There were 4 hang issues reported across two wafers and two final testing machines. One wafer had a bad die at coordinates (0,16) that was causing hang problems and could be shipped for further investigation. The hangs on the two final testing machines were resolved by switching operating systems, resetting components, and reloading test programs. The operating system version R10.8.4 seemed to be causing hangs after power cuts but runs successfully after first booting with R10.6.4.p1.

1. Dear Chris,
Today we meet 4 hang issues, two for wafer(fusion03,06), other 2 for
final testing(fusion20,21).
Pls see below information ….

2. Fusion06(W/T): vp40575, the last message… fail on adc10m*8

3. Fusion06 : (x,y)=(0,16) , this “bad die” get hang problem.

4. Do you need this wafer(Y41594-18D1) for further
investigation ? We can ship it you, pls let us know
asap.
We check the good die is OK, so
we skip the bad die, then keep it on going … at the
moment.

5. Fusion21(F/T) : vp40581H

6. Beafore hang…. change type from vp40584 to vp40581
1.We switch the O.S. back to R10.6.4.p1,
Run  pass
2. then switch the O.S. to R10.8.4
Get  pass
Running now….

7. Fusion20(F/T) : vp40581H , dpro problem

8. Before hang … operator load the tp for new lot….
1. Reset the DPRO(back rack) button …
2. Restart_tester fusion20 –v -k
3. Reload tp  pass
Running now…

9. The O.S. of R10.8.4 seem have something wrong,
Like … after the power cut, we re-boot the tester, also get hang(before
is good)
It need to switch the O.S. to R10.6.4.p1 to running a while(1~2pcs),
then switch to R10.8.4 running again, get pass.
Did the O.S. lose or undefine some variables, but that we don’t know
…??
Too many kind of hang …