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Device Modeling Report

COMPONENTS: SiC Schottky Barrier Diode
PART NUMBER: TRS8E65C
MANUFACTURER: TOSHIBA
REMARK: Professional Model

Bee Technologies Inc.

All Rights Reserved Copyright (C) Bee Technologies Inc. 2013

1
Circuit Configuration

DIODE MODEL PARAMETERS
PSpice
model
parameter
IS
N
RS
IKF
CJO
M
VJ
ISR
BV
IBV
TT
EG

Model description
Saturation Current
Emission Coefficient
Series Resistance
High-injection Knee Current
Zero-bias Junction Capacitance
Junction Grading Coefficient
Junction Potential
Recombination Current Saturation Value
Reverse Breakdown Voltage(a positive value)
Reverse Breakdown Current(a positive value)
Transit Time
Energy-band Gap

All Rights Reserved Copyright (C) Bee Technologies Inc. 2013

2
Forward Current Characteristics
Circuit Simulation result

8.0A

7.0A

6.0A

5.0A

4.0A

3.0A

2.0A

1.0A

0A
0V

0.5V

1.0V

1.5V

2.0V

I(R1)
V_V1

Evaluation circuit
R1

0.01m
V1

U1
TRS8E65C

0Vdc

0

All Rights Reserved Copyright (C) Bee Technologies Inc. 2013

3
Comparison Graph
Circuit Simulation result

Comparison table

VF (V)

IF (A)

Measurement

Simulation

%Error

0.1

0.930

0.928

-0.22

1

1.040

1.044

0.39

2

1.125

1.123

-0.18

4

1.260

1.258

-0.16

6

1.380

1.381

0.07

8

1.500

1.500

0.00

All Rights Reserved Copyright (C) Bee Technologies Inc. 2013

4
Junction Capacitance Characteristic
Circuit Simulation result

1.0n

100p

10p
100mV
I(V2)/(650V/1u)

1.0V

10V

100V

V(N16610)

Evaluation circuit
V2

0Vdc
V2 = 650
V1 = 0
TD = 0
TR = 1us
TF = 500ns
PW = 100us
PER = 500us

U1
TRS8E65C

V1

0

All Rights Reserved Copyright (C) Bee Technologies Inc. 2013

5
Comparison Graph
Circuit Simulation result

Comparison table

CT (pF)

VR(V)

Measurement

Simulation

%Error

0.1

490.000

507.000

3.47

0.2

475.000

486.000

2.32

0.5

450.000

460.500

2.33

1

410.000

425.460

3.77

2

360.000

373.700

3.81

5

277.000

286.000

3.25

10

211.000

217.800

3.22

20

154.000

159.200

3.38

50

98.000

101.900

3.98

100

70.000

72.468

3.53

All Rights Reserved Copyright (C) Bee Technologies Inc. 2013

6
Reverse Characteristic
Circuit Simulation result

10uA

1.0uA

100nA

10nA

1.0nA
100V
I(R1)

200V

300V

400V

500V

600V

V_V1

Evaluation circuit
R1

100m
V1

U1
TRS8E65C

0Vdc

0

All Rights Reserved Copyright (C) Bee Technologies Inc. 2013

7
Comparison Graph
Circuit Simulation result

Comparison table

IR (A)

VR (V)
Measurement

Simulation

%Error

2.00E-09

423.00

402.40

-4.87

1.00E-08

490.00

485.50

-0.92

1.00E-07

590.00

589.40

-0.10

4.00E-07

650.00

650.00

0.00

All Rights Reserved Copyright (C) Bee Technologies Inc. 2013

8

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SPICE MODEL of TRS8E65C (Professional Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: SiC Schottky Barrier Diode PART NUMBER: TRS8E65C MANUFACTURER: TOSHIBA REMARK: Professional Model Bee Technologies Inc. All Rights Reserved Copyright (C) Bee Technologies Inc. 2013 1
  • 2. Circuit Configuration DIODE MODEL PARAMETERS PSpice model parameter IS N RS IKF CJO M VJ ISR BV IBV TT EG Model description Saturation Current Emission Coefficient Series Resistance High-injection Knee Current Zero-bias Junction Capacitance Junction Grading Coefficient Junction Potential Recombination Current Saturation Value Reverse Breakdown Voltage(a positive value) Reverse Breakdown Current(a positive value) Transit Time Energy-band Gap All Rights Reserved Copyright (C) Bee Technologies Inc. 2013 2
  • 3. Forward Current Characteristics Circuit Simulation result 8.0A 7.0A 6.0A 5.0A 4.0A 3.0A 2.0A 1.0A 0A 0V 0.5V 1.0V 1.5V 2.0V I(R1) V_V1 Evaluation circuit R1 0.01m V1 U1 TRS8E65C 0Vdc 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2013 3
  • 4. Comparison Graph Circuit Simulation result Comparison table VF (V) IF (A) Measurement Simulation %Error 0.1 0.930 0.928 -0.22 1 1.040 1.044 0.39 2 1.125 1.123 -0.18 4 1.260 1.258 -0.16 6 1.380 1.381 0.07 8 1.500 1.500 0.00 All Rights Reserved Copyright (C) Bee Technologies Inc. 2013 4
  • 5. Junction Capacitance Characteristic Circuit Simulation result 1.0n 100p 10p 100mV I(V2)/(650V/1u) 1.0V 10V 100V V(N16610) Evaluation circuit V2 0Vdc V2 = 650 V1 = 0 TD = 0 TR = 1us TF = 500ns PW = 100us PER = 500us U1 TRS8E65C V1 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2013 5
  • 6. Comparison Graph Circuit Simulation result Comparison table CT (pF) VR(V) Measurement Simulation %Error 0.1 490.000 507.000 3.47 0.2 475.000 486.000 2.32 0.5 450.000 460.500 2.33 1 410.000 425.460 3.77 2 360.000 373.700 3.81 5 277.000 286.000 3.25 10 211.000 217.800 3.22 20 154.000 159.200 3.38 50 98.000 101.900 3.98 100 70.000 72.468 3.53 All Rights Reserved Copyright (C) Bee Technologies Inc. 2013 6
  • 7. Reverse Characteristic Circuit Simulation result 10uA 1.0uA 100nA 10nA 1.0nA 100V I(R1) 200V 300V 400V 500V 600V V_V1 Evaluation circuit R1 100m V1 U1 TRS8E65C 0Vdc 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2013 7
  • 8. Comparison Graph Circuit Simulation result Comparison table IR (A) VR (V) Measurement Simulation %Error 2.00E-09 423.00 402.40 -4.87 1.00E-08 490.00 485.50 -0.92 1.00E-07 590.00 589.40 -0.10 4.00E-07 650.00 650.00 0.00 All Rights Reserved Copyright (C) Bee Technologies Inc. 2013 8