Global Scenario On Sustainable and Resilient Coconut Industry by Dr. Jelfina...
A2 la accreditation valid until apr 30 2013
1. SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005
& ANSI/NCSL Z540-1-1994
MICRO PRECISION CALIBRATION
Block 2 Lot 4 Calamba Premier Intl. Park
Batino, Calamba City
Laguna, Philippines 4027
Kenneth Ellett II Phone: 63 49 5023015
CALIBRATION
Valid To: April 30, 2013 Certificate Number: 0935.05
In recognition of the successful completion of the A2LA evaluation process, accreditation is granted to
this laboratory to perform the following calibrations1:
I. Acoustical Quantities
Parameter/Equipment Range CMC2 () Comments
Sound3
(125 to 2000) Hz (74 to 114) dB SPL 0.4 dB Genrad 1986 sound
level calibrator
4000 Hz (74 to 114) dB SPL 0.6 dB
II. Chemical Quantities
Parameter/Equipment Range CMC2 () Comments
Conductivity – 146.9 µS 1.8 µS Comparison to standard
Measure3 180 µS 4.8 µS solutions
1015 µS 2.5 µS
1408 µS 3.4 µS
111 mS 0.32 mS
pH – Measure3 (4, 7, 10) pH unit 0.03 pH unit Comparison to standard
solutions
(A2LA Cert. No. 0935.05) 10/27/2011 Page 1 of 17
2. III. Dimensional
Parameter/Equipment Range CMC2, 6 () Comments
Calipers3 (0.10 to 12) in (56 + 0.6L) µin Grade 2 gage blocks
(12 to 48) in (600 + 100L) µin
Height Gages3 (0.10 to 12) in (56 + 0.6L) µin Grade 2 gage blocks
(12 to 48) in (600 + 100L) µin
Optical Comparators Up to 300 mm 140 µm Glass scales and gage
and Visual Systems3 blocks
Indicators3 –
Resolution:
100 µin (0.1 to 4) in 82 µin Indicator calibrator
50 µin 59 µin
Micrometers3 –
Outside, Inside, Depth
Resolution:
100 µin (0.10 to 48) in (82 + 10L) µin Gage blocks, optical
50 µin (0.10 to 4) in (60 + 10L) µin flat, monochromic
light source
Surface Plates3 –
Repeatability (12 x 12 to 72 x 144) in 43 µin Repeat-o-meter
Flatness (6 to 120) in (diagonal) 71 µin Planekator
Micrometer Rods/ (0.1 to 12) in (58 + 0.6L) µin Supermic, gage blocks
Length Standards
Cylindrical Plug (0.1 to 12) in (12 + 0.34L) µin Supermic
Gages
(A2LA Cert. No. 0935.05) 10/27/2011 Page 2 of 17
3. Parameter/Equipment Range CMC2, 6 () Comments
Ring Gages, Cylindrical & (0.1 to 12) in (15 + 1.5L) µin Supermic
Tapered
Steel Rules Up to 72 in 1.2 min Grade 2 gage blocks
