Dvortsov A. V., "Resonance Method of Measuring a Stuff Dielectric Properties at Microwave Frequencies"
1. 1886 Saint Petersburg Electrotechnical University "LETI " TEP Conference presentation Theme: «Resonance Method of Measuring a Stuff Dielectric Properties at Microwave Frequencies» Student: Dvortsov A. V. Managers: Medvedeva N. Y. Mikerov A. G.
2. The purpose of the work: Investigation of the resonance method of measuring the dielectric properties of materials at microwave frequencies, which includes: methodology for calculating the dielectric constant, quality factor and loss tangent of the samples of materials calculation error of method using this method to study the degradation phenomena in packages of integrated circuits and dielectric materials. Dvortsov A. V., 6202 2
3. Test bench Measured parameters: -resonant frequency, -transfer coefficient (S21-parameter) Vector Network Analyzer Rohde&Schwarz ZVA-40 Characteristics of the vector network analyzer Rohde&SchwarzZVA-40: Operating frequency range:10 MHz-40 GHz The sensitivity of the frequency -0,5 Hz Sensitivity of the transfer -0,01 dB -no sample - pattern S21, dB 0 -50 -100 -150 -200 1 2 3 1.5 2.5 GHz Coaxial Resonator Dvortsov A. V., 6202 3
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5. Calculation formulas Capacity of the measured sample Capacity of a flat capacitor Permittivity Q-factor of empty resonator and resonator with the sample : Q-factor of the sample : Loss tangent Dvortsov A. V., 6202 5
6. Treatment of experimental results Sample under investigation Measurement error was calculated : - for the resonant frequency - for the capacity - for permittivity The dependence of the dielectric constant of the sample frequency The calculation results of ε Dvortsov A. V., 6202 6
7. Results of the research baseline baseline after exposure to moisture aged aged after exposure to moisture aged 0 1 2 3 4 5 6 f, baseline baseline 8 8 4 fresh _dry baseline after exposure to moisture fresh _ moistened 7 EMC_dry 7 aged _dry EMC _ moistened 3 6 6 aged _ moistened C, pF 5 5 2 4 4 3 3 1 0 1 2 3 4 5 6 0 1 2 3 4 5 0 1 2 3 4 5 f, GHz f, GHz f, Corps of Integrated Circuits Epoxy Compound ε 7 Dvortsov A. V., 6202
10. The calculation of the dielectric constant epoxy compound and determined its dependence on frequency.
11. Evaluated the possibility of applying the method to assess the degradation phenomena in packages of integrated circuits and dielectric materials.Studies have shown that the investigated method is accurate, reliable and informative. 8 Dvortsov A. V., 6202