodium chloride
(NaCl), and sodium thiosulfate (Na2S2O3.5H2O), the latter
used as an additional sulfur source along with elemental
sulfur (S). The Taguchi method was used to optimize the
deposition paramters so as to minimize non-uniformity,
cracks, and improper stoichiometry. The measured
performance characteristics (molar ratio (In:S) and crack
density) for all of the In2S3 films were calculated to analyze
the effect of each deposition factor (deposition voltage,
deposition temperature, composition of solution, and
deposition time) involved in the electrodeposition process
by calculating the sensitivity (signal to noise, S/N, ratios).
Keywords: In2S3, Taguchi method, electrodeposition, solar
cell, thin film
1 INTRODUCTION
In2S3 is an important member of III-VI group midgap
semiconducting sulfides, applicable for optoelectronics,
solar cells, and photoelectric devices [2]. Scientists have
been involved in conducting investigations for last few
years now to study novel materials with enhanced material
properties. After intensive research efforts they have
yielded fundamental understanding that In2S3 can be a non-
toxic alternative to CdS in copper indium gallium
selenide/sulfide (CIGS)-based solar cells [3], [4]. In2S3 is a
promising buffer material for photovoltaic applications
because of its stability, wider bandgap, and
photoconductive behavior [5]. It has good
photoluminescence properties [6], [7]. Several reports have
been published on deposition of In2S3 thin films by
different deposition techniques (both wet and dry), both in
thin film and powder form, with diverse morphologies [5].
In In2S3-based CIGS solar cells, efficiencies of 15.7% have
been achieved, which is slightly less than the 16%
efficiency reported for CdS-based solar cells deposited by
chemical bath deposition (CBD) [8]. Electrodeposited
In2S3-based CIGSe solar cells have yielded 10.2%
efficiency [9].
Electrodeposition is considered to be a low-cost
technique for applying thin films on a substrate with full
coverage and high growth yield [10]. It provides high
material transfer/utilization efficiency, precision control
with proper bath chemistry, and environmental safety in
terms of solvent emissions [9]. However, there are several
deposition parameters which can affect the properties of
In2S3 thin films. Therefore, it is important to determine the
optimal deposition parameters for the electrodeposition of
In2S3 thin films to obtain proper stoichiometry, crystalline
structure, and morphology.
In this paper, we present studies on electrodeposition of
In2S3 films onto molybdenum-coated glass. The Taguchi
method was used to obtain optimal deposition parameters
based upon the data obtained from scanning electron
microscopy (SEM), digital image (from SEM) analysis, and
energy dispersive X-ray spectroscopy (EDS). The goal was
to avoid non-uniformity, cracks, and improper
stoichiometry. The statistical analysis helped us to analyze
the effect of each deposition factor on the stoichiometry and
the morphology of In2S3 films.
2 TAGUCHI METHOD
The “Taguchi method” are statistical methods
developed by Genichi Taguchi to optimize the procedure
and improve the quality of industrially manufactured
products. These methods are frequently applied to
engineering, pharmaceutical, and biotechnology industries
today [11].
The Taguchi method was developed in 1954 to bring
improvements in the quality of a product. Taguchi believed
that this robust design can help to minimize (if not
eliminate) the loss of quality which results in an ultimate
cost to society [12]. He defined the sensitivity (signal-to-
noise ratio, S/N) for the response analysis (characteristic
performance) of selected physical quantities. This analysis
helps to compare the performance of a product with
changing S/N ratios depending upon procedures (in our
case deposition parameters and their levels). The S/N ratio
can combine with the Taguchi orthogonal array for the
design of experiments and predict values(optimal) to
achieve improved performance in the product and the
process [11].
It is a very suitable method to statistically analyze the
study of thin film coatings, because there are so many
deposition parameters involved in electrodeposition that
could have an impact on the properties of In2S3 thin films.