Tape Measure Up to 300 in 9.1 min Grade 2 gage blocks
Thread Wires (4 to 120) T.P.I. (8 + 3D) µin Supermic
Gage Blocks Up to 4 in (7.8 + 5L) µin Gage blocks
Thread Plugs – Pitch (0.10 to 4.00) in (66 + 1.2L) μin Supermic, thread wires
Diameter, External Threads (24 + 1.2L) μin using three wire method
Bore Micrometers, Bore Up to 8 in 61 µin Master ring gage
Gages
IV. Electrical – DC/Low Frequency
Parameter/Equipment Range CMC2, 4, 5 () Comments
DC Voltage – Generate3 (0 to 220) mV 12 µV/V + 0.6 µV Fluke 5700A
220 mV to 2.2 V 12 µV/V + 1.0 µV
(2.2 to 11) V 11 µV/V + 3.5 µV
(11 to 22) V 12 µV/V + 6.5 µV
(22 to 220) V 13 µV/V + 80 µV
(220 to 1100) V 13 µV/V + 500 µV
10 V 5.7 µV/V Fluke 732A zener
voltage standard
DC Voltage – Measure3 (0 to 100) mV 13 µV/V + 3.0 µV HP 3458A
100 mV to 1V 17 µV/V + 0.3 µV
(1 to 10) V 13 µV/V + 0.5 µV
(10 to 100) V 15 µV/V + 30 µV
(100 to 1000) V 27 µV/V + 100 µV
(A2LA Cert. No. 0935.05) 10/27/2011 Page 3 of 17
4. Parameter/Equipment Range CMC2, 4, 5, 7 () Comments
High DC Voltage – Measure3 (1 to 40) kV 0.10 % Vitrek 4640B
DC Current – Generate3 (0 to 220) A 40 A/A + 8 nA Fluke 5700A
220 A to 22 mA 44 A/A + 8 nA
(22 to 220) mA 47 A/A + 80 nA
220 mA to 2.2 A 55 A/A + 0.8 µA
(2.2 to 11) A 83 A/A + 25 µA Fluke 5500A
(11 to 20.5) A 0.12 % Fluke 5520A
(1 to 1000) A 0.92 % Fluke 5500A
w/ current coil, Valhalla
2555A
DC Current – Measure3 (10 to 100) A 26 µA/A + 5 µA HP 3458A
100 A to 10 mA 26 uA/A + 5 µA
(10 to 100) mA 60 µA/A + 5 µA
100 mA to 1 A 0.013 % + 10 µA
High DC Current – (1 to 50) A 0.12 % Shunt monitored with
Measure3 (50 to 300) A 0.22 % multimeter
(300 to 1000) A 0.28 %
Resistance – Generate3 Up to 11 Ω 0.015 % + 0.008 Ω Fluke 5500A
(11 to 33) Ω 0.014 % + 0.015 Ω
(33 to 110) Ω 0.011 % + 0.015 Ω
(110 to 330) Ω 0.011 % + 0.015 Ω
(0.33 to 1.1) kΩ 0.011 % + 0.06 Ω
(1.1 to 3.3) kΩ 0.011 % + 0.06 Ω
(3.3 to 11) kΩ 0.14 % + 0.6 Ω
(11 to 33) kΩ 0.14 % + 0.6 Ω
(33 to 110) kΩ 0.18 % + 6 Ω
(110 to 330) kΩ 0.18 % + 6 Ω
330 kΩ to 1.1 MΩ 0.12 % + 55 Ω
(1.1 to 3.3) MΩ 0.18 % + 55 Ω
(3.3 to 11) MΩ 0.15 % + 550 Ω
(11 to 33) MΩ 0.17 % + 550 Ω
(33 to 110) MΩ 0.6 % + 5.5 kΩ
(110 to 330) MΩ 0.6 % + 17 kΩ
(A2LA Cert. No. 0935.05) 10/27/2011 Page 4 of 17
