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Advanced Functionality
Agenda

            Process Variability

            Commissioning PID




[File Name or Event]
Emerson Confidential
27-Jun-01, Slide 2
Impact of Reduced
 Process Variability
      Hard Spec.       Operating              Operating Average Shift
        Limit           Average




                       Feedstock and Scrap Cost
                       Productivity
                       Product Quality
[File Name or Event]
Emerson Confidential
27-Jun-01, Slide 3
Statistical Process Monitoring




[File Name or Event]
Emerson Confidential
27-Jun-01, Slide 4
Statistical Process Monitoring




[File Name or Event]
Emerson Confidential
27-Jun-01, Slide 5
Measurement of Process Variability *

 Process
 Value




                                                             Time

  “Capability”                                                                   “Total”: All Data
  Only Random                                                                    Including Short
  or Short Term                                                                  and Long Term
  Variability                                                                    Variability
                       Reference: ‘Achieving Workd Class Manufacturing through
                          Process Control’ by Joseph Shunta, Dupont, 1995*
[File Name or Event]
Emerson Confidential
27-Jun-01, Slide 6
Variability Indicators May be Added To
  Fieldbus Devices
                                (X         -X)             (Xi     - Xi -1 )
                                 n                          n
                                              2                              2
                                        i
                       Stot =   i =1
                                                  Scap =   i =2
                                       n -1                       2 (n -1)




     Total and Capability
    Standard Deviation is
    Calculated by I/O and
       Control Blocks



[File Name or Event]
Emerson Confidential
27-Jun-01, Slide 7
Calculation Should be Done at The
  Fieldbus Device
                 2.5

                                                                      Stot
                   2


                 1.5


                   1


                 0.5                                                  SPI
                                                                      SPID
                                                                      SLQ
                   0

                       0        1       2       3       4      5

                           Ratio of process time constant to sample
                           time
                                              /T   S




             Source: World Class Manufacturing Through Process Control
[File Name or Event]
Emerson Confidential
27-Jun-01, Slide 8
Block Parameters for Total and Capability Standard
   Deviation




[File Name or Event]
Emerson Confidential
27-Jun-01, Slide 9
Detecting Abnormal
   Conditions in Input Blocks




               Status Indicates: Quality (Good, Uncertain, Bad)
                                 Reason (Device Failure, Sensor Failure, etc.)
                                 Limit (not limited, high limited, Low Limited)

[File Name or Event]
Emerson Confidential
27-Jun-01, Slide 10
Detecting Abnormal Conditions in
  Output Blocks




                Status Indicates: Quality (Good, Uncertain, Bad)
                                  Reason (Device Failure, Sensor Failure, etc.)
                                  Limit (not limited, high limited, Low Limited)

[File Name or Event]
Emerson Confidential
27-Jun-01, Slide 11
Detecting That Control is Limited by
   Downstream Conditions




                       Status Indicates:       Quality (Good, Uncertain, Bad)
                                       Reason (Device Failure, Sensor Failure, etc.)
                                       Limit (not limited, high limited, Low Limited)


[File Name or Event]
Emerson Confidential
27-Jun-01, Slide 12
Detecting Incorrect Mode of
   Operation




            Mode Attribute: Target (Operator Requested Mode)
                           Actual (Mode of operation)
                           Normal (The designed Mode)
                           Permitted( Modes that may be selected)
[File Name or Event]
Emerson Confidential
27-Jun-01, Slide 13
Host May Utilize Mode, Status and
   Statistics




[File Name or Event]
Emerson Confidential
27-Jun-01, Slide 14
Agenda

            Process Variability

            Commissioning PID




[File Name or Event]
Emerson Confidential
27-Jun-01, Slide 15
Structuring Control For A
   Distributed Environment
                   Traditional,
                   Centralized                Distributed
                   Approach                   Approach
                                  Control &
                                  Autotunin
                                  g




Limited Sample Rate,
   Delay/Variation
   introduced by
  Communications                                            /control &
                                                            Autotuning




