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History of Reverse Engineering
“Secrets” originally
embedded in software
• Obfuscation battles
• Anti-debugger technologies
• Just-in-time decryption
Decompilers & debuggers
• Kept pace and overcame
techniques
• Easy access to tools &
training
Barrier/cost to attack very
low
Move “secrets” to firmware
• Raise barrier to entry/hack
• Require physical access to
device (maybe)
• Closer tie in to hardware
functions
Firmware extraction
• Firmware updates online
• Static analysis of firmware
• Growing pool of (free) tools
Some Advantages:
• Physical barriers (in addition to
any software/coding barriers)
• Requires different toolset for
hacking
• Tools more expensive (than
software)
Some Disadvantages:
• Locked in to hardware
development cycles
• Higher cost of updating (if
able)
Hardware Hacking
• Initially all about communications monitoring
• Protocol decoding and/or emulation
• Attack the interfaces first
• If it’s accessible, try it
• If it’s not accessible, dismantle a little and try it
• Smartcard, Serial, JTAG, USB, I2C, Ethernet, etc.
• Broad toolbag
• Software tools,
• Oscilloscopes,
• Logic analyzers,
• Probes and sniffers…
Intel 8008 Chip
• 45 Years old - "© Intel 1971“
• Ancestor to the x86 processor family
• 3098 transistors @ 0.5 MHz
• 10µm fabrication
Intel 8008 Chip
• Power & Data rails
• 8-bit Arithmetic/Logic Unit (ALU)
• 14-bit address bus
• 16 KB of memory
Intel 8008 Chip
• Block Diagram
• User’s Manual
Getting smaller – 10nm
• Qualcomm Snapdragon 835 has
a die size of 72.3 mm2
• Samsung Galaxy S8
• 10nm at the gate level
• Dual shallow trench isolation
(STI) and extra processing
necessary to enable a dummy
poly single diffusion break
(SDB).
How RE used to be
done
• Optical imaging
• Tape together the photos
• Crawl around on the floor
Blame MAME
• Multiple Arcade Machine Emulator
• Project to preserve decades of “vintage”
gaming software history
• Recovery of game ROM’s from original circuit
boards and chips
• Reverse engineering the boards/ROM’s
• Code extraction from Mask ROM
• The CAPS0ff project
• http://caps0ff.blogspot.com/
Physical Barriers
to IC Reversing
• Escalating battle between engineer and reverser
• Variety of techniques grows yearly:
• Change metals between layers to defeat acids
• Doping of silicon to prevent x-rays and infra-red
• Photo-sensitive fuses
• Active meshes covering “secrets”
• Obfuscation and false trails
• Make things smaller…
Semiconductor RE
Methodology
• It all begins with “studying” the chip
• Secret extraction is usually performed in “5
easy steps”
• Decapsulation
• Delayering
• Imaging
• Image analysis
• Data extraction
Method Pro Con
Chemical Wet High etch rates: Sulfuric or Nitric acid
Great when die small compared to
package
Doesn’t work on ceramic packages
Acids damage frame/bond wires
Curved/isotropic etch
Dry Can remove any material
Good selectivity over etch zones
Slow for ceramic
Contamination affects evenness of etch
Mechanical Grinding and
Polishing
Even removal
Easy to use
Bad for selectivity over etch zones
Milling Remove material in a specific area
Three axis material removal
Accuracy dependent upon tool (and
CNC skills)
Thermal Shock Fast and inexpensive
Easy to perform
High risk of die damage
Bad for selectivity over zones
Nanoscale
Fabrication
High Current FIB High accuracy in material removal (nm)
Good selectivity over etch zones
Expensive and requires experience
Slow milling rate (30µm3/s)
Plasma FIB High accuracy in material removal (nm)
Fast & good selectivity over etch zones
Expensive and requires experience
Laser
Ablation
Laser Accurate material removal (µm)
Faster milling rate (500+ over Plasma FIB)
Expensive and requires experience
Decapsulation
• Simple epoxy etching via acids
Visibility
• Different tools:
• Optical microscopy
(500x - 1,500x magnification)
• FIB
(250x - 800,000x magnification)
• SEM
(70x - 1,000,000x magnification)