5. Parameter/Equipment Range CMC2, 4, 5, 6, 7 () Comments
Resistance – Generate, 1Ω 0.013 % Fluke 5700A
Fixed Points3 10 Ω 39 µΩ/Ω
100 Ω 24 µΩ/Ω
1 kΩ 18 µΩ/Ω
10 kΩ 17 µΩ/Ω
100 kΩ 19 µΩ/Ω
1 MΩ 27 µΩ/Ω
10 MΩ 54 µΩ/Ω
100 MΩ 0.016 %
Resistance – Measure3 (0 to 10) Ω 19 µΩ/Ω + 0.06 mΩ HP 3458A
(10 to 100) Ω 15 µΩ/Ω + 0.6 mΩ
100 to 100 kΩ 13 µΩ/Ω + 0.6 mΩ
100 kΩ to 1 M 18 µΩ/Ω + 2.4 Ω
(1 to 10) MΩ 59 µΩ/Ω + 120 Ω
(10 to 100) MΩ 0.058 % + 1.2 kΩ
100 MΩ to 1 GΩ 1.8 % + 10 kΩ
Capacitance – Generate3 (0.33 to 0.49) nF 3.3 % Fluke 5500A
(0.50 to 1.09) nF 1.7 %
(1.10 to 3.29) nF 0.93 %
(3.30 to 10.9) nF 0.69 %
(11.0 to 32.9) nF 0.64 %
(33 to 109.9) nF 0.40 %
(110 to 329.9) nF 0.40 %
(0.33 to 1.09) µF 0.40 %
(1.10 to 3.29) µF 0.51 %
Fixed Values
1 MHz (1, 10, 100, 1000) pF 0.12 % HP 16380A and
1 kHz (10, 100) nF 0.12 % 16380C standard
1 kHz 1 µF 0.12 % capacitor sets
Capacitance – Measure3
1 kHz 10 pF to 1 mF 0.10 % IV GenRad 1689
Inductance –
Measure3, Fixed Value
1 kHz 1H 0.12 % GenRad 1689
(A2LA Cert. No. 0935.05) 10/27/2011 Page 5 of 17
6. Parameter/Equipment Range CMC2, 6 () Comments
Inductance – Generate3
Fixed Points 100 µH 0.12 % IV GenRad 1482
1 mH 0.059 % IV
10 mH 0.06 % IV
100 mH 0.062 % IV
2H 0.075 % IV
10 H 0.08 % IV
Electrical Calibration of
Thermocouple Indicators3 –
Type E -250 ºC to -100 ºC 0.5 ºC Fluke 5500A
-100 ºC to 650 ºC 0.16 ºC
650 ºC to 1000 ºC 0.21 ºC
Type J -210 ºC to -100 ºC 0.27 ºC
-100 ºC to 760 ºC 0.17 ºC
760 ºC to 1200 ºC 0.23 ºC
Type K -200 ºC to -100 ºC 0.33 ºC
-100 ºC to 120 ºC 0.18 ºC
120 ºC to 1000 ºC 0.26 ºC
1000 ºC to 1372 ºC 0.04 ºC
Type S 0 ºC to 250 ºC 0.47 ºC
250 ºC to 1400 ºC 0.37 ºC
1400 ºC to 1767 ºC 0.46 ºC
Type T -250 ºC to -150 ºC 0.63 ºC
-150 ºC to 0 ºC 0.24 ºC
0 ºC to 400 ºC 0.16 ºC
Electrical Calibration of
RTD Indicating Systems3 –
Pt 385, 100 -200 C to 0 C 0.05 C Fluke 5500A
0 C to 100 C 0.07 C
100 C to 400 C 0.10 C
400 C to 630 C 0.12 C
630 C to 800 C 0.23 C
Pt 3926, 100 -200 C to 0 C 0.05 C
0 C to 100 C 0.07 C
100 C to 400 C 0.10 C
400 C to 630 C 0.12 C
(A2LA Cert. No. 0935.05) 10/27/2011 Page 6 of 17
7. Parameter/Equipment Range CMC2, 4 () Comments
Electrical Calibration of
RTD Indicating
Systems3 – (cont.)
