Four dimensions 280 Four-Point Probe Mapping System
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Four dimensions 280 Four-Point Probe Mapping System:Used. It was working. We sell it at AS IS , Where IS condition without warranty. Buyer is responsible for actual crating, shipping, and insurance charges. Complete/Working/Functional test is optional at extra charge.
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Four dimensions 280 Four-Point Probe Mapping System
- 1. Pls email us if any questions. Subject to prior sale. Appreciate your time! sales@semistarcorp.com Location:OEM-4 1 sales@semistarcorp.com Tool ID: OEM-1 Location: USA Tool Model: Four dimensions 280 Four-Point Probe Mapping System Category: Probe Maker: Four Dimensions Wafer Size: ~8” Condition: Used. It was working. We sell it at AS IS , Where IS condition without warranty. Buyer is responsible for actual crating, shipping, and insurance charges. Complete/Working/Functional test is optional at extra charge. Price: Pls email us with your company information. Installation and training: Optional at extra cost. Payment Term: 100% against PO Valid Time: Subject to prior sale without notice. Appreciate your time. Typical Description and Configuration for your reference only The Auto Mapping System Model 280CI (or any of the 280 series) is an automatic sheet resistance testing system designed for the measurement of conductive films on silicon wafers. The system includes an Automatic Sheet Resistance Probe Model 280CI, a Four Dimensions' 586 computer with Windows version's measurement program installed, an SVGA monitor and a color printer. The Model 280CI uses the advanced Four-Point-Probe technique to make sheet resistance measurements with computer controlled stepping motors to move the wafer chuck and the four- point probe. The system features auto-ranging either from 0.001 to 800,000 Ω/ or from 0.01 to 8 x1011 Ω/ (for Model 280DI only); 1 site, 5 sites internal or external computer controlled measurements in Cartesian or polar coordinates; wafer size up to 8-inch wafers and 6 x 6 inches square wafers (under special requirement); warning of measurement errors; and optional automatic compensation for wafer edge effect and probe tip variations. The measurements can be displayed and printed out in color contour maps and three dimensional maps. Measurement data can be exported to Microsoft EXCEL (Version 7.0 or higher) or ASCII data files.The Auto Map System Model 280CI is intended for mapping the sheet resistance of ion implanted layers, thin metal films, or epi layers. Its auto-ranging capability relieves the operator from having to adjust instrument knobs to get into the correct measurement range. It also enables mapping of a plate or wafer with wide variations of sheet resistance. Once the data has been collected, it can be stored on the local computer hard disk, and/or transfer to a remote computer through LAN or over a SECS-II link. The
- 2. Pls email us if any questions. Subject to prior sale. Appreciate your time! sales@semistarcorp.com Location:OEM-1 2 sales@semistarcorp.com graphs produced by the system provide visual feedback that aids in rapidly identifying malfunctions of process equipment for ion implantation, annealing, diffusion, metalization, etc. The tool may be subject to the export control laws of the United States and other countries. Buyer will comply with the restrictions of the laws and might need to sign the “Customer Statement” before PO. The trademarks of the equipment and parts contained in this documents belonged to the Original Equipment Manufacturers.