Backside Analysis
Imaging
• Increased use of metallized layers
• Capable of blocking microscopes in key areas
• Added complexity in the delayering process
• Pure silicon is transparent to near-
infrared
• Backside analysis of the chip
• Getting more difficult
• Dopants added to the substrate can alter the
electronic characteristics of the wafer
“Biased, Backside Failure Analysis Techniques for Small Plastic Packages” - Steve Brockett and Ting Xiong
3D X-Ray Microscopes
• New generation of IC analysis tools
• X-Ray rendering of 3D structures
at 70 nm
• Non destructive and can be used
on fully intact IC packages
Micro Probing
• Probing individual conductors and devices
• Selectively inject and measure the effects
of real-time currents and voltages on
individual semiconductor devices
under varying conditions
• locate and identify specific
weaknesses that will allow
data to be extracted
Micro Probing
• Requirements vary per chip
• Specialized buffers and drive circuits
• Customized per chip / optimized per chip line
• Avoid chip security mechanisms or altering behavior
• Probing needles often < 0.1 microns
• Reducing voltages and slowing
down the chip
• Study capacitance dynamics
• Purpose-built logic analysis systems
• Study proprietary chip languages
Glitching
• Applying unexpected or non-standard inputs to
certain transistors in the chip
• Can be made to execute a number of
unexpected or wrong instructions
• Systematic process to identify and label areas of
the integrated circuit and to identify weaknesses
• Process includes:
• Electrical, mechanical or specific light frequencies
• A combination of strategically placed needles
used to induce cascading electrical glitches
• Manipulation of ground lines and higher voltages
Simulation Software
• IC Image layers are aligned and vectorized
• 3D CAD software used to map vias, label
memory/code areas, etc.
• Seasoned extraction engineer analyzes
the drawing
• Annotate the components, wires, and
devices
• New generation of circuit virtualization
• Perform glitching and “patching”
IC’s costing cents?
What’s possible?
 Imaging techniques capable of:
 Reading bits at the metal level (e.g. Mask ROM)
 Reading bits at the silicon level (e.g. storage memory)
 Reading gate arrays to evaluate etched algorithms
 Virtualized simulation of chip functions
 Probing techniques capable of:
 Extracting stored code and memory dumps from any part of the IC
 Bypassing and usurping any physical block of functionality (e.g. random number
generation, crypto engines, etc.)
 Regulating power (and bits) to any part of the chip, algorithm, or “code”
“Non-destructive” Access
 Imaging process is traditionally destructive
 Changing with newer x-ray and microwave-based technologies
 Better virtualization of vectorized images = destruction doesn’t matter
 Imaging is a means to an end
 Key/skill lies in finding optimal routes to data/code “in situ”
 Processes of placing vias, laying tracks, probe sequencing, etc. can be
automated and repeated for copies of the same chip
 Once a chip has been “hacked”, repeated data manipulation often very
quick and easy
Attacks Against Mass Produced Devices
 High margin devices:
 Economics focused on customer retention
 Example: “Genuine XXXXX Toner Cartridges”
 Includes chips for authenticating compatibility policies
 Attacker must:
 Extract protocols, functionality, and algorithms,
 Extract keys and sensitive parameters,
 Commercialize an attack
Defenses:
• Use device specific keys and
revoke/update when compromised
• Use sophisticated crypto algorithms
• Software-encrypted algorithm stored
in memory that erases chips memory
• Optical sensors that erase the chips
memory
Backdoors
 Extracted secrets/code of target chip
 FPGA to replicate functionality
 Replicate package
 Modification of code
 Extra keys/secrets added
 Change/depreciate crypto functions
 Replace random number generator
 Hunting for backdoors in chip images?