[File Name or Event]
Emerson Confidential
27-Jun-01, Slide 16
Application Used For Tuning in
  Field Device




[File Name or Event]
Emerson Confidential
27-Jun-01, Slide 17

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Fieldbus Tutorial Part 12 - Advanced Functionality

  • 2. Agenda  Process Variability  Commissioning PID [File Name or Event] Emerson Confidential 27-Jun-01, Slide 2
  • 3. Impact of Reduced Process Variability Hard Spec. Operating Operating Average Shift Limit Average Feedstock and Scrap Cost Productivity Product Quality [File Name or Event] Emerson Confidential 27-Jun-01, Slide 3
  • 4. Statistical Process Monitoring [File Name or Event] Emerson Confidential 27-Jun-01, Slide 4
  • 5. Statistical Process Monitoring [File Name or Event] Emerson Confidential 27-Jun-01, Slide 5
  • 6. Measurement of Process Variability * Process Value Time “Capability” “Total”: All Data Only Random Including Short or Short Term and Long Term Variability Variability Reference: ‘Achieving Workd Class Manufacturing through Process Control’ by Joseph Shunta, Dupont, 1995* [File Name or Event] Emerson Confidential 27-Jun-01, Slide 6
  • 7. Variability Indicators May be Added To Fieldbus Devices (X -X) (Xi - Xi -1 ) n n 2 2 i Stot = i =1 Scap = i =2 n -1 2 (n -1) Total and Capability Standard Deviation is Calculated by I/O and Control Blocks [File Name or Event] Emerson Confidential 27-Jun-01, Slide 7
  • 8. Calculation Should be Done at The Fieldbus Device 2.5 Stot 2 1.5 1 0.5 SPI SPID SLQ 0 0 1 2 3 4 5 Ratio of process time constant to sample time  /T S Source: World Class Manufacturing Through Process Control [File Name or Event] Emerson Confidential 27-Jun-01, Slide 8
  • 9. Block Parameters for Total and Capability Standard Deviation [File Name or Event] Emerson Confidential 27-Jun-01, Slide 9
  • 10. Detecting Abnormal Conditions in Input Blocks Status Indicates: Quality (Good, Uncertain, Bad) Reason (Device Failure, Sensor Failure, etc.) Limit (not limited, high limited, Low Limited) [File Name or Event] Emerson Confidential 27-Jun-01, Slide 10
  • 11. Detecting Abnormal Conditions in Output Blocks Status Indicates: Quality (Good, Uncertain, Bad) Reason (Device Failure, Sensor Failure, etc.) Limit (not limited, high limited, Low Limited) [File Name or Event] Emerson Confidential 27-Jun-01, Slide 11
  • 12. Detecting That Control is Limited by Downstream Conditions Status Indicates: Quality (Good, Uncertain, Bad) Reason (Device Failure, Sensor Failure, etc.) Limit (not limited, high limited, Low Limited) [File Name or Event] Emerson Confidential 27-Jun-01, Slide 12
  • 13. Detecting Incorrect Mode of Operation Mode Attribute: Target (Operator Requested Mode) Actual (Mode of operation) Normal (The designed Mode) Permitted( Modes that may be selected) [File Name or Event] Emerson Confidential 27-Jun-01, Slide 13
  • 14. Host May Utilize Mode, Status and Statistics [File Name or Event] Emerson Confidential 27-Jun-01, Slide 14
  • 15. Agenda  Process Variability  Commissioning PID [File Name or Event] Emerson Confidential 27-Jun-01, Slide 15
  • 16. Structuring Control For A Distributed Environment Traditional, Centralized Distributed Approach Approach Control & Autotunin g Limited Sample Rate, Delay/Variation introduced by Communications /control & Autotuning [File Name or Event] Emerson Confidential 27-Jun-01, Slide 16
  • 17. Application Used For Tuning in Field Device [File Name or Event] Emerson Confidential 27-Jun-01, Slide 17