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All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 
1 
Device Modeling Report 
Bee Technologies Inc. 
COMPONENTS: SiC Schottky Barrier Diode 
PART NUMBER: TRS16N65D 
MANUFACTURER: TOSHIBA 
REMARK: Professional Model
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 
2 
Circuit Configuration 
DIODE MODEL PARAMETERS 
PSpice 
model 
parameter 
Model description 
IS Saturation Current 
N Emission Coefficient 
RS Series Resistance 
IKF High-injection Knee Current 
CJO Zero-bias Junction Capacitance 
M Junction Grading Coefficient 
VJ Junction Potential 
ISR Recombination Current Saturation Value 
BV Reverse Breakdown Voltage(a positive value) 
IBV Reverse Breakdown Current(a positive value) 
TT Transit Time 
EG Energy-band Gap
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 
3 
R2 
100MEG 
U1 
TRS16N65D 
R1 
0.01m 
V1 
0Vdc 
0 
V _ V 1 
0V 0.5V 1.0V 1.5V 2.0V 
I(R1) 
0A 
1.0A 
2.0A 
3.0A 
4.0A 
5.0A 
6.0A 
7.0A 
8.0A 
Forward Current Characteristics 
Circuit Simulation result 
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 
4 
Comparison Graph Circuit Simulation result 
Comparison table 
IF (A) VF (V) %Error Measurement Simulation 0.5 0.980 0.978 -0.20 1 1.030 1.034 0.39 2 1.120 1.120 0.00 5 1.330 1.323 -0.53 8 1.500 1.503 0.20
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 
5 
V ( R ) 
100mV 1.0V 10V 100V 1.0KV 
I(V2)/(650V/10u) 
10p 
100p 
1.0n 
0 
R 
V1 
TD = 0 
TF = 100ns 
PW = 100us 
PER = 10m 
V1 = 0 
TR = 10us 
V2 = 650 
V2 
0Vdc 
R2 
100MEG 
U1 
TRS16N65D 
Junction Capacitance Characteristic 
Circuit Simulation result 
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 
6 
Comparison Graph Circuit Simulation result 
Comparison table 
VR (V) Cj (pF) %Error Measurement Simulation 0.1 590.000 577.200 -2.17 1 500.000 509.200 1.84 10 260.000 256.600 -1.31 20 190.000 181.850 -4.29 50 120.000 116.250 -3.13 100 85.000 88.340 3.93
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 
7 
V _ V 1 
100V 200V 300V 400V 500V 600V 
I(R1) 
1.0nA 
10nA 
100nA 
1.0uA 
10uA 
U1 
V1 TRS16N65D 
0Vdc 
R1 
100m 
0 
R2 
1000G 
Reverse Characteristic 
Circuit Simulation result 
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 
8 
Comparison Graph Circuit Simulation result 
Comparison table 
IR (nA) VR (V) %Error Measurement Simulation 10 490.000 483.280 -1.37 100 590.000 589.600 -0.07 390 650.000 649.400 -0.09

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SPICE MODEL of TRS16N65D (Professional Model) in SPICE PARK

  • 1. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 1 Device Modeling Report Bee Technologies Inc. COMPONENTS: SiC Schottky Barrier Diode PART NUMBER: TRS16N65D MANUFACTURER: TOSHIBA REMARK: Professional Model
  • 2. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 2 Circuit Configuration DIODE MODEL PARAMETERS PSpice model parameter Model description IS Saturation Current N Emission Coefficient RS Series Resistance IKF High-injection Knee Current CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value BV Reverse Breakdown Voltage(a positive value) IBV Reverse Breakdown Current(a positive value) TT Transit Time EG Energy-band Gap
  • 3. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 3 R2 100MEG U1 TRS16N65D R1 0.01m V1 0Vdc 0 V _ V 1 0V 0.5V 1.0V 1.5V 2.0V I(R1) 0A 1.0A 2.0A 3.0A 4.0A 5.0A 6.0A 7.0A 8.0A Forward Current Characteristics Circuit Simulation result Evaluation circuit
  • 4. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 4 Comparison Graph Circuit Simulation result Comparison table IF (A) VF (V) %Error Measurement Simulation 0.5 0.980 0.978 -0.20 1 1.030 1.034 0.39 2 1.120 1.120 0.00 5 1.330 1.323 -0.53 8 1.500 1.503 0.20
  • 5. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 5 V ( R ) 100mV 1.0V 10V 100V 1.0KV I(V2)/(650V/10u) 10p 100p 1.0n 0 R V1 TD = 0 TF = 100ns PW = 100us PER = 10m V1 = 0 TR = 10us V2 = 650 V2 0Vdc R2 100MEG U1 TRS16N65D Junction Capacitance Characteristic Circuit Simulation result Evaluation circuit
  • 6. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 6 Comparison Graph Circuit Simulation result Comparison table VR (V) Cj (pF) %Error Measurement Simulation 0.1 590.000 577.200 -2.17 1 500.000 509.200 1.84 10 260.000 256.600 -1.31 20 190.000 181.850 -4.29 50 120.000 116.250 -3.13 100 85.000 88.340 3.93
  • 7. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 7 V _ V 1 100V 200V 300V 400V 500V 600V I(R1) 1.0nA 10nA 100nA 1.0uA 10uA U1 V1 TRS16N65D 0Vdc R1 100m 0 R2 1000G Reverse Characteristic Circuit Simulation result Evaluation circuit
  • 8. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 8 Comparison Graph Circuit Simulation result Comparison table IR (nA) VR (V) %Error Measurement Simulation 10 490.000 483.280 -1.37 100 590.000 589.600 -0.07 390 650.000 649.400 -0.09