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Thin Films and Thin Wafers:
      Challenges and
  Opportunities with BIPV



                                                 PV Summit
                                                June 3 rd 2009
                                           Andy Skumanich, Ph.D.
                                           SolarVision Consulting



                 SVC 2009 PV Summit Conference                      Page 1
Outline
Opportunities and challenges

• Market potential for BIPV
    – Flexible PV modules

• Challenges
    – Potential for cost reduction and aesthetic integration

• Thin film trajectory: CE and cost
    – Various types including CIGS

• Ultra-thin wafer trajectory: thickness, CE, and cost
    – PV processing sequence
    – Handling considerations

• Conclusions



                               SVC 2009 PV Summit Conference        Page 2
Market Opportunities

• General PV forecast: 6-9 GW in 2010

• Demand for glass: 2010 – 1Billion m2 WW
   – Take 1/10% as BIPV, 10% CE
   1GW of PV glass


• Roof-tops residential: coverage by PV
   – 7 million new houses in typical year
   – If 1/10% have BIPV roof, 10%CE
   1GW of rooftop PV for residential


• BIPV could potentially be a major market driver

                         SVC 2009 PV Summit Conference         Page 3
SVC 2009 PV Summit Conference   Page 4
BIPV Market Requirements

•   Aesthetics, cost
•   Customizability
•   Product availability
•   Product features: Flexibility, Shape, etc.

• Market opportunity for flexible TF, and c-Si foils




                         SVC 2009 PV Summit Conference   Page 5
Challenges

• Thin Film:
   – Improved efficiency
   – Flexible substrate extends applications – maintain CE
   – Viability of materials without exchange

• Wafer based c-Si:
   – Foils which are flexible and robust
   – Improved efficiency for ultra-thin wafers – recover CE
   – Processing of wafers-to-cells

• Common
   – Customizability in design
   – Product range


                         SVC 2009 PV Summit Conference           Page 6
Turn-key Landscape: TF & c-Si

   a-Si and           CIGS                        CdTe         c-Si
   Tandem
• Oerlikon (11)   • Centrotherm          • (Roth & Rau)   Full chain:
• AMAT (14)                                               • Centrotherm
• Ulvac (3)                                               • Schmid
• Other misc
                                                          Multiple sub-
                                                          lines




                          SVC 2009 PV Summit Conference                   Page 7
Thin Film CE gains

• CIGS starting to show promise
   – Turnkey line from Centrotherm
• a-Si needs to achieve >10% capability
• CdTe needs to confirm reliability




                        SVC 2009 PV Summit Conference              Page 8
Centrotherm CIGS Turn-key




SVC 2009 PV Summit Conference   Page 9
Value of thin wafers for c-Si PV
• Potential benefits
   – Improved theoretical conversion efficiency
   – Potentially improved flexibility below 100um


   C.E. vs Thickness (R&D data)                            Strength vs Thickness

                         CZ P-type                             !!
                          (w/ B-O)




                            Post-
                         degradation

                                                                           ??
                                                           S. Schoenfelder EuroSim, 2006




                           SVC 2009 PV Summit Conference                                   Page 10
Cell Efficiency vs. Thickness
 Conversion
 Efficiency %
       24                                                                      SunPower
                                                                               Solar Cell
        22
                                                                               Conventional
        20
                                                                               Solar Cell
        18            Cost reduction
        16
        14
        12
        10
                350      300      250             200              150   100
                                Cell Thickness (microns)

      Solar cell thickness reduction is a key cost reduction path. SunPower solar cell
     efficiency improves as wafer thickness decreases versus conventional solar cells
                       which become less efficient on thinner wafers.


11

                                        SVC 2009 PV Summit Conference                       Page 11
Wafer Thickness Roadmap


                            350
                                                                                         Multi -
                            300                                                          crystalline
     Wafer Thickness (um)




                            250

                            200

                            150    SunPower
                                                                                   150
                                                                                               120
                                   mono c-Si,
                            100    (125mm)
                                                   Mono -
                            50                     crystalline
                             0
                                  2002     2004      2006              2008       2010      2012



                 (Source: NREL Silicon Strategy, Dick Swanson – SunPower, SVC)
12

                                                  SVC 2009 PV Summit Conference                        Page 12
Cell Efficiency Roadmap
                       Cell Efficiency History and NREL Plan
                                      Conversion Efficiency

              25
                      SunPower
                      mono c-Si,
              20
     CE (%)




              15

                                          Mono -
              10                          crystalline
                        Multi -
                        crystalline
              5


              0
                       2002        2004     2006            2008             2010   2012


                   (Source: NREL Silicon Strategy, Dick Swanson – SunPower, SVC)
13
                                             SVC 2009 PV Summit Conference                 Page 13
Ultra-thin wafer processing