Pt 3916, 100 -200 C to -190 C 0.25 C Fluke 5500A
-190 C to 0 C 0.05 C
0 C to 300 C 0.08 C
300 C to 600 C 0.10 C
600 C to 630 C 0.23 C
Pt 385, 200 -200 C to 100 C 0.04 C
100 C to 260 C 0.05 C
260 C to 600 C 0.14 C
600 C to 630 C 0.16 C
Pt 385, 500 -200 C to 100 C 0.05 C
100 C to 260 C 0.06 C
260 C to 600 C 0.09 C
600 C to 630 C 0.11 C
Pt 385, 1 k -200 C to 100 C 0.03 C
100 C to 260 C 0.05 C
260 C to 600 C 0.07 C
600 C to 630 C 0.23 C
PtNi 385, 100 -80 C to 100 C 0.08 C
100 C to 260 C 0.14 C
Cu 427, 10 -100 C to 260 C 0.3 C
(A2LA Cert. No. 0935.05) 10/27/2011 Page 7 of 17
8. Parameter/Range Frequency CMC2, 4 () Comments
AC Voltage – Generate3
(0 to 220) mV (10 to 20) Hz 0.055 % + 13 μV Fluke 5700A
(20 to 40) Hz 0.021 % + 8 μV
40 Hz to 20 kHz 0.011 % + 8 μV
(20 to 50) kHz 0.037 % + 8 μV
(50 to 100) kHz 0.085 % + 25 μV
100 kHz to 1 MHz 0.34 % + 80 μV
220 mV to 2.2 V (10 to 20) Hz 0.05 % + 80 μV
(20 to 40) Hz 0.016 % + 25 μV
40 Hz to 20 kHz 75 V/V + 6 μV
(20 to 50) kHz 0.012 % + 16 μV
(50 to 100) kHz 0.025 % + 70 μV
100 kHz to 1 MHz 0.22 % + 850 μV
(2.2 to 22) V (10 to 20) Hz 0.05 % + 0.8 mV Fluke 5700A
(20 to 40) Hz 0.016 % + 0.25 mV w/5725
40 Hz to 20 kHz 75 µV/V + 0.06 mV
(20 to 50) kHz 0.012 % + 0.16 mV
(50 to 100) kHz 0.025 % + 0.35 mV
100 kHz to 1 MHz 0.34 % + 8.5 mV
(22 to 220) V (10 to 20) Hz 0.05 % + 8 mV Fluke 5500A
(20 to 40) Hz 0.016 % + 2.5 mV
40 Hz to 20 kHz 80 µV/V + 0.8 mV
(20 to 50) kHz 0.022 % + 3.5 mV
(50 to 100) kHz 0.05 % + 8 mV
100 kHz to 1 MHz 1.6 % + 190 mV
(220 to 750) V (30 to 50) kHz 0.06 % + 11 mV
(50 to 100) kHz 0.23 % 45 mV
(220 to 1100) V (15 to 50) Hz 0.04 % + 16 mV
(50 to 1000) Hz 90 µV/V + 4 mV
(A2LA Cert. No. 0935.05) 10/27/2011 Page 8 of 17
9. Parameter/Range Frequency CMC2, 4 () Comments
AC Voltage – Measure3
Up to 10 mV (1 to 40) Hz 0.03 % + 3 μV Fluke 5790A
40 Hz to 1 kHz 0.02 % + 2 μV
(1 to 20) kHz 0.03 % + 2 μV
(20 to 50) kHz 0.12 % + 2 μV
(50 to 100) kHz 0.58 % + 2 μV
(100 to 300) kHz 4.6 % + 2 μV
10 mV to 10 V (1 to 40) Hz 80 µV/V + 0.4 mV
40 Hz to 1 kHz 80 µV/V + 0.2 mV
(1 to 20) kHz 0.02 % + 0.2 mV
(20 to 50) kHz 0.03 % + 0.2 mV
(50 to 100) kHz 0.09 % + 0.2 mV
(100 to 300) kHz 0.35 % + 1 mV
300 kHz to 1 MHz 1.2 % + 1 mV
(1 to 2) MHz 1.7 % + 1 mV
(10 to 100) V (1 to 40) Hz 0.02 % + 4 mV
40 Hz to 1 kHz 0.02 % + 2 mV
(20 to 50) kHz 0.04 % + 2 mV
(50 to 100) kHz 0.14 % + 2 mV
(100 to 300) kHz 0.46 % + 10 mV
300 kHz to 1 MHz 1.7 % + 10 mV
(100 to 700) V (1 to 40) Hz 0.05 % + 40 mV
40 Hz to 1 kHz 0.05 % + 20 mV
(1 to 20) kHz 0.07 % + 20 mV
(20 to 50) kHz 0.14 % + 20 mV
(50 to 100) kHz 0.35 % + 20 mV
2.2 mV (10 to 20) Hz 0.17 % + 1.3 μV
(20 to 40) Hz 0.074 % + 1.3 μV
40 Hz to 20 kHz 0.042 % + 1.3 μV
(20 to 50) kHz 0.081 % + 2 μV
(50 to 100) kHz 0.012 % + 2.5 μV
(100 to 300) kHz 0.023 % + 4 μV
(300 to 500) kHz 0.024 % + 8 μV
500 kHz to 1 MHz 0.35 % + 8 μV
(A2LA Cert. No. 0935.05) 10/27/2011 Page 9 of 17
10. Parameter/Range Frequency CMC2, 4 () Comments
AC Voltage – Measure3
(cont.)