 Needle in haystack, but auto labeling and virtualization increasing
success
Defending against Chip RE
 Attackers often probe and exploit component interfaces
 Design with assumption that interfaces and intermediate data are insecure
 Design uniformity is useful for obfuscation of interfaces
 Electrical uniformity is useful for limiting side-channel attacks
 Resistive grids are of limited use against probing
 Not sufficient to secure software components from software attacks
and hardware components from hardware attacks
 Symbiosis of software and hardware stored code/secrets
 Don’t assume that data disappears when powered off
 Electron decay slowed by reducing temperature
The Threat Going Forward
 Barrier for entry is high, but dropping quickly
 SIM, FIB, Probe station, etc.
 $500k+ for starters
 Renting equipment $300+ hour
 IC code is immobile
 Very little (historically) has been security audited – and is generally poor
 Stored procedures and code bases now open to review/assessment
 Extraction of cell-phone Java engines, container security, and proprietary
code bases “downloaded” and exploitable vulnerabilities are being found
 Unpatchable critical vulnerabilities
 Blackeye for vendor… or costly product recall???
BlueHat v17 || Extracting Secrets from Silicon – A New Generation of Bug Hunting
BlueHat v17 || Extracting Secrets from Silicon – A New Generation of Bug Hunting

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BlueHat v17 || Extracting Secrets from Silicon – A New Generation of Bug Hunting

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  • 4. History of Reverse Engineering “Secrets” originally embedded in software • Obfuscation battles • Anti-debugger technologies • Just-in-time decryption Decompilers & debuggers • Kept pace and overcame techniques • Easy access to tools & training Barrier/cost to attack very low Move “secrets” to firmware • Raise barrier to entry/hack • Require physical access to device (maybe) • Closer tie in to hardware functions Firmware extraction • Firmware updates online • Static analysis of firmware • Growing pool of (free) tools Some Advantages: • Physical barriers (in addition to any software/coding barriers) • Requires different toolset for hacking • Tools more expensive (than software) Some Disadvantages: • Locked in to hardware development cycles • Higher cost of updating (if able)
  • 5. Hardware Hacking • Initially all about communications monitoring • Protocol decoding and/or emulation • Attack the interfaces first • If it’s accessible, try it • If it’s not accessible, dismantle a little and try it • Smartcard, Serial, JTAG, USB, I2C, Ethernet, etc. • Broad toolbag • Software tools, • Oscilloscopes, • Logic analyzers, • Probes and sniffers…
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  • 8. Intel 8008 Chip • 45 Years old - "© Intel 1971“ • Ancestor to the x86 processor family • 3098 transistors @ 0.5 MHz • 10µm fabrication
  • 9. Intel 8008 Chip • Power & Data rails • 8-bit Arithmetic/Logic Unit (ALU) • 14-bit address bus • 16 KB of memory
  • 10. Intel 8008 Chip • Block Diagram • User’s Manual
  • 11. Getting smaller – 10nm • Qualcomm Snapdragon 835 has a die size of 72.3 mm2 • Samsung Galaxy S8 • 10nm at the gate level • Dual shallow trench isolation (STI) and extra processing necessary to enable a dummy poly single diffusion break (SDB).