• Aggressive activities world wide

   – EU: Fraunhofer Institute
   – Japan: NEDO
   – USA: various including commercial companies


• Key developments: e.g. back surface treatment
   – Example is GIT – Dr. Ajeet Rohatgi




                        SVC 2009 PV Summit Conference   Page 14
GIT modeling for sub 100um wafers

•   Bulk lifetime, thickness, BSRV and BSR targets for achieving 19-20% efficiency cells with
    screen printed front contacts


                          21
                                   Our Goal
                          20


                          19
         Efficiency (%)




                          18


                          17                        Current Status

                                                   lifetime=100us, BSRV=50cm/s, BSR=97%
                          16
                                                   lifetime=100us, BSRV=400cm/s, BSR=65%

                          15                       lifetime=25us, BSRV=50cm/s, BSR=97%
                                                   lifetime=25us, BSRV=400cm/s, BSR=65%
                          14
                               0   100          200              300            400        500   GIT Dr.
                                              Solar Cell Thickness (um)
                                                                                                  Ajeet
                                                                                                 Rohatgi

                                              SVC 2009 PV Summit Conference                           Page 15
Roadmap to 20%-efficient c-Si solar
                               cells with screen printed contacts

             22%

                                                                                  20.1%          20.0%
             20%                                          19.3%

                                      18.2%
             18%
                      17.0%
Efficiency




             16%



             14%



             12%



             10%
                   Current Solar   Improved Text,      BSR (97%)              High Sheet Res. Reduce Cell
                        Cell          AR & SP           BSRV                  Emitter (R=100 Thickness (100
                                                                                                              GIT Dr.
                                     (Ref=1.04%        (100cm/s)                 ohm/sq)          µm)          Ajeet
                                      FF=79.1%                                                                Rohatgi
                                      M.C.=5.0)
                                              SVC 2009 PV Summit Conference                                     Page 16
New Process Vs Full Al BSF IQE & RetroRefl


   100                                                                                             100



          90                                                                                       90


          80                                                                                       80


                                             New         Full Al
          70                                Process       BSF
                                                                                                   70




                                                                                                        Reflectance (%)
          60            Voc(mV)              652           639                                     60
IQE (%)




                       Jsc(mA/cm 2)          39.4         37.9         New Process
          50                                                                                       50
                          FF(%)              78.1         78.9

          40             Eff (%)             20.1         19.1                                     40



          30                                                                                       30

                                                                    Full Al BSF
          20                                                                                       20


          10                                                                                       10                     GIT Dr.
                                                                                                                           Ajeet
          0                                                                                        0

           300   400       500        600         700          800           900   1000   1100   1200
                                                                                                                          Rohatgi
                                                 Wavelength (nm)
                                                SVC 2009 PV Summit Conference                                               Page 17
IV-curve for the best Screen Printed
                                              New Process cell

                0.16

                0.14

                0.12

                0.10
                                    ? : 20.1 %
      Isc (A)




                0.08                VOC : 652 m V
                                    JSC : 39.4 mA/cm2
                0.06                FF : 78.1 %

                0.04

                0.02

                0.00                                                                               GIT Dr.
                   0.000    0.100      0.200     0.300         0.400       0.500   0.600   0.700    Ajeet
                                                     Voc (mV)
                                                                                                   Rohatgi

Dielectric passivated rear LBSF raised the efficiency from 19.1 to 20.1%
                                           SVC 2009 PV Summit Conference                             Page 18
Handling issues

• Breakage
   – Of course the major concern for module manufacturers

• Warped wafers cause issues
   – Ultra thin may have benefits and drawbacks

• Start-stop needs to be abrupt for high tpt
   – Wafers act like “wings” during motion

• Multiple challenges for handling




                         SVC 2009 PV Summit Conference                Page 19
Alternative Companies for Handling

•   Equipment: Automation Technology Inc:
     – Bernoulli grippers
     – But still not developed
•   Researchers at the Texas Manufacturing Assistance Center (University
    of Texas, Arlington)
     –  prototype air system able to both acquire wafers from a stack and move
       them along a track with no moving components
     – contrasts with Bernoulli grippers which only acquire wafers and must use
       manipulators and robotic elements to move wafers




                                 SVC 2009 PV Summit Conference                    Page 20
Summary

• Decreasing thickness still moving forward
   – Market leaders driving to wafers 150um and then below
   – New improvements for thin films (CIGS specifically)

• Market forces will be pushing prices down
   – Foreseeable future: more pressure on cost reduction
   – Companies with tech advantages will survive


• Thin Film are steadily developing improved CE with
  CIGS leading in CE, (not in market)
   – Multiple challenges: higher CE >10% at low cost production


• Thin, and ultra-thin wafers now are driving processing
   – Mulitple challenges: maintain CE below 100um, breakage

                      SVC 2009 PV Summit Conference           Page 21
Conclusions


• Industry needs to drive metrics and dimensions
   – BOS may be substantially lower for frame and labor
   – May be closer to “grid parity” with lower BOS


• Increased focus on BIPV is also required

• Also, product portfolio needs to be expanded
   – Flexible, multi-dimensional, etc.


