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Sustainability: Process Field Networks
- 1. Sustainability Through P
S t i bilit Th h Process
Field Networks
Wil Chin
Research Director
ARC Advisory Group
wchin@ARCweb.com
- 3. 2009 Process Field Network Survival Guide
New and Brownfield:
Extend M d
E t d –Modernization & Repair
i ti R i
Measured Field Investments
Invest in Value Initiates
More Productivity with Less
Use Existing Infrastructure
Networks Provide Access to Information
Use Economical Field Networks to Access
Intelligence - Reduce Operational and
Maintenance Cost
3
© ARC Advisory Group
- 4. Plant Asset Management Growth
($Millions)
Total Shipments of PAM
CAGR=10.8%
CAGR=10 8%
3000
2500 2406
2138
2000 1910
1723
1571
1443.8
1500
1000
500
0
2006 2007 2008 2009 2010 2011
4
© ARC Advisory Group
- 5. Achievable PAM Benefits
O&G, Chemical, Petrochemical, Power
Industries
• Removed 183 of overtime hours
• Reduced monthly work orders by 8%
• Improved planned work mix to 40%
• Saved $800k in 6 months
• Saved $200 device in commissioning and installation
• Reduced checkout ti
R d d h k t time by 30%
b
• Increase production by 4-10%
• Reduced unplanned shutdown by 9%
• Reduced total maintenance cost b 20%
d d l by
• Reduced valve maintenance by 50%
5
© ARC Advisory Group
- 6. Worldwide Installed Base of Field Devices
Field Devices - Press, Temp, Flow, Level, Valve Positioners, Analytical
58 Million Installed Devices in 2007
Smart Non - Smart
6
© ARC Advisory Group
- 7. Process Field Communications
Nearly 24 million HART devices are
N l illi d i
installed in process plants around the
g
globe
HART communication protocol is a low
cost solution for 2009 economic
challenges
h ll
Foundation Fieldbus & Profibus
Continues to be the protocol of choice
for “Greenfield” capital projects
7
© ARC Advisory Group
- 8. Why HART?
Low Risk Solution
Low C t Solution
L Cost S l ti
Availability of Products
Already Halfway There Use Existing Field
There-
Devices
Proven Value
Enables PAM of Field Devices
Wireless HART Standard
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© ARC Advisory Group
- 9. WirelessHART
Built on the HART Standards
Backward compatible
Delivers benefits to users independent of the
age of control systems
Enables transition to a predictive maintenance
strategy to:
• Lower operating and maintenance cost
• Increase plant availability
• Help in regulatory compliance
HART certified devices by May 2009
May,
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© ARC Advisory Group
- 10. WirelessHART Applications
Capture device and process information via
PAM solution
Communicate installed base of existing HART
device diagnostics using a wireless adapter
Deploy measurement previously not cost-
effective
Simplify installation and commissioning
• Uses the same HART tools
• Minimal training required
l d
10
© ARC Advisory Group
- 12. Success “HART Plant of The Year”
PDVSA near Barcelona, Venezuela
248,000 b
248 000 barrel per d
l day refinery
fi
7.5°API Feedstock
Produces Synthetic Crude
5,000 Field Devices tied to DCS
Multiple Field Device Suppliers
Emerson AMS PAM System
Honeywell DCS
y
Other Suppliers: Dresser Masoneilan, Endress
+Hauser, General Monitors, Saab, Control logic
12
© ARC Advisory Group
- 14. Results
Increased Wrench Time by 10%
• Optimized Maintenance
• Predictive Maintenance
• Traceable Calibration Records
Allows the Workforce to do More With Less
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© ARC Advisory Group
- 15. Results
60% reduction of Lost Profit Opportunities
(LPO) caused by field device faults
Reduced “Bad Actors” by 95%
Bad Actors
• Reducing Random Failures
Reduced LPO by $70 m in 2-years
2 years
Strong Case for Field Networks in
Good and Bad Economies
15
© ARC Advisory Group
- 16. FDT Enables Information Access
Supported Configuration Optimization PAM Reliability
Protocols
HART
Foundation Fieldbus
CIP (DeviceNet/IP,
CompoNet)
Interbus
Discrete Industry FDT Process Industry
IO-Link
Hybrid Industry
Modbus SL/TCP
Profibus DP/PA
Profinet I/O
Pending Sensor Profibus Foundation
HART Fieldbus
Protocols Buses Devices Devices
Devices Devices
CANopen
SERCOS III
AS-I
FDT Enables Interoperability Regardless of
EtherCAT
Industry, Protocol, and Application
Visit FDT in the Innovation Showcase
16
© ARC Advisory Group
- 17. Thank You.
For more information, contact the author at
wchin@arcweb.com or visit our web pages at
www.arcweb.com
www arcweb com
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© ARC Advisory Group