Contenu connexe Similaire à SPICE MODEL of 2SK3797 (Standard+BDS Model) in SPICE PARK (20) Plus de Tsuyoshi Horigome (20) SPICE MODEL of 2SK3797 (Standard+BDS Model) in SPICE PARK1. Device Modeling Report
COMPONENTS: Power MOSFET (Model Parameters)
PART NUMBER: 2SK3797
MANUFACTURER: TOSHIBA
Body Diode (Model Parameters ) / ESD Protection Diode
Bee Technologies Inc.
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
3. MOSFET MODEL
PSpice model
Model description
parameter
LEVEL
L Channel Length
W Channel Width
KP Transconductance
RS Source Ohmic Resistance
RD Ohmic Drain Resistance
VTO Zero-bias Threshold Voltage
RDS Drain-Source Shunt Resistance
TOX Gate Oxide Thickness
CGSO Zero-bias Gate-Source Capacitance
CGDO Zero-bias Gate-Drain Capacitance
CBD Zero-bias Bulk-Drain Junction Capacitance
MJ Bulk Junction Grading Coefficient
PB Bulk Junction Potential
FC Bulk Junction Forward-bias Capacitance Coefficient
RG Gate Ohmic Resistance
IS Bulk Junction Saturation Current
N Bulk Junction Emission Coefficient
RB Bulk Series Resistance
PHI Surface Inversion Potential
GAMMA Body-effect Parameter
DELTA Width effect on Threshold Voltage
ETA Static Feedback on Threshold Voltage
THETA Mobility Modulation
KAPPA Saturation Field Factor
VMAX Maximum Drift Velocity of Carriers
XJ Metallurgical Junction Depth
UO Surface Mobility
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
4. Transconductance Characteristic
Circuit Simulation Result
10
9
8
7
gfs
6
5
4
Measurement
3
Simulation
2
1 2 3 4 5 6 7 8 9 10
ID - Drain Current - A
Comparison table
gfs
Id(A) Error(%)
Measurement Simulation
1 3.000 3.03 1.000
2 4.200 4.255 1.310
5 6.400 6.494 1.469
10 9.000 9.174 1.933
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
5. Vgs-Id Characteristic
Circuit Simulation result
30A
20A
10A
0A
0V 2V 4V 6V 8V 10V
I(V3)
V_V2
Evaluation circuit
V3
0Vdc
U29 Vv ariable
10Vdc 2SK3797
20Vdc
V2
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
6. Comparison Graph
Circuit Simulation Result
10.00
Measurement
9.00
Simulation
8.00
7.00
ID - Drain Current - A
6.00
5.00
4.00
3.00
2.00
1.00
0 2 4 6 8 10
VGS - Gate to Source Voltage - V
Simulation Result
VGS(V)
ID(A) Error (%)
Measurement Simulation
1 4.400 4.431 0.705
2 4.650 4.713 1.355
5 5.200 5.291 1.750
10 5.800 5.958 2.724
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
7. Rds(on) Characteristic
Circuit Simulation result
8.0A
7.0A
6.0A
5.0A
4.0A
3.0A
2.0A
1.0A
0A
0V 1.0V 2.0V 3.0V 4.0V 5.0V
I(V3)
V_VDS
Evaluation circuit
V3
0Vdc
U29 VDS
10Vdc 2SK3797
0Vdc
VGS
0
Simulation Result
ID=6.5A, VGS=10V Measurement Simulation Error (%)
R DS (on) 0.320 0.315 -1.563
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
8. Gate Charge Characteristic
Circuit Simulation result
20V
16V
12V
8V
4V
0V
0 20n 40n 60n 80n 100n
V(W1:3)
Time*1mS
Evaluation circuit
V2
0Vdc
Dbreak
PER = 1000u U29
PW = 600u W1
TF = 10n + 2SK3797 D1
TR = 10n I2
-
TD = 0 13Adc
I2 = 1m W