7.0 mV (10 to 20) Hz 0.86 % + 1.3 μV Fluke 5790A
(20 to 40) Hz 0.038 % + 1.3 μV
40 Hz to 20 kHz 0.024 % + 1.3 μV
(20 to 50) kHz 0.046 % + 2 μV
(50 to 100) kHz 0.065 % + 2.5 μV
(100 to 300) kHz 0.013 % + 4 μV
(300 to 500) kHz 0.015 % + 8 μV
500 kHz to 1 MHz 0.24 % + 8 μV
22 mV (10 to 20) Hz 0.033 % + 1.3 μV
(20 to 40) Hz 0.021 % + 1.3 μV
40 Hz to 20 kHz 0.012 % + 1.3 μV
(20 to 50) kHz 0.023 % + 2 μV
(50 to 100) kHz 0.035 % + 2.5 μV
(100 to 300) kHz 0.082 % + 4 μV
(300 to 500) kHz 0.097 % + 8 μV
500 kHz to 1 MHz 0.19 % + 8 μV
70 mV (10 to 20) Hz 0.029 % + 1.8 μV
(20 to 40) Hz 0.013 % + 1.8 μV
40 Hz to 20 kHz 0.0071 % + 1.8 μV
(20 to 50) kHz 0.016 % + 2.9 μV
(50 to 100) kHz 0.031 % + 4.8 μV
(100 to 300) kHz 0.056 % + 6.4 μV
(300 to 500) kHz 0.080 % + 9.5 μV
500 kHz to 1 MHz 0.13 % + 9.5 μV
220 mV (10 to 20) Hz 0.025 % + 1.8 μV
(20 to 40) Hz 0.0092 % + 1.8 μV
40 Hz to 20 kHz 0.0046 % + 1.8 μV
(20 to 50) kHz 0.011 % + 2.9 μV
(50 to 100) kHz 0.024 % + 2.5 μV
(100 to 300) kHz 0.035 % + 6.4 μV
(300 to 500) kHz 0.060 % + 9.5 μV
500 kHz to 1 MHz 0.12 % + 9.5 μV
700 mV (10 to 20) Hz 0.024 % + 11 μV
(20 to 40) Hz 0.0082 % + 5.3 μV
40 Hz to 20 kHz 0.0024 % + 1.9 μV
(20 to 50) kHz 0.057 % + 2.9 μV
(50 to 100) kHz 0.011 % + 4.8 μV
(100 to 300) kHz 0.022 % + 16 μV
(300 to 500) kHz 0.038 % + 41 μV
500 kHz to 1 MHz 0.12 % + 0.11 mV
(A2LA Cert. No. 0935.05) 10/27/2011 Page 10 of 17
11. Parameter/Range Frequency CMC2, 4 () Comments
AC Voltage – Measure3
(cont.)
