Ce diaporama a bien été signalé.
Le téléchargement de votre SlideShare est en cours. ×

XRD.pptx

Publicité
Publicité
Publicité
Publicité
Publicité
Publicité
Publicité
Publicité
Publicité
Publicité
Publicité
Publicité
Chargement dans…3
×

Consultez-les par la suite

1 sur 6 Publicité

Plus De Contenu Connexe

Plus récents (20)

Publicité

XRD.pptx

  1. 1. XRD Majed AMini NPNL
  2. 2. NPNL When incident X-rays reach crystal atoms, they get scattered, primarily through interaction with the atoms’ electrons. Under most angles of incidence, θ, the waves reflected from neighbouring planes will show a phase difference, leading to a cancellation of amplitudes (destructive interferences). X-ray diffraction according to W. L. Bragg
  3. 3. NPNL However, the waves reflected from neighbouring planes add constructively in a few specific directions (they have similar phase), as determined by Bragg’s law: 2dsinθ = nλ Where d is the spacing between diffracting planes, θ is the incident angle, n is an integer, and λ is the beam wavelength. The specific directions appear as spots on the diffraction pattern called reflections. Consequently, X- ray diffraction patterns result from electromagnetic waves impinging on a regular array of scatterers. X-ray diffraction according to W. L. Bragg
  4. 4. X-ray diffractometers consist of three basic elements: an X-ray source, a sample holder, and an X ray detector. In the source, an applied current heats up a tungsten filament which releases electrons. The released electrons are accelerated by high voltage and hit a copper target where copper X-rays are generated (Cu Kα X-ray source, CuKα radiation = 1.5418Å). The X-rays exit the tube and hit the sample holder. NPNL X-ray Diffraction (XRD) Instrumentation - How Does It Work?
  5. 5. NPNL These X-rays are directed onto the sample. As the sample and detector are rotated, the intensity of the reflected X-rays is recorded. When the geometry of the incident X-rays impinging the sample satisfies the Bragg Equation, constructive interference occurs and a peak in intensity occurs. A detector records and processes this X-ray signal The geometry of an X-ray diffractometer is such that the sample rotates in the path of the collimated X- ray beam at an angle θ while the X-ray detector is mounted on an arm to collect the diffracted X-rays and rotates at an angle of 2θ. . X-ray Diffraction (XRD) Instrumentation - How Does It Work?
  6. 6. NPNL 2dsinθ = nλ 2θ ≈ 10° λ=1.5418Å N=1 2*d sin5=0.15418 nm d= 0.884 nm d for graphite: 0.335 XRD for GO

×