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Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 1
Plasma Enhanced materials processing and
rarefied GAS dynamics Unified Simulation tools
P E G A S U S
Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 2
ICP
H2/NF3 Remote-plasma simulation
Modules: PHM
NMEM
Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 3
Purpose
Usually remote-plasma equipment is used as plasma CVD equipment and
dry etching equipment.
The feature reduces the incidence ion bombardment and the influence of photons
to the substrate, and makes easy control of distribution of the activated species
on the substrate compared with parallel plate type plasma equipment
in thin-film generation and thin-film processing.
Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 4
Outline of equipment Model of simulation
H2
NF3
Substrate
r
z
RF
ε= 3.8r
R.F.
Gas-ring
H2
NF3
Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 5
400
Operating conditions
ICP coil Power: 200 [W]
Freq. : 13.56 [MHz]
Total gas flow rates: 300 [sccm]
H2 : NF3 = 2:1 (=200 : 100)
Pressure on the outlet : 10 [Pa]
Geometry
Temperature of walls and substrate : 313 [K]
Gas temperature : 313 [K]
Unit [mm]100
60
100
60
3
5
180
60
400
140
Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 6
Species ( electron, ions, and neutrals )
Charged spec. :13
Neutral spec. :13
Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 7
Gas-phase reactions ( hydrogen )
Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 8
Gas-phase reactions ( nitrogen,fluorine)
Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 9
Surface reactions
H 0.97 H2 0.5
H2 1.0
N 0.97 N2 0.5
N2 1.0
F 0.97 F2 0.5
F2 1.0
NxFy 1.0
I+ (正イオン) 0.0 I 1.0
(H,H2,N,N2,F,F2,NF,NF2,NF3)
H3
+ 0.0 H 1.0 H2 1.0
r
r : Reflection coeff.
1-r : Sticking coeff.
a、b : Emitted coeff.
1-r
(1-r)*a (1-r)*b
Incident Spec. Reflection coeff. Emitted spec./coeff.
Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 10
Computational results
Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 11
Time history of electron temp. at each monitoring cell
Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 12
Physical quantities
by R.F. coil
Electron density
and temperature
Inductive
E-field
[V/cm]
Adsorbed
power
[W/cm3]
Electron
temperature
[eV]
Electron
density
[/m3]
Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 13
H3
+ F - NF2
+
Ion density [/m3]
H+
Ion density [/m3]
Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 14
N H
Neutral density [/m3]
NF2 F
Neutral density [/m3]
Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 15
Mixture gas
Pressure
[Pa]
Velocity
[m/s]
NF3 H2
Neutral density [/m3]

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ICP H2/NF3 remote-plasma simulation

  • 1. Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 1 Plasma Enhanced materials processing and rarefied GAS dynamics Unified Simulation tools P E G A S U S
  • 2. Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 2 ICP H2/NF3 Remote-plasma simulation Modules: PHM NMEM
  • 3. Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 3 Purpose Usually remote-plasma equipment is used as plasma CVD equipment and dry etching equipment. The feature reduces the incidence ion bombardment and the influence of photons to the substrate, and makes easy control of distribution of the activated species on the substrate compared with parallel plate type plasma equipment in thin-film generation and thin-film processing.
  • 4. Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 4 Outline of equipment Model of simulation H2 NF3 Substrate r z RF ε= 3.8r R.F. Gas-ring H2 NF3
  • 5. Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 5 400 Operating conditions ICP coil Power: 200 [W] Freq. : 13.56 [MHz] Total gas flow rates: 300 [sccm] H2 : NF3 = 2:1 (=200 : 100) Pressure on the outlet : 10 [Pa] Geometry Temperature of walls and substrate : 313 [K] Gas temperature : 313 [K] Unit [mm]100 60 100 60 3 5 180 60 400 140
  • 6. Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 6 Species ( electron, ions, and neutrals ) Charged spec. :13 Neutral spec. :13
  • 7. Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 7 Gas-phase reactions ( hydrogen )
  • 8. Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 8 Gas-phase reactions ( nitrogen,fluorine)
  • 9. Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 9 Surface reactions H 0.97 H2 0.5 H2 1.0 N 0.97 N2 0.5 N2 1.0 F 0.97 F2 0.5 F2 1.0 NxFy 1.0 I+ (正イオン) 0.0 I 1.0 (H,H2,N,N2,F,F2,NF,NF2,NF3) H3 + 0.0 H 1.0 H2 1.0 r r : Reflection coeff. 1-r : Sticking coeff. a、b : Emitted coeff. 1-r (1-r)*a (1-r)*b Incident Spec. Reflection coeff. Emitted spec./coeff.
  • 10. Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 10 Computational results
  • 11. Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 11 Time history of electron temp. at each monitoring cell
  • 12. Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 12 Physical quantities by R.F. coil Electron density and temperature Inductive E-field [V/cm] Adsorbed power [W/cm3] Electron temperature [eV] Electron density [/m3]
  • 13. Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 13 H3 + F - NF2 + Ion density [/m3] H+ Ion density [/m3]
  • 14. Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 14 N H Neutral density [/m3] NF2 F Neutral density [/m3]
  • 15. Copyright 2002-2013 PEGASUS Software Inc., All rights reserved. 15 Mixture gas Pressure [Pa] Velocity [m/s] NF3 H2 Neutral density [/m3]