2.2 V (10 to 20) Hz 0.024 % + 10 μV Fluke 5790A
(20 to 40) Hz 0.0078 % + 5 μV
40 Hz to 20 kHz 0.0032 % + 1 μV
(20 to 50) kHz 0.0055 % + 2 μV
(50 to 100) kHz 0.010 % + 4 μV
(100 to 300) kHz 0.020 % + 15 μV
(300 to 500) kHz 0.036 % + 40 μV
500 kHz to 1 MHz 0.11 % + 0.1 mV
7.0 V (10 to 20) Hz 0.024 % + 0.1 mV
(20 to 40) Hz 0.0078 % + 0.03 mV
40 Hz to 20 kHz 0.0023 % + 0.01 mV
(20 to 50) kHz 0.0056 % + 0.02 mV
(50 to 100) kHz 0.011 % + 0.04 mV
(100 to 300) kHz 0.025 % + 0.15 mV
(300 to 500) kHz 0.048 % + 0.3 mV
500 kHz to 1 MHz 0.13 % + 0.5 mV
22 V (10 to 20) Hz 0.024 % + 0.1 mV
(20 to 40) Hz 0.0078 % + 0.03 mV
40 Hz to 20 kHz 0.0033 % + 0.01 mV
(20 to 50) kHz 0.0056 % + 0.02 mV
(50 to 100) kHz 0.011 % + 0.04 mV
(100 to 300) kHz 0.024 % + 0.15 mV
(300 to 500) kHz 0.048 % + 0.3 mV
500 kHz to 1 MHz 0.13 % + 0.5 mV
70 V (10 to 20) Hz 0.024 % + 1 mV
(20 to 40) Hz 0.0078 % + 0.3 mV
40 Hz to 20 kHz 0.0041 % + 0.08 mV
(20 to 50) kHz 0.0081 % + 0.1 mV
(50 to 100) kHz 0.015 % + 0.5 mV
(100 to 300) kHz 0.032 % + 0.6 mV
(300 to 500) kHz 0.062 % + 0.8 mV
500 kHz to 1 MHz 0.17 % + 1 mV
(A2LA Cert. No. 0935.05) 10/27/2011 Page 11 of 17
12. Parameter/Range Frequency CMC2, 4, 7 () Comments
AC Voltage – Measure3
(cont.)
220 V (10 to 20) Hz 0.023 % + 1 mV Fluke 5790A
(20 to 40) Hz 0.0078 % + 0.3 mV
40 Hz to 20 kHz 0.0041 % + 0.08 mV
(20 to 50) kHz 0.009 % 0.1 mV
(50 to 100) kHz 0.016 % + 0.5 mV
(100 to 300) kHz 0.033 % + 0.6 mV
(300 to 500) kHz 0.069 % + 0.8 mV
700 V (10 to 20) Hz 0.02 %
(20 to 40) Hz 0.01 %
40 Hz to 20 kHz 0.01 %
(20 to 50) kHz 0.05 %
(50 to 100) kHz 0.21 %
1000 V (10 to 20) Hz 0.02 %
(20 to 40) Hz 0.01 %
40 Hz to 20 kHz 0.01 %
(20 to 50) kHz 0.05 %
(50 to 100) kHz 0.21 %
AC High Voltage –
Measure3
(1 to 40) kV (50 to 60) Hz 0.3 % Vitrek 4640B
AC Current –
Generate3
(1 to 220) μA 40 Hz to 1 kHz 0.09 % Fluke 5700A
220 μA to 22 mA 0.03 %
(22 to 220) mA 0.03 %
220 mA to 2.2 A 0.09 %
(A2LA Cert. No. 0935.05) 10/27/2011 Page 12 of 17
13. Parameter/Range Frequency CMC2, 5, 7 () Comments
AC Current – Measure3
Up to 100 μA (10 to 20) Hz 0.46 % + 0.03 μA HP 3458A
(20 to 45) Hz 0.18 % + 0.03 μA
45 Hz to 1 kHz 0.078 % + 0.03 μA
100 μA to 100 mA (10 to 20) Hz 0.46 % + 20 μA
(20 to 45) Hz 0.17 % + 20 μA
(45 to 100) Hz 0.073 % + 20 μA
100 Hz to 5 kHz 0.042 % + 20 μA
100 mA to 1 A (10 to 20) Hz 0.46 % + 200 μA
(20 to 45) Hz 0.19 % + 200 μA
(45 to 100) Hz 0.10 % + 200 μA
100 Hz to 5 kHz 0.12 % + 200 μA
AC Current – Generate3
(110 to 550) A (45 to 65) Hz 1.4 % Fluke 5500A with
Fluke 50-turn coil
Up to 1000 A (65 to 440) Hz 1.9 % Valhalla 2555A
V. Electrical – RF/Microwave
Parameter/Equipment Range CMC2, 7 () Comments
RF Tuned Power3 –
Generate, Connector Type N
Up to 1.3 GHz (0 to -3) dB 0.40 dB HP 8902A
2.5 MHz to 26.5 GHz (-3 to -127) dB 0.72 dB w/HP11722A,
HP11793A, HP
11792A
RF Absolute Power3 –
Generate, Connector Type N
50 MHz to 50 GHz (-70 to -30) dB 0.64 dB HP 438B, 8484A,
(-30 to -20) dB 0.06 dB 8481A, 8487A
(-20 to +10) dB 0.068 dB
(+10 to +20) dB 1.2 %
(A2LA Cert. No. 0935.05) 10/27/2011 Page 13 of 17
14. Parameter/Equipment Range CMC2, 7 () Comments