In the past, the Taguchi method has been applied to various
thin film (CuInSe2, TiN, Ni) coatings synthesized by
different deposition methods [11], [12], [13].
3 EXPERIMENTAL DETAILS
The electrodeposition was carried out in a three-
electrode cell configuration using an organic bath of S
(precipitated, 99.5%), Na2S2O3.5H2O (pentahydrate, 99+
%), InCl3 (anhydrous, 99.99 %, metal basis), and NaCl
(Puratronic®, 99.999%, metal basis) with three different
compositions. Ethylene glycol was used as a solvent.
Based upon preliminary results, a range of optimal
electrodeposition parameters (factors and their levels):
deposition voltage, deposition temperature, composition of
solution, and deposition time, were selected.
A three electrode-cell was used for all the experiments
in this work. A Ag/AgCl reference electrode from Fisher
Scientific filled with KCl and C2H2O6, a Mo-coated glass
substrate (Mo sputtered onto 0.12-inch thick silicon glass; 1
inch x 1 inch) as the working electrode (cathode), and
graphite (1.25 inch x 1.25 inch) as a counter electrode
(anode) were used. A digital potentiostat (WaveNow) from
Pine Research Instrumentation was used for supplying
electrode potential and for cyclic voltammetry. A digital
stirring hotplate from Fisher Scientific (ISOTEMP 11-400-
49SHP) was used to heat and stir the solution. Magnetic
agitation of the organic bath was produced with a
commercial Teflon-coated magnetic stir bar centered in the
bottom of the glass beaker to achieve laminar rotations.
The stir rate was kept constant at 300 rpm.
Molybdenum-coated glass substrates were cleaned in an
acetone solution in an ultrasonic bath (Branson 2510) and
vibrated for 5 min. The organic electrolytic solution was
prepared by dissolving elemental S in 150 ml of ethylene
glycol by heating the solution at 150o
C. Once the S was
fully dissolved, the solution was cooled down to 80o
C, and
then InCl3 (0.05 M), and NaCl (0.1 M) were added to
solution. Na2S2O3.5H2O (used as an additional source for
sulfur) was added to solution after InCl3 and NaCl were
dissolved. The solution was continuously stirred to avoid
aging of the colloid and the precipitation of sulfur in the
cell. The solution was then used for electroplating In2S3.
After deposition, In2S3 films were slowly cooled down to
room temperature by dipping in ethylene glycol, and then
rinsed with distilled water and acetone. All the samples
were stored in an airtight plastic box.
3.1 Taguchi Design of Experiments (DOE)
For the present work, an orthogonal array of L27 was
selected for conducting experiments at three levels for four
factors, as shown in Table 1. The levels for each deposition
factor were chosen such as to cover practically all the
combinations where optimal conditions could potentially
exist. According to orthogonal array L27, there were a total
of 27 experiments needed for this study. For each
experiment, three trials were performed to achieve high
accuracy in the data. Hence, a total number of 81
experiments were performed. With the Taguchi method, the
analyses consisted of analysis of mean (ANOM) and
analysis of variance (ANOVA) for S/N ratios. The effect of
each control factor at a given level on the quality of In2S3
film can be best estimated using ANOM. The basic goal of
ANOVA is to estimate the variance in the film quality,
owing to the control factor in terms of S/N ratios.
