1998 Data Sheet from True Image, LLC

1. Luminance Quality
®
Control Subsystem
The True Image Luminance Quality Control Subsystem
is a monitor-integrated photometric device that works
in conjunction with specially prepared CRTs and digital Funnel-Mounted
Photometric
monitor electronics to allow automated, accurate, Sensor
hands-free measurement of grayscale monitor
luminance and ambient illuminance. Collector Integrator
The subsystem is a dedicated replacement for external
photometers such as those distributed by Dome, Barco,
X-Rite and others. The subsystem offers an
CRT Microprocessor
unprecedented combination of ease-of-use, accuracy
and scalability for use in image quality control
applications. Monitor manufacturers now have the
ability to develop closed-loop quality control systems to
increase monitor reliability and image fidelity. When
used in conjunction with application software such as
DOME’s TQA, monitors and their environs can be
measured and tracked, automatically and without
human intervention.
The True Image subsystem communicates with monitor
The subsystem is made up of a sensor assembly and electronics via serial ASCII or I2C signaling, with
interface control. The sensor is permanently affixed to monitor electronics providing a communications path
a specially-prepared, optical aperture on the CRT funnel to external hosts or PCs.
during monitor manufacture. Each sensor is calibrated
to match the optical properties of the CRT glass and Availability
photometric contributions of both ambient and
phosphor-generated light. The CRT calibration The Luminance Subsystem and associated
coefficients are stored in the sensor along with specific manufacturing calibration technology are available
luminance properties of the monitor to offer the under license from True Image. Individual sensor
highest level of measurement fidelity. The interface subsystems are available directly from True Image or
control includes communications routines and from Clinton Electronics Corporation. Currently,
measurement software which may be located in a CRTs from Clinton Electronics are available with the
separate microprocessor board or as part of the digital necessary rear-mounted aperture for the sensor
monitor control. subsystem.

2. ®
Luminance Quality
Control Subsystem
E N A B L E D
(continued)
Subsystem Specifications
Mechanical:
Dimensions: 3.8 x 3.8 x 2.5 cm.
Case material: 3-piece, stainless steel-filled ABS (insures EMI and arc immunity)
CRT coupling: Mechanically shielded and spring-tensioned contact to CRT optical aperture
Electrical:
Monitor interconnect: 6 conductor cable (I2C)
Supply requirements: +5 and -12 VDC
Signaling Protocol: Serial 8-bit ASCII (RS232C or I2C)
Measurement System:
Accuracy: Luminance matched to 2% standards traceable to NIST
Reproducibility: ± 1%
Linear Range/Sensitivity: 120 dB (nominally constrained to 0.01 fl – 350 fl)
Sensor Type: Silicon
Color response: Photopic
Technical features: Integration synchronized to frame rate, minimal crest factor,
extended temperature compensation, etc.
Environmental:
Operating: 20-70°C, 20–80% relative humidity (non-condensing)
Standard measurement luminance (phosphor generated),
reports include: luminance (reflected ambient),
illuminance (at CRT face),
operational age, temperature.
True Image, LLC
9999 Manchester Road, PMB 354
St. Louis, MO 63122 USA
Phone: (888) 879-6308
Fax: (888) 879-6308
Email:dgh@trueimage.com
True Image is a registered trademark of True Image, LLC. All other trademarks are the property of their respective owners.
Specifications subject to change without notice Version 1.0, November 2000