Amplitude Modulation3 –
Measure
Rate: 150 kHz to 10 MHz 50 Hz to 10 kHz 4.0 % HP 8902A
Depth: (5 to 99) % 20 Hz to 100 kHz 4.6 %
Rate: 10 MHz to 1.3 GHz 50 Hz to 50 kHz 3.6 %
Depth: (5 to 99) % 20 Hz to 100 kHz 4.6 %
Frequency Modulation –
Measure3
Rate: 250 kHz to 10 MHz 20 Hz to 10 kHz 3.1 % HP 8902A
Dev: 40 kHz
Rate: 10 MHz to 1.3 GHz 20 Hz to 200 kHz 7.7 %
Dev: 400 kHz 50 Hz to 100 kHz 1.6 %
Phase Modulation3 – Measure
Rate: 10 MHz to 1.3 GHz 200 Hz to 20 kHz 7.0 % HP 8902A
VI. Fluid Quantities
Parameter/Equipment Range CMC2 () Comments
Flow – Air (10 to 300) ml/min 1.3 ml Bios DC-LC-1
100 ml/min to 10 L/min 2.2 ml Bios DCMG1
500 ml/min to 50 L/min 1.7 ml Bios DC-HS-1
Particle – Air 0.1, 0.2, 0.4, 1.0, 2.4 µm 100 % efficiency Comparison to
standard filter
Viscosity – @ 25 °C (17 to 2000) cst 0.68 % of value Cannon series N fluid
(1990 to 200 400) cP 0.52 % of value standards
(A2LA Cert. No. 0935.05) 10/27/2011 Page 14 of 17
15. VII. Mechanical
Parameter/Equipment Range CMC2, 7 () Comments
Torque3 (0 to 100) in·oz 0.78 % Mountz torque system
(0 to 100) in·lb 0.67 %
(0 to 100) ft·lb 0.71 %
(100 to 1000) ft·lb 1.4 % CDI torque system
Scales and Balances3 (1 to 200) mg 0.17 mg Verification with class 1
(1 to 200) g 0.19 mg weights and balance
Up to 5 kg 31 mg
Up to 30 kg 47 mg
(10 to 600) lb 1.0 LSVD Class F weights
Mass3 Up to 500 mg 12 μg Class 1 weights and
Up to 500 g 1.3 mg balance
Up to 30 kg 140 mg
Pressure Gages, (-14.7 to 300) psi 0.17 % Fluke 744 w/pressure
Transducers, Up to 3000 psi 0.03 % of rng modules, Honesty HX601
Transmitters3 Up to 10 000 psi 0.25 % of rng
(0 to 25 000) psi 0.12 % full scale
Tachometer3 (5 to 7999) rpm 1.0 rpm DT209X tachometer
(8000 to 24 999) rpm 2.0 rpm
(25 000 to 99 999) rpm 3.0 rpm
Air Velocity3 Up to 8000 ft/min 2.3 % TSI 8360 velocity
Force – Compression & (3 to 30 000) lbf 0.4 % Load cell system
Tension3 (30 000 to 300 000) lbf 0.4 %
(A2LA Cert. No. 0935.05) 10/27/2011 Page 15 of 17
16. VIII. Optical Quantities
Parameter/Equipment Range CMC2, 7 () Comments
Optical Power3 –
Measure
850 nm (6 to -60) dB 4.9 % Agilent 8163A, 81634,
8156A, 81532
1310 nm (10 to -110) dB 4.9 %
1550 nm (10 to -110) dB 4.7 %
Optical Wavelength3 – (700 to 1650) nm 3.9 % Agilent 86120B
Measure
Fiber Optics Wavelength3 (1510 to 1540) nm 1.5 parts in 106 NIST SRM 2517A
– Measuring Equipment
Illuminance (10 to 3000) fc 4 % + 2 LSD Standard light meter
LSD=least significant
digit
IX. Thermodynamics
Parameter/Equipment Range CMC2 () Comments
Humidity – Measuring 11 % RH 1.6 % RH Saturated salt
Equipment3 33 % RH 1.7 % RH solutions
75 % RH 1.4 % RH
97 % RH 2 % RH
Humidity – Measure3 (0 to 40) % RH 2.1 % RH Vaisala HMP 77 probe
(40 to 97) % RH 2.8 % RH
Temperature – Measure3 (-40 to 300) ºC 0.2 ºC Azonix A1011 and
PRT
(A2LA Cert. No. 0935.05) 10/27/2011 Page 16 of 17
17. X. Time & Frequency
Parameter/Equipment Frequency CMC2 () Comments
Frequency – Measure, 10 MHz 1 x 10-11 Hz Trembel GPS
Fixed Point
____________________________________________
1
This laboratory offers commercial calibration service and field calibration service.
