1. 1 Analytical Modeling of Optical Polarimetric Imaging Systems 2011 IEEE International Geoscience and Remote Sensing Symposium LingfeiMeng: lxm8537@rit.edu John P. Kerekes: kerekes@cis.rit.edu Rochester Institute of Technology 29 July 2011 This work was supported by the AFOSR under agreement FA9550-08-1-0028.
27. Analytical Modeling Framework 9 Processing Algorithm Description Sensor Parameter Files Material Database Stokes Radiance Statistics Intensity Signal Statistics Processing Model Performance Metrics Sensor Model Scene Model User Inputs Scene Description Processing Settings Sensor Settings J.P. Kerekes and J.E. Baum, "Spectral Imaging System Analytical Model for Subpixel Object Detection," IEEE Transactions on Geoscience and Remote Sensing, vol. 40, no. 5, pp. 1088-1101, May 2002.
29. Characterize Material Reflectance Polarimetric BRDF (pBRDF) The pBRDF can be expressed as the sum of a polarized specular component and an unpolarized diffuse component 11 M. W. Hyde, J. D. Schmidt, and M. J. Havrilla, “A geometrical optics polarimetric bidirectional reflectance distribution function for dielectric and metallic surfaces,” Opt. Express, vol. 17, no. 24, pp. 22138–22153, Nov 2009.
42. Analytical Modeling Framework 23 Processing Algorithm Description Sensor Parameter Files Material Database Stokes Radiance Statistics Intensity Signal Statistics Processing Model Performance Metrics Sensor Model Scene Model User Inputs Scene Description Processing Settings Sensor Settings
47. Analytical Modeling Framework 30 Processing Algorithm Description Sensor Parameter Files Material Database Stokes Radiance Statistics Intensity Signal Statistics Processing Model Performance Metrics Sensor Model Scene Model Signal-to-clutter ratio (SCR) User Inputs Processing Settings Scene Description Sensor Settings Interested vector space Target mean Background mean Background covariance
63. Conclusions An analytical model for optical polarization has been designed, and initial validations have shown encouraging results. A system performance metric based on signal-to-clutter ratio (SCR) has been suggested, and can be potentially used for system optimization. 34 Thank you!