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All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 
1 
Device Modeling Report 
Bee Technologies Inc. 
COMPONENTS: SiC Schottky Barrier Diode 
PART NUMBER: TRS20N65D 
MANUFACTURER: TOSHIBA 
REMARK: Professional Model
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 
2 
Circuit Configuration 
DIODE MODEL PARAMETERS 
PSpice 
model 
parameter 
Model description 
IS Saturation Current 
N Emission Coefficient 
RS Series Resistance 
IKF High-injection Knee Current 
CJO Zero-bias Junction Capacitance 
M Junction Grading Coefficient 
VJ Junction Potential 
ISR Recombination Current Saturation Value 
BV Reverse Breakdown Voltage(a positive value) 
IBV Reverse Breakdown Current(a positive value) 
TT Transit Time 
EG Energy-band Gap
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 
3 
R2 
100MEG 
U1 
TRS20N65D 
R1 
0.01m 
V1 
0Vdc 
0 
V _ V 1 
0V 0.5V 1.0V 1.5V 2.0V 
I(R1) 
0A 
1A 
2A 
3A 
4A 
5A 
6A 
7A 
8A 
9A 
10A 
Forward Current Characteristics 
Circuit Simulation result 
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 
4 
Comparison Graph Circuit Simulation result 
Comparison table 
IF (A) VF (V) %Error Measurement Simulation 0.5 0.955 0.956 0.10 1 1.000 1.000 0.00 2 1.070 1.068 -0.19 5 1.240 1.241 0.08 10 1.500 1.500 0.00
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 
5 
V ( R ) 
100mV 1.0V 10V 100V 1.0KV 
I(V2)/(650V/10u) 
10p 
100p 
1.0n 
0 
R 
V1 
TD = 0 
TF = 100ns 
PW = 100us 
PER = 10m 
V1 = 0 
TR = 10us 
V2 = 650 
V2 
0Vdc 
R2 
100MEG 
U1 
TRS20N65D 
Junction Capacitance Characteristic 
Circuit Simulation result 
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 
6 
Comparison Graph Circuit Simulation result 
Comparison table 
VR (V) Cj (pF) %Error Measurement Simulation 0.1 580.000 565.500 -2.50 1 505.000 513.100 1.60 10 280.000 273.400 -2.36 20 198.000 189.300 -4.39 50 119.000 113.900 -4.29 100 85.000 83.300 -2.00 200 64.600 67.500 4.49 500 57.000 58.4 2.46
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 
7 
V _ V 1 
100V 200V 300V 400V 500V 600V 
I(R1) 
1.0nA 
10nA 
100nA 
1.0uA 
10uA 
U1 
V1 TRS20N65D 
0Vdc 
R1 
100m 
0 
R2 
1000G 
Reverse Characteristic 
Circuit Simulation result 
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 
8 
Comparison Graph Circuit Simulation result 
Comparison table 
IR (nA) VR (V) %Error Measurement Simulation 10 485.000 478.500 -1.34 100 580.000 581.500 0.26 480 650.000 648.200 -0.28

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SPICE MODEL of TRS20N65D (Professional Model) in SPICE PARK

  • 1. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 1 Device Modeling Report Bee Technologies Inc. COMPONENTS: SiC Schottky Barrier Diode PART NUMBER: TRS20N65D MANUFACTURER: TOSHIBA REMARK: Professional Model
  • 2. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 2 Circuit Configuration DIODE MODEL PARAMETERS PSpice model parameter Model description IS Saturation Current N Emission Coefficient RS Series Resistance IKF High-injection Knee Current CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value BV Reverse Breakdown Voltage(a positive value) IBV Reverse Breakdown Current(a positive value) TT Transit Time EG Energy-band Gap
  • 3. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 3 R2 100MEG U1 TRS20N65D R1 0.01m V1 0Vdc 0 V _ V 1 0V 0.5V 1.0V 1.5V 2.0V I(R1) 0A 1A 2A 3A 4A 5A 6A 7A 8A 9A 10A Forward Current Characteristics Circuit Simulation result Evaluation circuit
  • 4. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 4 Comparison Graph Circuit Simulation result Comparison table IF (A) VF (V) %Error Measurement Simulation 0.5 0.955 0.956 0.10 1 1.000 1.000 0.00 2 1.070 1.068 -0.19 5 1.240 1.241 0.08 10 1.500 1.500 0.00
  • 5. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 5 V ( R ) 100mV 1.0V 10V 100V 1.0KV I(V2)/(650V/10u) 10p 100p 1.0n 0 R V1 TD = 0 TF = 100ns PW = 100us PER = 10m V1 = 0 TR = 10us V2 = 650 V2 0Vdc R2 100MEG U1 TRS20N65D Junction Capacitance Characteristic Circuit Simulation result Evaluation circuit
  • 6. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 6 Comparison Graph Circuit Simulation result Comparison table VR (V) Cj (pF) %Error Measurement Simulation 0.1 580.000 565.500 -2.50 1 505.000 513.100 1.60 10 280.000 273.400 -2.36 20 198.000 189.300 -4.39 50 119.000 113.900 -4.29 100 85.000 83.300 -2.00 200 64.600 67.500 4.49 500 57.000 58.4 2.46
  • 7. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 7 V _ V 1 100V 200V 300V 400V 500V 600V I(R1) 1.0nA 10nA 100nA 1.0uA 10uA U1 V1 TRS20N65D 0Vdc R1 100m 0 R2 1000G Reverse Characteristic Circuit Simulation result Evaluation circuit
  • 8. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 8 Comparison Graph Circuit Simulation result Comparison table IR (nA) VR (V) %Error Measurement Simulation 10 485.000 478.500 -1.34 100 580.000 581.500 0.26 480 650.000 648.200 -0.28