Personal Information
Entreprise/Lieu de travail
Portland, Oregon Area United States
Profession
Reliability Engineer at Intel Corporation
Secteur d’activité
Electronics / Computer Hardware
À propos
Research Summary:
Currently I work with CMOS devices designed and manufactured in an advanced technology and use novel laser techniques to test device reliability.
I developed an automatic image analysis framework using robust image processing algorithm for integrating 'stack' of medical images into a volume image for direct detection and tracking of small changes between temporal series.
I Investigated the nature of dark current generated in CCDs and CMOS chips in imaging devices. Explored the effects of dislocations and point defects on non-linearity of dark current generation.