I1 IOFF = 1mA
I1 = 0 ION = 0uA
V1
400Vdc
0
Simulation Result
VDD=400V,ID=13A
Measurement Simulation Error (%)
,VGS=10V
Qgs(nC) 18.000 17.959 -0.228
Qgd(nC) 22.000 22.105 0.477
Qg 62.000 53.895 -13.073
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
9. Capacitance Characteristic
Measurement
Simulation
Simulation Result
Cbd(pF)
VDS(V) Error(%)
Measurement Simulation
0.1 2900 2904 0.138
0.2 2800 2801 0.036
0.5 2500 2510 0.400
1 2200 2196 -0.182
2 1700 1706 0.353
5 1080 1082 0.185
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
10. Switching Time Characteristic
Circuit Simulation result
16V
14V
12V
10V
8V
6V
4V
2V
0V
0.8us 0.9us 1.0us 1.1us 1.2us 1.3us
V(L2:1)/20 V(L1:2)
Time
Evaluation circuit
L2 R2
50nH
30
L1
U32
30nH
V1 = 0 2SK3797 V1
V2 = 10 V2 200Vdc
TD = 1u R3
TR = 1n
TF = 1n 50
PW = 10u
PER = 200u
0
Simulation Result
ID=6.5 A, VDD=200V
Measurement Simulation Error(%)
VGS=0/10V
Ton(ns) 110.000 113.320 3.018
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
11. Output Characteristic
Circuit Simulation result
30A
25A
20A
6.6V
15A
6.2V
10A
5.8.V
5.4V
5A
VGS=5V
0A
0V 5V 10V 15V 20V 25V 30V
I(Vdsense)
V_Vvariable
Evaluation circuit
Vdsense
0Vdc
U32
Vv ariable
10Vdc 2SK3797
20Vdc
Vstep
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
12. BODY DIODE SPICE MODEL
Forward Current Characteristic
Circuit Simulation Result
100A
10A
1.0A
100mA
0V 0.2V 0.4V 0.6V 0.8V 1.0V 1.2V
I(R1)
V_V1
Evaluation Circuit
R1
0.01m
2SK3797
V1
0Vdc U29
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
13. Comparison Graph
Circuit Simulation Result
100.00
Measurement
Simulation
Drain reverse current IDR(A)
10.00
1.00
0.10
0 0.4 0.8 1.2 1.6
Source-Drain voltage VSD(V)
Simulation Result
VSD(V)
IDR(A) Measuremen Simulation %Error
0.1 0.590 0.590 0.000
0.2 0.620 0.620 0.000
0.5 0.660 0.661 0.152
1 0.700 0.694 -0.857
2 0.730 0.729 -0.137
5 0.780 0.788 1.026
10 0.850 0.846 -0.471
20 0.930 0.929 -0.108
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
14. Reverse Recovery Characteristic
Circuit Simulation Result
400mA
300mA
200mA
100mA
-0mA
-100mA
-200mA
-300mA
-400mA
2us 4us 6us 8us 10us 12us 14us 16us 18us 20us 22us
I(R1)
Time
Evaluation Circuit
R1
50
V1 = -9.4v V1 D3797
V2 = 10.7v
TD = 0.8u U33
TR = 10ns
TF = 19ns
PW = 8us
PER = 100us
0
Compare Measurement vs. Simulation
Trr(us) Measurement Simulation Error (%)
Trj+Trb 3.200 3.209 0.281
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
15. Reverse Recovery Characteristic Reference
Trj=1.600(us)
Trb=1.600(us)
Conditions:Ifwd=lrev=0.2(A),Rl=50
Example
Relation between trj and trb
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
16. ESD PROTECTION DIODE SPICE MODEL
Zener Voltage Characteristic
Circuit Simulation Result
10mA
9mA
8mA
7mA
6mA
5mA
4mA
3mA
2mA
1mA
0A
0V 10V 20V 30V 40V 50V 60V 70V 80V 90V 100V
I(R1)
V_V1
Evaluation Circuit
R1
0.01m
V1
0Vdc
R2
U30
100MEG 2SK3797
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006