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  • 13. How RE used to be done • Optical imaging • Tape together the photos • Crawl around on the floor
  • 14. Blame MAME • Multiple Arcade Machine Emulator • Project to preserve decades of “vintage” gaming software history • Recovery of game ROM’s from original circuit boards and chips • Reverse engineering the boards/ROM’s • Code extraction from Mask ROM • The CAPS0ff project • http://caps0ff.blogspot.com/
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  • 16. Physical Barriers to IC Reversing • Escalating battle between engineer and reverser • Variety of techniques grows yearly: • Change metals between layers to defeat acids • Doping of silicon to prevent x-rays and infra-red • Photo-sensitive fuses • Active meshes covering “secrets” • Obfuscation and false trails • Make things smaller…
  • 17. Semiconductor RE Methodology • It all begins with “studying” the chip • Secret extraction is usually performed in “5 easy steps” • Decapsulation • Delayering • Imaging • Image analysis • Data extraction
  • 18. Method Pro Con Chemical Wet High etch rates: Sulfuric or Nitric acid Great when die small compared to package Doesn’t work on ceramic packages Acids damage frame/bond wires Curved/isotropic etch Dry Can remove any material Good selectivity over etch zones Slow for ceramic Contamination affects evenness of etch Mechanical Grinding and Polishing Even removal Easy to use Bad for selectivity over etch zones Milling Remove material in a specific area Three axis material removal Accuracy dependent upon tool (and CNC skills) Thermal Shock Fast and inexpensive Easy to perform High risk of die damage Bad for selectivity over zones Nanoscale Fabrication High Current FIB High accuracy in material removal (nm) Good selectivity over etch zones Expensive and requires experience Slow milling rate (30µm3/s) Plasma FIB High accuracy in material removal (nm) Fast & good selectivity over etch zones Expensive and requires experience Laser Ablation Laser Accurate material removal (µm) Faster milling rate (500+ over Plasma FIB) Expensive and requires experience
  • 19. Decapsulation • Simple epoxy etching via acids
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  • 28. Visibility • Different tools: • Optical microscopy (500x - 1,500x magnification) • FIB (250x - 800,000x magnification) • SEM (70x - 1,000,000x magnification)
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  • 30. Backside Analysis Imaging • Increased use of metallized layers • Capable of blocking microscopes in key areas • Added complexity in the delayering process • Pure silicon is transparent to near- infrared • Backside analysis of the chip • Getting more difficult • Dopants added to the substrate can alter the electronic characteristics of the wafer “Biased, Backside Failure Analysis Techniques for Small Plastic Packages” - Steve Brockett and Ting Xiong
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  • 32. 3D X-Ray Microscopes • New generation of IC analysis tools • X-Ray rendering of 3D structures at 70 nm • Non destructive and can be used on fully intact IC packages
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  • 38. Micro Probing • Probing individual conductors and devices • Selectively inject and measure the effects of real-time currents and voltages on individual semiconductor devices under varying conditions • locate and identify specific weaknesses that will allow data to be extracted
  • 39. Micro Probing • Requirements vary per chip • Specialized buffers and drive circuits • Customized per chip / optimized per chip line • Avoid chip security mechanisms or altering behavior • Probing needles often < 0.1 microns • Reducing voltages and slowing down the chip • Study capacitance dynamics • Purpose-built logic analysis systems • Study proprietary chip languages
  • 40. Glitching • Applying unexpected or non-standard inputs to certain transistors in the chip • Can be made to execute a number of unexpected or wrong instructions • Systematic process to identify and label areas of the integrated circuit and to identify weaknesses • Process includes: • Electrical, mechanical or specific light frequencies • A combination of strategically placed needles used to induce cascading electrical glitches • Manipulation of ground lines and higher voltages
