Choate hs elec_test_final

High Speed Electrical Testing Jim Choate Intel Corporation

Agenda ,[object Object],[object Object],[object Object],[object Object],[object Object]

Goals of the Electrical Compliance Program ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]

New Testing Areas ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],HS Electrical Test Spec On USB-IF Members Site

USB HS Electrical Test Modes ,[object Object]

General HS Electrical Test Procedure ,[object Object],[object Object],[object Object],[object Object]

New Test Fixture(s) ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],USB HS Test Fixture HS Relay Test Port Initialization Port Diff Probe Data Generator 90 Ohms Power Selection Ckt Vbus1 Vbus2 Vcc Gnd

New Test Fixture(s) High Speed Device Signal Quality Test Fixture Test Port Init Port To Host Controller To Device Under Test Isolation relay power Test Switch Diff Probe Test Point

HS Signal Quality Test Procedure ,[object Object],[object Object],[object Object],[object Object],[object Object],90  Oscilloscope USB HS Test Fixture HS Relay Test Mode SW Differential Probe Device Under Test

Eye Pattern Generation ,[object Object]

Eye Pattern Generation ,[object Object],[object Object],[object Object],[object Object]

Eye Pattern Generation ,[object Object],Reference points between runs ignored Optimized reference point Actual crossover

Eye Pattern Generation ,[object Object],[object Object],1 bit time

Passing Eye Pattern ,[object Object]

Failing Eye Patterns ,[object Object],[object Object],[object Object],[object Object]

HS Device Receiver Sensitivity and Squelch Test Procedure ,[object Object],[object Object],[object Object],[object Object],[object Object],Data Generator Test Mode SW USB 2.0 Test Fixture HS Relay SMA Device under test

HS Device Receiver Sensitivity and Squelch Test Results ,[object Object],[object Object],[object Object],DG packet Device Response No Device Response Minimum Receiver sensitivity threshold

TDR Test Procedure ,[object Object],[object Object],[object Object],[object Object],TDR Test Mode SW USB 2.0 Test Fixture HS Relay SMA Device Under Test

TDR Test Procedure ,[object Object],[object Object],[object Object],[object Object],Open voltage step indicates connector reference location

TDR Test Procedure ,[object Object],ZHSTHRU 70 to 110 Ohms (red cursors) ZHSTERM 80 to 100 Ohms (yellow region) USB connector Excursion of ZHSTHRU passes using exception window

TDR Test Procedure ,[object Object],[object Object],Violates ZHSTHRU for > 800ps

Other Test Modes ,[object Object],[object Object],[object Object],[object Object],[object Object]

Conclusions ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]

Choate hs elec_test_final

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