Level
Deposition
Voltage
(V)
Deposition
Time (min)
Composition of
Solution
Deposition
Temperature
(o
C)
1 -0.6 3
0.1M S + 0.05M
InCl3 + 0.1M
NaCl
150
2 -0.7 6
0.1M S + 0.1M
Na2S2O3.5H2O
+0.05 M InCl3 +
0.1M NaCl
160
3 -0.8 9
0.2M S + 0.05 M
InCl3 + 0.1M
NaCl
170
Table 1: Control Factors and Levels for the
Electrodeposition of In2S3 Thin Films
In the past, our electrodeposited In2S3 films have shown
good stoichiometries but poor morphologies. Films are
usually non-uniform and thicker around the edges, and
sometimes flake away into the solution when pulled out
from the cell. The films have shown cracks which could
possibly result in loss of charged carriers and insufficient
electrical transport within the solar cell. Therefore, for this
study, the measured performance characteristic (or object
function) were selected to be crack density (number/87.36
µm square) and molar ratio (In:S) to avoid those issues. To
study the crack behavior as a function of deposition
parameters, digital analysis of SEM images was performed
using a fracture and buckling analysis program. This
program has been written using MATLAB Version 7.1
(R14). It investigates and detects the dark features of the
image compare to the average intensity of the image. The
crack density is determined by linear analysis. A line
pattern (over the selected area of interest) is superimposed
to the SEM image, where this line pattern is perpendicular
to cracks. The intersection between the analysis lines and
cracks are determined [14]. Hence, the crack density is
determined by dividing the number of intersections with the
commulative line length, as shown in Fig.1(a). Hence, SEM
images were taken for all 81 In2S3 films to calculate crack
density. Similarly, molar ratio (S/In) was determined for all
81 films using EDS. Ideally 60% S and 40% In yield a
stoichiometric ratio (S/In) of 3/2. The EDS pattern for
Experiment No. 2 (Trial 1) is shown in Fig. 1 (b), verifying
that the film contains S and In.
4 RESULTS AND DISCUSSION
The cracked morphology of electrochemically deposited
In2S3 thin films have been reported previously by several
scientists, for instance in [15], [16], and [17]. The reason is
still not fully known. In our study, we found that the
deposition voltage and deposition time are, respectively, the
most and second-most significant deposition factors in
terms of eliminating cracks and obtaining proper
stoichiometry, and that deposition temperature is the least
significant. The interaction between the factors, deposition
voltage and deposition time, is also significant, compared to
other factors. These results are visualized using Minitab’s
(Version 16) mean effect plot for means, as shown in Fig. 2
(a). This plot is used in conjunction with ANOVA and DOE
to examine differences among level means for one or more
factors. The optimal values obtained from the plot for four
deposition factors are encircled. The points in the plot are
the mean of the response variables (crack density and S/In
molar ratio) at the various levels of each factor, with a
reference line drawn at the grand mean of the response data.
Further, orthogonal regression equations are formulated for
estimating predicted values of crack density and
stoichiometry over a specifed range of deposition voltage,
the most significant factor of all, as shown in Fig. 2 (b) and
(c). The films deposited with these predicted values
produced uniform In2S3 thin films with planar-surface
morphology, and S/In ratio of 59/41.
In our study, we observed that the In2S3 films tend to
start cracking from the edge of the substrate. As the
deposition voltage/time increases, those cracks tend to
propagate into the middle part of the substrate causing the
film to eventually flake and fall into the solution. The films
grown at higher (-0.8 V) negative potential yielded In- rich
films.
Figure 1: (a) Fracture and Buckling Analysis Program, (b)
EDS Pattern of the In2S3 Film from Experiment No. 2.
Figure 2: (a) Mean Effect Plot for Means (Crack Density
and S/In Molar Ratio), (b) Orthogonal Regression Plot of
Crack Density (number/87.36 µm square) vs. Deposition
Voltage with Fitted Line, and (c) Orthogonal Regression
Plot of Molar Ratio vs. Deposition Voltage (S/In) with
Fitted Line.
5 CONCLUSION
In2S3 films with good stoichiometric ratios and planar
surface morphologies have been successfully deposited
onto Mo-coated glass from an organic bath by
electrodeposition. The optimized deposition parameters
obtained from Taguchi analysis were as follows: deposition
voltage, -0.6 V; deposition time, 3 min; composition of
solution, 0.1 M S + 0.1 M Na2S2O3.5H2O; and deposition
temperature, 150 o
C. ANOVA analysis for means and S/N
ratios showed that deposition voltage has the largest impact
on the stoichiometry and crack density of the films, and that
deposition temperature has the least significant impact.