2
Calibration and Measurement Capability (CMC) is the smallest uncertainty of measurement that a
laboratory can achieve within its scope of accreditation when performing more or less routine calibrations
of nearly ideal measurement standards or nearly ideal measuring equipment. Calibration and
Measurement Capabilities represent expanded uncertainties expressed at approximately the 95 % level of
confidence, usually using a coverage factor of k = 2. The actual measurement uncertainty of a specific
calibration performed by the laboratory may be greater than the CMC due to the behavior of the
customer’s device and to influences from the circumstances of the specific calibration.
3
Field calibration service is available for this calibration and this laboratory meets A2LA R104 – General
Requirements: Accreditation of Field Testing and Field Calibration Laboratories for these calibrations.
Please note the actual measurement uncertainties achievable on a customer's site can normally be
expected to be larger than the CMC found on the A2LA Scope. Allowance must be made for aspects such
as the environment at the place of calibration and for other possible adverse effects such as those caused
by transportation of the calibration equipment. The usual allowance for the actual uncertainty introduced
by the item being calibrated, (e.g. resolution) must also be considered and this, on its own, could result in
the actual measurement uncertainty achievable on a customer’s site being larger than the CMC.
4
The measurands stated are generated with the Fluke 5500A, Fluke 5700A series of instruments. This
capability is suitable for the calibration of the devices intended to measure the stated measurand in the
ranges indicated. CMCs are expressed as either a specific value that covers the full range or as a fraction
of the reading plus a fixed floor specification.
5
The measurands stated are measured with the HP 3458A series of instruments. This capability is suitable
for the calibration of the devices intended to generate the measurand in the ranges indicated. CMCs are
expressed as either a specific value that covers the full range or as a combination of the fraction of the
reading/output plus a range specification.
6
In the statement of CMC, L is the numerical value of the nominal length of the device measured in inches.
D is the numerical value of the nominal diameter of the device measured in inches. Pitch diameter is
measured by the three-wire method. IV refers to indicated value.
7
In the statement of CMC, the value is defined as the percentage of reading.
(A2LA Cert. No. 0935.05) 10/27/2011 Page 17 of 17
18. A2LA has accredited
MICRO PRECISION CALIBRATION
Batino, Calamba City, Laguna, Philippines
for technical competence in the field of
Calibration
This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2005 General Requirements for
the Competence of Testing and Calibration Laboratories. This laboratory also meets the requirements of ANSI/NCSL Z540-1-1994 and any
additional program requirements in the field of calibration. This accreditation demonstrates technical competence for a defined scope and the
operation of a laboratory quality management system (refer to joint ISO-ILAC-IAF Communiqué dated 8 January 2009).
Presented this 27th day of October 2011.
_______________________
President & CEO
For the Accreditation Council
Certificate Number 935.05
Valid to April 30, 2013
For the calibrations to which this accreditation applies, please refer to the laboratory’s Calibration Scope of Accreditation.