• Current development capabilities can open up the
  BIPV market in increase the demand for TF and ultra-
  thin c-Si


                        SVC 2009 PV Summit Conference            Page 22
TF BIPV




SVC 2009 PV Summit Conference        Page 23
SolarVision Consulting
Contact: Dr. Andy Skumanich
AndySkumanich@gmail.com
www.solarvisionconsulting.com




                        SVC 2009 PV Summit Conference     Page 24

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Thin film and thin wafer PV: challenges for BIPV applications [PV 2009]

  • 1. Thin Films and Thin Wafers: Challenges and Opportunities with BIPV PV Summit June 3 rd 2009 Andy Skumanich, Ph.D. SolarVision Consulting SVC 2009 PV Summit Conference Page 1
  • 2. Outline Opportunities and challenges • Market potential for BIPV – Flexible PV modules • Challenges – Potential for cost reduction and aesthetic integration • Thin film trajectory: CE and cost – Various types including CIGS • Ultra-thin wafer trajectory: thickness, CE, and cost – PV processing sequence – Handling considerations • Conclusions SVC 2009 PV Summit Conference Page 2
  • 3. Market Opportunities • General PV forecast: 6-9 GW in 2010 • Demand for glass: 2010 – 1Billion m2 WW – Take 1/10% as BIPV, 10% CE 1GW of PV glass • Roof-tops residential: coverage by PV – 7 million new houses in typical year – If 1/10% have BIPV roof, 10%CE 1GW of rooftop PV for residential • BIPV could potentially be a major market driver SVC 2009 PV Summit Conference Page 3
  • 4. SVC 2009 PV Summit Conference Page 4
  • 5. BIPV Market Requirements • Aesthetics, cost • Customizability • Product availability • Product features: Flexibility, Shape, etc. • Market opportunity for flexible TF, and c-Si foils SVC 2009 PV Summit Conference Page 5
  • 6. Challenges • Thin Film: – Improved efficiency – Flexible substrate extends applications – maintain CE – Viability of materials without exchange • Wafer based c-Si: – Foils which are flexible and robust – Improved efficiency for ultra-thin wafers – recover CE – Processing of wafers-to-cells • Common – Customizability in design – Product range SVC 2009 PV Summit Conference Page 6
  • 7. Turn-key Landscape: TF & c-Si a-Si and CIGS CdTe c-Si Tandem • Oerlikon (11) • Centrotherm • (Roth & Rau) Full chain: • AMAT (14) • Centrotherm • Ulvac (3) • Schmid • Other misc Multiple sub- lines SVC 2009 PV Summit Conference Page 7
  • 8. Thin Film CE gains • CIGS starting to show promise – Turnkey line from Centrotherm • a-Si needs to achieve >10% capability • CdTe needs to confirm reliability SVC 2009 PV Summit Conference Page 8
  • 9. Centrotherm CIGS Turn-key SVC 2009 PV Summit Conference Page 9
  • 10. Value of thin wafers for c-Si PV • Potential benefits – Improved theoretical conversion efficiency – Potentially improved flexibility below 100um C.E. vs Thickness (R&D data) Strength vs Thickness CZ P-type !! (w/ B-O) Post- degradation ?? S. Schoenfelder EuroSim, 2006 SVC 2009 PV Summit Conference Page 10
  • 11. Cell Efficiency vs. Thickness Conversion Efficiency % 24 SunPower Solar Cell 22 Conventional 20 Solar Cell 18 Cost reduction 16 14 12 10 350 300 250 200 150 100 Cell Thickness (microns) Solar cell thickness reduction is a key cost reduction path. SunPower solar cell efficiency improves as wafer thickness decreases versus conventional solar cells which become less efficient on thinner wafers. 11 SVC 2009 PV Summit Conference Page 11
  • 12. Wafer Thickness Roadmap 350 Multi - 300 crystalline Wafer Thickness (um) 250 200 150 SunPower 150 120 mono c-Si, 100 (125mm) Mono - 50 crystalline 0 2002 2004 2006 2008 2010 2012 (Source: NREL Silicon Strategy, Dick Swanson – SunPower, SVC) 12 SVC 2009 PV Summit Conference Page 12
  • 13. Cell Efficiency Roadmap Cell Efficiency History and NREL Plan Conversion Efficiency 25 SunPower mono c-Si, 20 CE (%) 15 Mono - 10 crystalline Multi - crystalline 5 0 2002 2004 2006 2008 2010 2012 (Source: NREL Silicon Strategy, Dick Swanson – SunPower, SVC) 13 SVC 2009 PV Summit Conference Page 13