Also deposition voltage and deposition time together
showed stronger interaction (largest impact on the
performance characteristic) between them compared to
a
S
In
b c
S
In
other deposition factors. Furthermore, the orthogonal
regression analysis produced plots which predicted values
for deposition voltage to achieve desired characteristic
performance. These predicted values were as follows: -0.69
V for achieving proper S/In ratio and -0.62 V for achieving
films with non-crack morphology.
Acknowledgements
This work is jointly funded by National Science
Foundation Grant EPS 1003970 and NASA Grant
NNX09AW22A, respectively administered by the Arkansas
Science and Technology Authority (Dr. Gail McClure,
Cathy Ma, and Marta Collier) and the Arkansas Space
Grant Consortium (Dr. Keith Hudson and Laura Holland).
The authors also thank the Principal Investigators on the
projects, respectively Dr. Alan Mantooth and assistant
Kathy Kirk (University of Arkansas-Fayetteville), and Dr.
Tansel Karabacak (University of Arkansas-Little Rock).
The authors also thank Dr. Stan Trauth of Arkansas
State University for use of the SEM/EDS unit, and Dr. A.
Taylor of the Erich Schmid Institute of Materials Science,
Austrian Academy of Sciences, for his useful discussions
about determination of crack density.
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Statistical analysis of electrodeposited in2 s3 films techconnect conference

  • 1. Statistical Analysis of Electroplated Indium (III) Sulfide (In2S3) Films, a Potential Buffer Material for PV (Heterojunction Solar Cells) Systems, using Organic Electrolytes Maqsood Ali Mughal* , Michael Jason Newell* , Joshua Vangilder* , Shyam Thapa* , John Hall*** , David McNew*** , Frederick Felizco** , Kayla Wood*** , Dr. Robert Engelken*,*** , Dr. B. Ross Carroll**** , and Dr. J. Bruce Johnson**** * Environmental Sciences Graduate Program ** Engineering Management Graduate Program *** Electrical Engineering Program **** Physics Program Arkansas State University, State University (Jonesboro), AR 72467 (870)972-3227 (Telephone); (870)972-3948 (FAX); bdengens@astate.edu (email) ABSTRACT In2S3 has received attention as an alternative to CdS as the buffer layer in heterojunction solar cells. Although having a bandgap of 2.0 eV relative to 2.5 eV for CdS, the lower toxicity and environmental impact of indium relative to cadmium, and significant photosensitivity, compel ongoing research [1]. Indium sulfide thin films were deposited onto molybdenum-coated glass (SiO2) substrates by electrodeposition from organic baths (ethylene glycol- based) containing indium chloride (InCl3), sodium chloride (NaCl), and sodium thiosulfate (Na2S2O3.5H2O), the latter used as an additional sulfur source along with elemental sulfur (S). The Taguchi method was used to optimize the deposition paramters so as to minimize non-uniformity, cracks, and improper stoichiometry. The measured performance characteristics (molar ratio (In:S) and crack density) for all of the In2S3 films were calculated to analyze the effect of each deposition factor (deposition voltage, deposition temperature, composition of solution, and deposition time) involved in the electrodeposition process by calculating the sensitivity (signal to noise, S/N, ratios). Keywords: In2S3, Taguchi method, electrodeposition, solar cell, thin film 1 INTRODUCTION In2S3 is an important member of III-VI group midgap semiconducting sulfides, applicable for optoelectronics, solar cells, and photoelectric devices [2]. Scientists have been involved in conducting investigations for last few years now to study novel materials with enhanced material properties. After intensive research efforts they have yielded fundamental understanding that In2S3 can be a non- toxic alternative to CdS in copper indium gallium selenide/sulfide (CIGS)-based solar cells [3], [4]. In2S3 is a promising buffer material for photovoltaic applications because of its stability, wider