1. May 1, 2013 1
A new method for automatic
generation of DRC and LVS
runsets
Dr. Elena Ravve
Software Engineering Department
Ort Braude College, Karmiel
(common work with TowerJazz Semiconductor)
May 1, 2013

2. May 1, 2013 2
What is the problem?
From designer to manufacturer

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What is the problem?
From manufacturer to designer

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Physical Design Kits Package
Physical Design Kits Package

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From Design Rule Manuscript to
Runsets: multiple interpretations

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From DRM to Runsets:
derivatives and revisions
Runsets
Runsets
Runsets
Runsets
Runsets
Runsets

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Definition of the problem
• Any semiconductor manufacturing process
contains a set of physical design rules for
geometrical configuration of available layers,
wiring, placement and so on.
• Every chip, which is expected to be
manufactured in the given technology, must
satisfy the limitations of the design rules.

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Definition of the problem (ctnd)
• Design Rile Manual (DRM) may contain
hundreds of physical design rules and
definitions of dozens legal devices.
• Design rule checking (DRC) and Layout vs.
Schematics (LVS) runsets are provided in order
to guarantee that the given chip does not give
the design rule violations.

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Definition of the problem (ctnd)
• Writing and testing of DRC and LVS runsets
traditionally is done MANUALY
• It leads to
– Problematic knowledge accumulation and transfer
– Different interpretations of rules and definitions
– Inconsistency of revisions and derivatives
– Maintenance problems
– etc.

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Solution of the problem
• The proposed innovation is based on the fact
that the set of legal devices for any process or
technology may be divided into final set of
technology independent categories such that
transistors, capacitors, resistors, diodes and so
on.

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Solution of the problem (cntd)
• Moreover, the set of physical design rules for
any process or technology may be divided into
final set of technology independent categories
such that width, space, enclosure and so on.

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DRM composition rather than free
style writing
• We create one set of parameterized templates
for DRC/LVS purposes, such that one template
(or rather sub-set of templates) corresponds
to a DRC/LVS category.
• We force the DRM composer (integrator) to
fulfill the templates (in any relevant way, for
example, using GUI) instead of free-style
writing of the document.
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DRM composition rather than free
style writing (ctnd)
For any design rule or legal device for a given
technology, the integrator
• chooses the relevant parameterized template,
• provides the specific values of required
parameters or (preferably) chooses them from
a choice list.
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DRM composition rather than free
style writing (ctnd)
The obtained information is transformed and
stored as a data structure that will be used for
different purposes, such that DRC and LVS
runsets generation in particular verification tools
and so on.
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Auto Design Rules Tool
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Implementation: choice lists
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Implementation: code generation
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Implementation: main steps 1-7
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Implementation: generated code
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Benefits of the presented method
• Better quality and confidence level of the
delivered DRC/LVS runsets
• Total elimination of the step of manual
runsets coding for any verification tool
• Reduction of time and effort to implement
runsets
• Full coverage of all physical design rules and
legal devices
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Benefits (ctnd)
• Common base for different processes,
technologies and verification tools
• Detection and correction of mistakes and bug
at earliest stages of the flow
• Human independent accumulation and
transfer of knowledge
• Reduction of manual writing
• Reduction of human factor
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Benefits (ctnd)
• Formal approach to DRM composition that
allows precise formulation of physical design
rules and description of legal devices
• Effective and safe way to change the DRC/LVS
runsets for all verification tools, according to
the changes in DRM and bug fixes
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Thank you for your attention!
Questions?
May 1, 2013