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RESULTS OF IPFA 2012

“ART OF FAILURE ANALYSIS”
     PHOTO CONTEST

    TOP 12 Entries
1st PRIZE
                 “PEOPLE ON THE BEACH”
  by Lim Saw Sing, Infineon Technologies, Kulim Malaysia




Polyimide surface after expose to reactive ion etching and sputter coating prior to SEM
         imaging create an art effect resembling “many people on a beach”.
2nd PRIZE
                                   “WINGS”
             by Foo Fang Jie, Advanced Micro Devices




During fracture analysis of a silicon sample, the crack origin was identified at a series
 of chevron marks. These marks resemble a pair of wings, reminding the analyst that
                        the sky is the limit, at work and in life.
3rd PRIZE
                  “THE HOPE TERRACE”
                             by Tan Lee Koon




This is a SEM picture of wafer-edge chipping. It gives a terrace image – step-like
              spectacular landforms overlooking many prospects.
Mysterious Jungle
by Lim Chan Way, Infineon Technologies, Kulim Malaysia




 This SEM image results from the adhesion between a carbon tape (bottom) and a
                           membrane structure (top).
Happy Frog
by Lee Chee Hiong, Systems-on-Silicon Manufacturing Co.




  This is a SEM image showing a “happy frog”. It has helped us complete the process .
    Now it is standing on the passivation layer looking forward to the next challenge.
Silver Sulfide Crystals
     by Amy Ng & Angelina Lau, Micron Technology




This is a SEM image of silver sufide, Ag2S growth on a resistor network causing the
resistance of the component to increase and eventually resulting in an „open signal‟.
Lunar Eclipse
            by Joel B. Hosmillo; Analog Devices




An optical image (dark field) of a capacitor in a 400 Hz low-pass filter, damaged by
                           electrostatic discharge (ESD).
Big Nose
               by Wu Xing & Pey Kin Leong;
       Singapore University of Design and Technology




The specimen was a resistive switching memory device consisting of Ni/HfO2/Si. The
    sample was subjected to electrical stressing while being monitored by a high
resolution TEM in situ. The heat generated was so huge that the sample melted down.
       The resultant image resembles a face with two ting eyes and a big nose.
The Royal Elephant
   by Jacqueline Kwa, Advanced Micro Devices




TEM lamella preparation on a silicon sample created this image of an elephant
       decorated with headdress, getting ready to usher in the king.
Tortoise
by Nurhanani; Infineon Technologies, Kulim Malaysia




This is a SEM image of a particle embedded in a metal layer, resembling that of a
                          tortoise at the water surface.
Long-Tail Kangaroo
          by Jun Faith Rodrigo, Analog Devices




This is a FESEM image showing a foreign material on the heat sink of a MEMS
 package. The image looks like the silhouette of a kangaroo with a long tail.
Fist of Victory
    by Khoo Bing Sheng; WinTech Nano-Technology




  Raise your right arm and give a fist of victory. That is the effect of this picture
captioned “Fist of Victory – 必勝”, showing the nano fabrication capability of a FIB
             (Focused Ion Beam). The base material used is Copper.

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Ipfa2012 photo contest winners

  • 1. RESULTS OF IPFA 2012 “ART OF FAILURE ANALYSIS” PHOTO CONTEST TOP 12 Entries
  • 2. 1st PRIZE “PEOPLE ON THE BEACH” by Lim Saw Sing, Infineon Technologies, Kulim Malaysia Polyimide surface after expose to reactive ion etching and sputter coating prior to SEM imaging create an art effect resembling “many people on a beach”.
  • 3. 2nd PRIZE “WINGS” by Foo Fang Jie, Advanced Micro Devices During fracture analysis of a silicon sample, the crack origin was identified at a series of chevron marks. These marks resemble a pair of wings, reminding the analyst that the sky is the limit, at work and in life.
  • 4. 3rd PRIZE “THE HOPE TERRACE” by Tan Lee Koon This is a SEM picture of wafer-edge chipping. It gives a terrace image – step-like spectacular landforms overlooking many prospects.
  • 5. Mysterious Jungle by Lim Chan Way, Infineon Technologies, Kulim Malaysia This SEM image results from the adhesion between a carbon tape (bottom) and a membrane structure (top).
  • 6. Happy Frog by Lee Chee Hiong, Systems-on-Silicon Manufacturing Co. This is a SEM image showing a “happy frog”. It has helped us complete the process . Now it is standing on the passivation layer looking forward to the next challenge.
  • 7. Silver Sulfide Crystals by Amy Ng & Angelina Lau, Micron Technology This is a SEM image of silver sufide, Ag2S growth on a resistor network causing the resistance of the component to increase and eventually resulting in an „open signal‟.
  • 8. Lunar Eclipse by Joel B. Hosmillo; Analog Devices An optical image (dark field) of a capacitor in a 400 Hz low-pass filter, damaged by electrostatic discharge (ESD).
  • 9. Big Nose by Wu Xing & Pey Kin Leong; Singapore University of Design and Technology The specimen was a resistive switching memory device consisting of Ni/HfO2/Si. The sample was subjected to electrical stressing while being monitored by a high resolution TEM in situ. The heat generated was so huge that the sample melted down. The resultant image resembles a face with two ting eyes and a big nose.
  • 10. The Royal Elephant by Jacqueline Kwa, Advanced Micro Devices TEM lamella preparation on a silicon sample created this image of an elephant decorated with headdress, getting ready to usher in the king.
  • 11. Tortoise by Nurhanani; Infineon Technologies, Kulim Malaysia This is a SEM image of a particle embedded in a metal layer, resembling that of a tortoise at the water surface.
  • 12. Long-Tail Kangaroo by Jun Faith Rodrigo, Analog Devices This is a FESEM image showing a foreign material on the heat sink of a MEMS package. The image looks like the silhouette of a kangaroo with a long tail.
  • 13. Fist of Victory by Khoo Bing Sheng; WinTech Nano-Technology Raise your right arm and give a fist of victory. That is the effect of this picture captioned “Fist of Victory – 必勝”, showing the nano fabrication capability of a FIB (Focused Ion Beam). The base material used is Copper.