bandgap, and photoconductive behavior [5]. It has good photoluminescence properties [6], [7]. Several reports have been published on deposition of In2S3 thin films by different deposition techniques (both wet and dry), both in thin film and powder form, with diverse morphologies [5]. In In2S3-based CIGS solar cells, efficiencies of 15.7% have been achieved, which is slightly less than the 16% efficiency reported for CdS-based solar cells deposited by chemical bath deposition (CBD) [8]. Electrodeposited In2S3-based CIGSe solar cells have yielded 10.2% efficiency [9]. Electrodeposition is considered to be a low-cost technique for applying thin films on a substrate with full coverage and high growth yield [10]. It provides high material transfer/utilization efficiency, precision control with proper bath chemistry, and environmental safety in terms of solvent emissions [9]. However, there are several deposition parameters which can affect the properties of In2S3 thin films. Therefore, it is important to determine the optimal deposition parameters for the electrodeposition of In2S3 thin films to obtain proper stoichiometry, crystalline structure, and morphology. In this paper, we present studies on electrodeposition of In2S3 films onto molybdenum-coated glass. The Taguchi method was used to obtain optimal deposition parameters based upon the data obtained from scanning electron microscopy (SEM), digital image (from SEM) analysis, and energy dispersive X-ray spectroscopy (EDS). The goal was to avoid non-uniformity, cracks, and improper stoichiometry. The statistical analysis helped us to analyze the effect of each deposition factor on the stoichiometry and the morphology of In2S3 films. 2 TAGUCHI METHOD The “Taguchi method” are statistical methods developed by Genichi Taguchi to optimize the procedure and improve the quality of industrially manufactured products. These methods are frequently applied to
  • 2. engineering, pharmaceutical, and biotechnology industries today [11]. The Taguchi method was developed in 1954 to bring improvements in the quality of a product. Taguchi believed that this robust design can help to minimize (if not eliminate) the loss of quality which results in an ultimate cost to society [12]. He defined the sensitivity (signal-to- noise ratio, S/N) for the response analysis (characteristic performance) of selected physical quantities. This analysis helps to compare the performance of a product with changing S/N ratios depending upon procedures (in our case deposition parameters and their levels). The S/N ratio can combine with the Taguchi orthogonal array for the design of experiments and predict values(optimal) to achieve improved performance in the product and the process [11]. It is a very suitable method to statistically analyze the study of thin film coatings, because there are so many deposition parameters involved in electrodeposition that could have an impact on the properties of In2S3 thin films. In the past, the Taguchi method has been applied to various thin film (CuInSe2, TiN, Ni) coatings synthesized by different deposition methods [11], [12], [13]. 3 EXPERIMENTAL DETAILS The electrodeposition was carried out in a three- electrode cell configuration using an organic bath of S (precipitated, 99.5%), Na2S2O3.5H2O (pentahydrate, 99+ %), InCl3 (anhydrous, 99.99 %, metal basis), and NaCl (Puratronic®, 99.999%, metal basis) with three different compositions. Ethylene glycol was used as a solvent. Based upon preliminary results, a range of optimal electrodeposition parameters (factors and their levels): deposition voltage, deposition temperature, composition of solution, and deposition time, were selected. A three electrode-cell was used for all the experiments in this work. A Ag/AgCl reference electrode from Fisher Scientific filled with KCl and C2H2O6, a Mo-coated glass substrate (Mo sputtered onto 0.12-inch thick silicon glass; 1 inch x 1 inch) as the working electrode (cathode), and