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  • 42. Simulation Software • IC Image layers are aligned and vectorized • 3D CAD software used to map vias, label memory/code areas, etc. • Seasoned extraction engineer analyzes the drawing • Annotate the components, wires, and devices • New generation of circuit virtualization • Perform glitching and “patching”
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  • 50. What’s possible?  Imaging techniques capable of:  Reading bits at the metal level (e.g. Mask ROM)  Reading bits at the silicon level (e.g. storage memory)  Reading gate arrays to evaluate etched algorithms  Virtualized simulation of chip functions  Probing techniques capable of:  Extracting stored code and memory dumps from any part of the IC  Bypassing and usurping any physical block of functionality (e.g. random number generation, crypto engines, etc.)  Regulating power (and bits) to any part of the chip, algorithm, or “code”
  • 51. “Non-destructive” Access  Imaging process is traditionally destructive  Changing with newer x-ray and microwave-based technologies  Better virtualization of vectorized images = destruction doesn’t matter  Imaging is a means to an end  Key/skill lies in finding optimal routes to data/code “in situ”  Processes of placing vias, laying tracks, probe sequencing, etc. can be automated and repeated for copies of the same chip  Once a chip has been “hacked”, repeated data manipulation often very quick and easy
  • 52. Attacks Against Mass Produced Devices  High margin devices:  Economics focused on customer retention  Example: “Genuine XXXXX Toner Cartridges”  Includes chips for authenticating compatibility policies  Attacker must:  Extract protocols, functionality, and algorithms,  Extract keys and sensitive parameters,  Commercialize an attack Defenses: • Use device specific keys and revoke/update when compromised • Use sophisticated crypto algorithms • Software-encrypted algorithm stored in memory that erases chips memory • Optical sensors that erase the chips memory
  • 53. Backdoors  Extracted secrets/code of target chip  FPGA to replicate functionality  Replicate package  Modification of code  Extra keys/secrets added  Change/depreciate crypto functions  Replace random number generator  Hunting for backdoors in chip images?  Needle in haystack, but auto labeling and virtualization increasing success
  • 54. Defending against Chip RE  Attackers often probe and exploit component interfaces  Design with assumption that interfaces and intermediate data are insecure  Design uniformity is useful for obfuscation of interfaces  Electrical uniformity is useful for limiting side-channel attacks  Resistive grids are of limited use against probing  Not sufficient to secure software components from software attacks and hardware components from hardware attacks  Symbiosis of software and hardware stored code/secrets  Don’t assume that data disappears when powered off  Electron decay slowed by reducing temperature
  • 55. The Threat Going Forward  Barrier for entry is high, but dropping quickly  SIM, FIB, Probe station, etc.  $500k+ for starters  Renting equipment $300+ hour  IC code is immobile  Very little (historically) has been security audited – and is generally poor  Stored procedures and code bases now open to review/assessment  Extraction of cell-phone Java engines, container security, and proprietary code bases “downloaded” and exploitable vulnerabilities are being found  Unpatchable critical vulnerabilities  Blackeye for vendor… or costly product recall???

Notes de l'éditeur

  1. http://www.passiveprofitmodel.com/the-secret-way-to-earn-50-from-google-adsense/
  2. http://study.com/academy/subj/history.html
  3. Image: https://www.csoonline.com/article/3220476/security/researchers-say-now-you-too-can-disable-intel-me-backdoor-thanks-to-the-nsa.html
  4. http://semiengineering.com/defending-against-reverse-engineering/
  5. https://lh3.googleusercontent.com/-Z4RzZ24yNqU/WF4ffuFFN4I/AAAAAAAA-pI/ol-npvcvl_YKk8IRVgkO4qN7RMcqcRCMwCHM/w9999/8008-die-adjusted.jpg
  6. https://lh3.googleusercontent.com/-Uu2dbKJey14/WF4hl25gWwI/AAAAAAAA-qQ/VWVZhepi6IgC2nizomE_fiJkQzKR6zASQCHM/w9999/8008-block-diagram.png http://www.righto.com/2016/12/die-photos-and-analysis-of_24.html
