2. Comparison b/w light and electron microscopes LIGHT MICROSCOPE ELECTRON MICROSCOPE Magnification can be done upto 2000 times Resolving power is less Photons are involved Magnificationcan be done upto 2 million times Have much greater resolving power than ordinary microscope Electrons are involved
4. Reason for greater resolution and magnification of electron microscope Wavelength of an electron[de Broglie] is very much smaller than that of a light photon Wavelength of an electron = λ=h/(√2mE) Wavelength of a light photon = λ=h/E
16. TEM ELECTRON GUN ELECTROMAGNETIC LENSES VACUUM PUMPS OPENING TO INSERT SAMPLES OPERATION PANEL DISPLAY SCREEN WATER SUPPLY TO COOL THE INSTRUMENT
17. ELECTRON GUN The electron gun produces a stream of monochromatic electrons of energy 100-400keV . The extraction of electrons is of two types 1. Thermionic emission using thermal energy 2. Field emission by applying very large electric field 1010 A/m FE gun is more expensive and must be used in high vacuum conditions.
19. The beam of electrons is focused using condenser lenses [1&2] The beam is restricted by the condensor aperture Then it strikes the specimen and transmitted The transmitted portion is focused by Objective Lens into an image Intermediate and projector lenses enlarge the image Image is formed on phosphor screen Darker area – few electrons – thick region Lighter area – more electrons – thin region.
34. SEM electron gun electromagnetic lenses vacuum pumps opening to insert specimen operation panel screen for display cryo – unit for cryosem electronic instruments
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36. If a non conductive material has to be viewed , then it has to be coated by a thin layer of electrically conductive material
39. WORKING SEM produces signals in the form of secondary electrons , backscattered electrons, characteristic x-rays , light , specimen current, and transmitted electrons These signals are formed by the interaction of the electron beam with the surface of the specimen and require specialized detectors for their detection Depth of the specimen can be expressed in the image Back scattering of electrons help to detect the distribution of elements in the specimen
40. CHARACTERISTIC X-RAY SIGNAL Characteristic x-ray signals are formed when the electron beam removes an inner shell electron of the sample causing a high energy electron to fill the space and release energy Help to identify the composition of elements in sample
64. Websites for further info: www.nobelprize.org www.wikipedia.com www.pbrc.hawaii.edu/microangela www.mos.org/sln/SEM/ www.britannica.com/EBchecked/topic-art/183561/110970/Scanning-electron-microscope