  • 14. Ultra-thin wafer processing • Aggressive activities world wide – EU: Fraunhofer Institute – Japan: NEDO – USA: various including commercial companies • Key developments: e.g. back surface treatment – Example is GIT – Dr. Ajeet Rohatgi SVC 2009 PV Summit Conference Page 14
  • 15. GIT modeling for sub 100um wafers • Bulk lifetime, thickness, BSRV and BSR targets for achieving 19-20% efficiency cells with screen printed front contacts 21 Our Goal 20 19 Efficiency (%) 18 17 Current Status lifetime=100us, BSRV=50cm/s, BSR=97% 16 lifetime=100us, BSRV=400cm/s, BSR=65% 15 lifetime=25us, BSRV=50cm/s, BSR=97% lifetime=25us, BSRV=400cm/s, BSR=65% 14 0 100 200 300 400 500 GIT Dr. Solar Cell Thickness (um) Ajeet Rohatgi SVC 2009 PV Summit Conference Page 15
  • 16. Roadmap to 20%-efficient c-Si solar cells with screen printed contacts 22% 20.1% 20.0% 20% 19.3% 18.2% 18% 17.0% Efficiency 16% 14% 12% 10% Current Solar Improved Text, BSR (97%) High Sheet Res. Reduce Cell Cell AR & SP BSRV Emitter (R=100 Thickness (100 GIT Dr. (Ref=1.04% (100cm/s) ohm/sq) µm) Ajeet FF=79.1% Rohatgi M.C.=5.0) SVC 2009 PV Summit Conference Page 16
  • 17. New Process Vs Full Al BSF IQE & RetroRefl 100 100 90 90 80 80 New Full Al 70 Process BSF 70 Reflectance (%) 60 Voc(mV) 652 639 60 IQE (%) Jsc(mA/cm 2) 39.4 37.9 New Process 50 50 FF(%) 78.1 78.9 40 Eff (%) 20.1 19.1 40 30 30 Full Al BSF 20 20 10 10 GIT Dr. Ajeet 0 0 300 400 500 600 700 800 900 1000 1100 1200 Rohatgi Wavelength (nm) SVC 2009 PV Summit Conference Page 17
  • 18. IV-curve for the best Screen Printed New Process cell 0.16 0.14 0.12 0.10 ? : 20.1 % Isc (A) 0.08 VOC : 652 m V JSC : 39.4 mA/cm2 0.06 FF : 78.1 % 0.04 0.02 0.00 GIT Dr. 0.000 0.100 0.200 0.300 0.400 0.500 0.600 0.700 Ajeet Voc (mV) Rohatgi Dielectric passivated rear LBSF raised the efficiency from 19.1 to 20.1% SVC 2009 PV Summit Conference Page 18
  • 19. Handling issues • Breakage – Of course the major concern for module manufacturers • Warped wafers cause issues – Ultra thin may have benefits and drawbacks • Start-stop needs to be abrupt for high tpt – Wafers act like “wings” during motion • Multiple challenges for handling SVC 2009 PV Summit Conference Page 19
  • 20. Alternative Companies for Handling • Equipment: Automation Technology Inc: – Bernoulli grippers – But still not developed • Researchers at the Texas Manufacturing Assistance Center (University of Texas, Arlington) – prototype air system able to both acquire wafers from a stack and move them along a track with no moving components – contrasts with Bernoulli grippers which only acquire wafers and must use manipulators and robotic elements to move wafers SVC 2009 PV Summit Conference Page 20
  • 21. Summary • Decreasing thickness still moving forward – Market leaders driving to wafers 150um and then below – New improvements for thin films (CIGS specifically) • Market forces will be pushing prices down – Foreseeable future: more pressure on cost reduction – Companies with tech advantages will survive • Thin Film are steadily developing improved CE with CIGS leading in CE, (not in market) – Multiple challenges: higher CE >10% at low cost production • Thin, and ultra-thin wafers now are driving processing – Mulitple challenges: maintain CE below 100um, breakage SVC 2009 PV Summit Conference Page 21
  • 22. Conclusions • Industry needs to drive metrics and dimensions – BOS may be substantially lower for frame and labor – May be closer to “grid parity” with lower BOS • Increased focus on BIPV is also required • Also, product portfolio needs to be expanded – Flexible, multi-dimensional, etc. • Current development capabilities can open up the BIPV market in increase the demand for TF and ultra- thin c-Si SVC 2009 PV Summit Conference Page 22
  • 23. TF BIPV SVC 2009 PV Summit Conference Page 23
  • 24. SolarVision Consulting Contact: Dr. Andy Skumanich AndySkumanich@gmail.com www.solarvisionconsulting.com SVC 2009 PV Summit Conference Page 24