graphite (1.25 inch x 1.25 inch) as a counter electrode (anode) were used. A digital potentiostat (WaveNow) from Pine Research Instrumentation was used for supplying electrode potential and for cyclic voltammetry. A digital stirring hotplate from Fisher Scientific (ISOTEMP 11-400- 49SHP) was used to heat and stir the solution. Magnetic agitation of the organic bath was produced with a commercial Teflon-coated magnetic stir bar centered in the bottom of the glass beaker to achieve laminar rotations. The stir rate was kept constant at 300 rpm. Molybdenum-coated glass substrates were cleaned in an acetone solution in an ultrasonic bath (Branson 2510) and vibrated for 5 min. The organic electrolytic solution was prepared by dissolving elemental S in 150 ml of ethylene glycol by heating the solution at 150o C. Once the S was fully dissolved, the solution was cooled down to 80o C, and then InCl3 (0.05 M), and NaCl (0.1 M) were added to solution. Na2S2O3.5H2O (used as an additional source for sulfur) was added to solution after InCl3 and NaCl were dissolved. The solution was continuously stirred to avoid aging of the colloid and the precipitation of sulfur in the cell. The solution was then used for electroplating In2S3. After deposition, In2S3 films were slowly cooled down to room temperature by dipping in ethylene glycol, and then rinsed with distilled water and acetone. All the samples were stored in an airtight plastic box. 3.1 Taguchi Design of Experiments (DOE) For the present work, an orthogonal array of L27 was selected for conducting experiments at three levels for four factors, as shown in Table 1. The levels for each deposition factor were chosen such as to cover practically all the combinations where optimal conditions could potentially exist. According to orthogonal array L27, there were a total of 27 experiments needed for this study. For each experiment, three trials were performed to achieve high accuracy in the data. Hence, a total number of 81 experiments were performed. With the Taguchi method, the analyses consisted of analysis of mean (ANOM) and analysis of variance (ANOVA) for S/N ratios. The effect of each control factor at a given level on the quality of In2S3 film can be best estimated using ANOM. The basic goal of ANOVA is to estimate the variance in the film quality, owing to the control factor in terms of S/N ratios. Level Deposition Voltage (V) Deposition Time (min) Composition of Solution Deposition Temperature (o C) 1 -0.6 3 0.1M S + 0.05M InCl3 + 0.1M NaCl 150 2 -0.7 6 0.1M S + 0.1M Na2S2O3.5H2O +0.05 M InCl3 + 0.1M NaCl 160 3 -0.8 9 0.2M S + 0.05 M InCl3 + 0.1M NaCl 170 Table 1: Control Factors and Levels for the Electrodeposition of In2S3 Thin Films In the past, our electrodeposited In2S3 films have shown good stoichiometries but poor morphologies. Films are usually non-uniform and thicker around the edges, and sometimes flake away into the solution when pulled out from the cell. The films have shown cracks which could possibly result in loss of charged carriers and insufficient electrical transport within the solar cell. Therefore, for this study, the measured performance characteristic (or object function) were selected to be crack density (number/87.36 µm square) and molar ratio (In:S) to avoid those issues. To
  • 3. study the crack behavior as a function of deposition parameters, digital analysis of SEM images was performed using a fracture and buckling analysis program. This program has been written using MATLAB Version 7.1 (R14). It investigates and detects the dark features of the image compare to the average intensity of the image. The crack density is determined by linear analysis. A line pattern (over the selected area of interest) is superimposed to the SEM image, where this line pattern is perpendicular to cracks. The intersection between the analysis lines and cracks are determined [14]. Hence, the crack density is determined by dividing the number of