  7. http://www.techinsights.com/about-techinsights/overview/blog/qualcomm-snapdragon-835-first-to-10-nm/ http://www.techinsights.com/about-techinsights/overview/blog/samsung-galaxy-s8-teardown/ https://www.efxkits.co.uk/types-transistor-construction-working-and-applications/
  8. https://www.researchgate.net/publication/221058794_The_state-of-the-art_in_semiconductor_reverse_engineering How RE used to be done: https://www.researchgate.net/profile/Dick_James/publication/221058794/viewer/AS:142410457817088@1410964708086/background/10.png
  9. https://arstechnica.com/gaming/2017/07/mame-devs-are-cracking-open-arcade-chips-to-get-around-drm/
  10. https://semiengineering.com/white-hat-hacking/ http://tshirtlegend.com/products/sharks-with-frickin-laser-beams-t-shirt/
  11. http://www.viralcrackle.com/index.php/2016/06/17/these-are-the-booby-traps-from-indiana-jones-we-wish-we-had-in-real-life/
  12. http://moziru.com/explore/Software%20clipart%20foundation/#gal_post_6781_software-clipart-foundation-10.jpg
  13. http://www.engr.uconn.edu/~forte/Domenic_files/v2-acmsmall-combined_draft15_final_manuscript_4.pdf
  14. https://commons.wikimedia.org/wiki/File:Yamaha_YMF262_audio_IC_decapsulated.jpg
  15. https://www.reddit.com/r/ECE/comments/wexzx/a_decapped_ic/ https://www.youtube.com/watch?v=b4mUAMyKkCE
  16. https://www.controllaser.com/lasers/laser-semiconductor-decapsulation/falit-benchtop/ https://www.controllaser.com/wp-content/uploads/2017/05/Ceramic-Decap.jpg https://www.controllaser.com/wp-content/uploads/2015/01/Layer-by-Layer-Decapsulation.jpg
  17. http://www.semitracks.com/reference-material/failure-and-yield-analysis/failure-analysis-package-level/delid-and-decap.php
  18. https://www.bunnings.com.au/3-in-one-professional-350g-air-duster_p6100311
  19. https://www.ifixit.com/Teardown/Apple+A4+Teardown/2204
  20. http://www.engr.uconn.edu/~forte/Domenic_files/v2-acmsmall-combined_draft15_final_manuscript_4.pdf http://semimd.com/chipworks/2014/10/27/intels-14nm-parts-are-finally-here/ - 14nm Intel Tri-gate transistor https://ll.mit.edu/mission/electronics/qiin/cmos-technology/3d-integration-of-CMOS.html – MIT - 3D chip – 3 lays of 3 metal, plus 2 metal connectors = 11 layers
  21. https://www.ifixit.com/Teardown/Apple+A4+Teardown/2204 http://www.alliedhightech.com/Equipment/multiprep-polishing-system-8
  22. http://www.directindustry.com/prod/jeol/product-20754-1036293.html http://hugin.sourceforge.net/tutorials/multi-row/en.shtml
  23. http://csmantech.org/OldSite/Digests/2001/PDF/10B_5_Brockett.pdf – “Biased, Backside Failure Analysis Techniques for Small Plastic Packages” - Steve Brockett and Ting Xiong
  24. https://siliconpr0n.org/wiki/doku.php?id=capture
  25. https://www.zeiss.com/semiconductor-manufacturing-technology/products-solutions/process-control-solutions/versa-3d-x-ray-microscopes.html
  26. https://www.chipworks.com/about-chipworks/overview/blog/scanning-microwave-impedance-microscopy-smim http://www.primenanoinc.com/applications-2/flash-memory-back-side-polish/
  27. http://degate.org/ - open source
  28. http://degate.org/
  29. https://www.zeiss.com/semiconductor-manufacturing-technology/products-solutions/process-control-solutions/orion-nanofab-multi-ion-fib.html
  30. http://www.imina.ch/products/Nanoprobing-SEM-Solution-Package http://www.doe.carleton.ca/~ngt/4609/index.html
  31. http://bhsmistler.weebly.com/photo-i/glitching-mini-project
  32. https://semiengineering.com/white-hat-hacking/ Three layers of a multi-layered chip analyzed by RE ready for annotation. Courtesy of Chipworks.
  33. Courtesy Zeptobars - http://zeptobars.ru/en/read/FTDI-FT232RL-real-vs-fake-supereal www.hkinventory.com
  34. http://www.techinsights.com/about-techinsights/overview/blog/apple-iphone-8-teardown/
  35. https://chipworks.secure.force.com/catalog/ProductDetails?sku=HYN-H9TKNNNBPDAR-ARNGH&viewState=DetailView https://chipworks1.force.com/DefaultStore/ccrz__ProductDetails?viewState=DetailView&cartID=&sku=MIK-X899717-003_PKG_2&&store=DefaultStore http://www.ewisetech.com/Library/ICPackage/29498/ICPackage
  36. http://semiresearch.com/ http://www.itreverse.com/it-blog/list-of-mcu-extraction-keep-update
  37. http://www.mcureverse.com/MCU/R5F212G6SDFP_mcu_reverse_1911/1911.html MCU Microcontroller Unit
  38. https://pxhere.com/en/photo/765536
  39. http://semiengineering.com/defending-against-reverse-engineering/
  40. https://www.youtube.com/watch?v=mT1FStxAVz4