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nanoRVInteractive™ Nanometer Reliability

Nanometer Reliability – Current Verification Flow ,[object Object],[object Object],[object Object],[object Object]

Nanometer Era – Challenges ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]

Reliability Challenges ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]

Hot Electron Effect & Oxide Degradation ,[object Object],[object Object],[object Object],[object Object]

Electromigration & Self Heat ,[object Object],[object Object],[object Object],[object Object],[object Object]

Electromigration & Self Heat (Cont.) Short Circuit OPEN Circuit Images Source: Computer Simulation Laboratory ; Clark University

Oxide Breakdown ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]

Latchup ,[object Object],[object Object],[object Object],[object Object]

ESD – Electrostatic Charge ,[object Object],[object Object]

Voltage Drop ,[object Object],[object Object]

Soft Errors – Datum Error ,[object Object],[object Object],[object Object],[object Object]

Current verification ,[object Object],[object Object],[object Object]

Current Solutions ,[object Object],[object Object],[object Object]

Future Innovation ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]

Early Detection – Example #1

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