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ATE Testers Overview
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Overview of testers usage for debug
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Level sensitive scan design(LSSD) and Boundry scan(BS)
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Praveen Kumar
ATPG Methods and Algorithms
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VLSI testing and analysis
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Surekha PuriGosavi
Recommandé
Level sensitive scan design(LSSD) and Boundry scan(BS)
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VLSI Testing Techniques
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Fundamentals of sdh
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UVM Methodology Tutorial
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Time Division Multiplexing
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Wallace tree multiplier.pptx1
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VLSI testing and analysis
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Pactron Ate Introduction
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Contenu connexe
Tendances
I2C Protocol
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CPLD (COMPLEX PROGRAMMABLE LOGIC DEVICES)
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Serial peripheral Interface - Embedded System Protocol
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Introductin sdh-pdh
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Foundation Fieldbus
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I2C Protocol
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System verilog coverage
Pasolink Neo Training Doc
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Xilinx 4000 series
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ATE Testers Overview
1.
ATE Testers Overview
Jun-2005
2.
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8.
TIU - Tester
Interface Unit Device Under Test TIU
9.
Tester Channel -
S9K style 01011 00011
10.
Tester Channel -
IMS style VTERM
11.
PEC 5 Block
Diagram (S9K KX)
12.
Functional Test Content
Pattern Timing Levels Func. Test
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24.
Backups
25.
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Testers Comparison Yes
Yes Yes Yes Yes Yes N/A N/A Pattern Chain/Loop Yes Yes Yes Yes Yes Yes N/A N/A Keep Alive N/A N/A Yes Yes Yes Yes N/A N/A Split Timing Mode +/-100ps +/-50ps +/-50ps +/-50ps +/-75ps +/-100ps +/-125ps +/-175ps Edge Placement Acc. 7.8125pS 10pS 9.765pS 9.765pS 9.765pS 9.765pS 39.062pS Period Resolution 5ns 0ns 5ns 0ns 2ns 2.2ns 5ns 5ns Round Trip @ Pogo 128MB 2MB 64MB 64MB 64MB 64MB 32MB 32MB Local Memory DM250 DM1100 PEC76 PEC5.1 PEC5 PEC5 PEC4 PEC3 PEC Type 24K 2MB 124Kx2 124Kx2 124Kx2 124Kx2 16Kx2 16K Capture Memory 4K N/A 4K 4K 4K 4K 4K 4K Subroutine Memory Vector Memory 4ns 2ns 5ns 5ns 5ns 5ns 9.6ns 9.6ns Event Timing Res. Timing Details - - 1600MT/s - - - - - F8 - MUX AVM F2 - - - 1000MT/s - - 400MT/s - HW MUX - - 800MT/s 800MT/s 800MT/s - - - F4 - AVM F2 500MT/s 1100MT/s 400MT/s 400MT/s 400MT/s 400MT/s 208MT/s 208MT/s F2 250MT/s 550MT/s 200MT/s 200MT/s 200MT/s 200MT/s 104MT/s 104MT/s F1 Data Rate CMT IMS EXA KX-RAC KX IX GX FX System