intersections with the commulative line length, as shown in Fig.1(a). Hence, SEM images were taken for all 81 In2S3 films to calculate crack density. Similarly, molar ratio (S/In) was determined for all 81 films using EDS. Ideally 60% S and 40% In yield a stoichiometric ratio (S/In) of 3/2. The EDS pattern for Experiment No. 2 (Trial 1) is shown in Fig. 1 (b), verifying that the film contains S and In. 4 RESULTS AND DISCUSSION The cracked morphology of electrochemically deposited In2S3 thin films have been reported previously by several scientists, for instance in [15], [16], and [17]. The reason is still not fully known. In our study, we found that the deposition voltage and deposition time are, respectively, the most and second-most significant deposition factors in terms of eliminating cracks and obtaining proper stoichiometry, and that deposition temperature is the least significant. The interaction between the factors, deposition voltage and deposition time, is also significant, compared to other factors. These results are visualized using Minitab’s (Version 16) mean effect plot for means, as shown in Fig. 2 (a). This plot is used in conjunction with ANOVA and DOE to examine differences among level means for one or more factors. The optimal values obtained from the plot for four deposition factors are encircled. The points in the plot are the mean of the response variables (crack density and S/In molar ratio) at the various levels of each factor, with a reference line drawn at the grand mean of the response data. Further, orthogonal regression equations are formulated for estimating predicted values of crack density and stoichiometry over a specifed range of deposition voltage, the most significant factor of all, as shown in Fig. 2 (b) and (c). The films deposited with these predicted values produced uniform In2S3 thin films with planar-surface morphology, and S/In ratio of 59/41. In our study, we observed that the In2S3 films tend to start cracking from the edge of the substrate. As the deposition voltage/time increases, those cracks tend to propagate into the middle part of the substrate causing the film to eventually flake and fall into the solution. The films grown at higher (-0.8 V) negative potential yielded In- rich films. Figure 1: (a) Fracture and Buckling Analysis Program, (b) EDS Pattern of the In2S3 Film from Experiment No. 2. Figure 2: (a) Mean Effect Plot for Means (Crack Density and S/In Molar Ratio), (b) Orthogonal Regression Plot of Crack Density (number/87.36 µm square) vs. Deposition Voltage with Fitted Line, and (c) Orthogonal Regression Plot of Molar Ratio vs. Deposition Voltage (S/In) with Fitted Line. 5 CONCLUSION In2S3 films with good stoichiometric ratios and planar surface morphologies have been successfully deposited onto Mo-coated glass from an organic bath by electrodeposition. The optimized deposition parameters obtained from Taguchi analysis were as follows: deposition voltage, -0.6 V; deposition time, 3 min; composition of solution, 0.1 M S + 0.1 M Na2S2O3.5H2O; and deposition temperature, 150 o C. ANOVA analysis for means and S/N ratios showed that deposition voltage has the largest impact on the stoichiometry and crack density of the films, and that deposition temperature has the least significant impact. Also deposition voltage and deposition time together showed stronger interaction (largest impact on the performance characteristic) between them compared to a S In b c S In
  • 4. other deposition factors. Furthermore, the orthogonal regression analysis produced plots which predicted values for deposition voltage to achieve desired characteristic performance. These predicted values were as follows: -0.69 V for achieving proper S/In ratio and -0.62 V for achieving films with non-crack morphology. Acknowledgements This work is jointly funded by National Science Foundation Grant EPS 1003970 and NASA Grant NNX09AW22A, respectively administered by the Arkansas Science and Technology Authority (Dr. Gail McClure, Cathy Ma, and Marta Collier) and the Arkansas Space Grant Consortium (Dr. Keith Hudson and Laura Holland). The authors also thank the Principal Investigators on the projects, respectively Dr. Alan Mantooth and assistant Kathy Kirk (University of Arkansas-Fayetteville), and Dr. Tansel Karabacak (University of Arkansas-Little Rock). The authors also thank Dr. Stan Trauth of Arkansas State University for use of the SEM/EDS unit, and Dr. A. Taylor of the Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, for his useful discussions about determination of crack density. REFERENCES [1] N. A. Allsop, A. Schönmann, H. J. Muffler, M. Bär, M. C. Lux-Steiner, and Ch. H. Fischer, “Spray- ILGAR Indium Sulfide Buffers for Cu(In,Ga)(S,Se)2 Solar Cells”, Progress in Photovoltaics: Research and Applications, 13, 607- 616, 2005. [2] X. Sheng, L. Wang, G. Chen and D. Yang, “Simple Synthesis of Flower Like In2S3 Structures and Their Use as Templates to Prepare CuS Particles”. Journal of Nanomaterials , 2011, 5-10, 2010. [3] L. Binder and I. Gurrappa, “Electrodeposition of Nanostructured Coatings and Their Characterization-A Review”, Science and Technology of Advanced Materials , 9, 11-15, 2008. [4] W. Wang, W. Zhu and L. Zhang, “A Facile Preparation and Visible Light-Induced Photocatalysis of Indium Sulfide Superstructure”, Chemistry and Material Science, 35, 761-767, 1998. [5] A. Dutta, S. K. Panda, S. Gorai, D. Ganguli, S. Chaudhuri, “ Room Temperature Synthesis of In2S3 Micro- and Nanorod Textured Thin Films”. ScienceDirect , 43, 983-989, 2008. [6] R. Jayakrishnan, T. T. John, C. S. Kartha, K. P. Vijayakumar, T. Abe and Y. Kashiwaba, “Defect Analysis of Sprayed β-In2S3 Thin Films Using Photoluminescence Studies”, Semiconductor Science and Technology , 20, 1162, 2005. [7] M. Lajnef and H. Ezzaaouia, “Structural and Optical Studies of Indium Sulfide Thin Films Prepared by Sulfurization of Indium Thin Films”, The Open Applied Physics Journal, 2, 23-26, 2009. [8] K. Govender, D. S. Boyle and P. O’Brien, “Improved Routes Towards Solution Deposition of Indium Sulfide Thin Films for Photovoltaic Applications”, Materials Research Society , 692, H9.33-38, 2002. [9] N. Naghavia, E. Chassaing, S. Galanti, G. Renou, M. Soro, M. Bouttemy, A. Etcheberry, and D. Lincot, “Electrodeposition of In2S3 Buffer Layer for Cu(In,Ga)Se2 Solar Cells”, European Materials Research Society Conference Symposium, Advanced Inorganic Materials and Concepts for Photovoltaics, Electrochemical Society, 10, 155- 160, 2012. [10] W. Schwarzacher, “Electrodeposition: A Technology for the Future”. The Electrochemical Society Interface, Spring 2006. [11] W. Liu, S. Hsieh, W. Chen, and J. Lee, “Synthesis of the CunInSe2 Thin Film for Solar Cells Using the Electrodeposition Technique and Taguchi Method”, International Journal of Minerals, Metallurgy and Materials, 16, 101-107, 2009. [12] D. M. Steinberg and D. Burnsztyn, “Noise Factors, Dispersion Effects, and Robust Design”. Center for Quality and Product Improvement, University of Wisconsin, 107, 1993. [13] S.H. Kang, Y. K. Kim, D.S. Choi, and Y. E. Sung, “Characterization of Electrodeposited CuInSe2 (CIS) Film”, Electrochemica Acta, 51, 4433-4439, 2006. [14] S. Frank and R. Spolenak, “Determination of Crack and Buckle Density by Digital Image Analysis”, Laboratory for Nanometallurgy, ETH Zurich, Switzerland. [15] A. M. Abdel Haleem, M. Ichimura, “Electrochemical Deposition of Indium Sulfide Thin Films using Tw-Step Pulse Biasing”, Thin Solid Films, 516, 7783-7789, 2008. [16] A. M. Abdel Haleem, M. Sugiyama, and M. Ichimura, “Sulfurization of the Electrochemically Deposited Indium Sulphide Oxide Thin Film and Its Photovoltaic Applications”, Materials Sciences and Applications, 3, 802-806, 2012. [17] R. S. Mane and C.D. Lokhande, “Studies on Structural, Optical, and Electrical Properties of Indium Sulfide Thin Films”, Materials Chemistry and Physics, 78, 15–17, 2002.