SlideShare une entreprise Scribd logo
1  sur  22
Télécharger pour lire hors ligne
Using Capability Assessment During
Product Design
Mark Turner
Topics Covered in this Presentation
Design Capability.
Monte Carlo Analysis.
Monte Carlo Analysis Example
Prototype Capability.
Capability Refinement.

Objectives
Understand the benefits of capability analysis in the
design and development process.
Gain proficiency in using Crystal Ball® for conducting
Monte Carlo analysis.
Understand through practical example how capability
can be designed into a product.
Design Capability (1 of 3)
Capability assessments helps to identify design limits and potential
problems early in the design process.
All parameters have distributions in their operating point. The closer a
parameter is to the specification limits, the more opportunity there is for the
product to fail in the field due to insufficient margins or component
degradation.
Upper
Nominal
Lower
limit

operating point

limit

Collecting capability metrics is often left until the production ramp, but
there is a hug benefit in conducting an academic analysis far sooner, in
fact as soon as the paper design has been completed.
In fact capability assessments can be conducted:
At the academic design stage.
During all prototype builds.
During the production volume-ramp.
Design Capability (2 of 3)
This technique applies to both simple and complex designs equally. For
presentation simplification an extremely basic example will be presented,
an adjustable voltage regulator.
The output is Critical To Quality (CTQ), and is governed by the inputs (Xs).
Design Capability (3 of 3)
Over a large production run there will be unit-to-unit variation on all three
Xs, which will result in a variation on Y.
The portion of the distribution that falls outside the specification limits
represent failures. The portion that is close to the specification limits
represents an opportunity for long term failures due to component
degradation.

The combination of the two areas is termed the “probability of failure.”
Monte Carlo Analysis
Estimate capability through Monte Carlo analysis before the initial
prototype build. This can save a significant amount of development time as
it can identify potential tolerancing issues before the first prototypes are
built.
DEFINE
TRANSFER
FUNCTION

Mathematical derivation
Design of Experiments
Technical documentation

CONDUCT MONTE
CARLO ANALYSIS
BASED ON SELECTED
COMPONENT
TOLERANCES

Improvement
needed?

Yes

ADJUST COMPONENT
TOLERANCES AND/OR DESIGN
APPROACH AND RE-RUN
ANALYSIS

No
The prototype build can now
be started
Monte Carlo Analysis Example (1 of 14)
For simplicity this will focus on the simple voltage regulator
that has already been introduced.

Process steps:
Define the characteristic(s) of interest.
Identify the output (Y).
Identify the inputs (Xs).
Develop the transfer function.
Determine the variation of Xs.
Calculate the resultant variation of Y.
Monte Carlo Analysis Example (2 of 14)
Characteristic of interest: Output voltage, tolerance 4.9V to 5.1V.
Inputs: R1, R2, TL431 reference voltage and the Input voltage.
Transfer function:

 R1 
VO = 1 + Vref
 R 
2 


Here the input voltage can be ignored because it does not appear in the
transfer function.
This example will start off using a TL431C, which has a reference voltage
tolerance of 2.44V to 2.55V. Assume a 1% tolerance of R1 and R2.
Monte Carlo Analysis Example (3 of 14)
The Crystal Ball® software tool, which is an Excel plugin will be used for this
example, although there are numerous other software packages available
that can also be used.
Firstly data has to be input for the
Xs.
Next distributions have to be
defined. At this stage the actual
distributions may be unknown, in
which case a uniform distribution
could be used, as this will
represent a worse case scenario.
Monte Carlo Analysis Example (4 of 14)
The next stage is to define a forecast for Y.

Note that the number of decimal places
in both assumptions and forecasts is
defined by the value cell.
Monte Carlo Analysis Example (5 of 14)
Now the simulation can be run.

Select 3000 runs
and a confidence
factor of 95%.
Now start the simulation
Monte Carlo Analysis Example (6 of 14)
Crystal Ball® will now displays the frequency chart.

The first pass suggests that there is a high probability for dissatisfaction since the
output voltage is frequently outside the specification limits.
Cpk = 0.64, Zst = 1.09 and Defects Per Million Units (DPMLT) = 659,097.
The cause of variation in this circuit needs to be determined.
Monte Carlo Analysis Example (7 of 14)
Crystal Ball® provides a sensitivity chart that shows the influence that
each assumption cell has on a particular forecast cell. Sensitivity charts
provide a number of benefits:
Quick determination of
which assumptions
influence the forecast the
most, reducing the time
needed to refine
estimates.
Identification of which
assumptions influence the
forecast the least, so that
they can be addressed as
a lower priority.
Select Analyze >
Sensitivity Charts.
Select New.
Select VOUT checkbox.
Monte Carlo Analysis Example (8 of 14)
The sensitivity chart shows the contribution of each assumption.
Monte Carlo Analysis Example (9 of 14)
Revision 1: Select a better regulator: use a TL431AQ, which has a
reference voltage tolerance of 2.47V to 2.52V.
Change the tolerance in the assumption
cell and re-run the simulation.
Cpk = 1.06, Zst = 2.49 and Defects Per
Million Units (DPMLT) = 161,087 .
Monte Carlo Analysis Example (10 of 14)
Cpk = 1.74, ZST = 3.09 and Defects Per Million Units = 55,917.

This is encouraging. None of the units exceed the limits, but two
problems exist:
0.1% resistors are expensive.
Zst is still not high enough for six sigma quality level.
Monte Carlo Analysis Example (11 of 14)
Revision 3: Control the R1/R2 ratio.
This could improve the design and reduce the cost.
A resistor network would be cheaper than changing to a
TL431BC, and is also cheaper than 0.1% discrete
resistors.
To account for using a resistor network in Crystal Ball
we specify R1 as 10,000 ± 0.1%. In the transfer
function replace R2 with R2=(R1+R2A). Specify R2A as
0±2.5Ω.
Therefore the new transfer function becomes:

R1


VO =  1 +
V ref
R1 + R 2 A 

Monte Carlo Analysis Example (12 of 14)
Simulating this results in:

The capability has been improved, but only slightly.
The circuit cost has been reduced but there is little improvement to the
capability.
Neither R1 or R2 contribute to the variation, so the only way the circuit
capability can be improved is by selecting a regulator with a tighter
reference voltage.
Monte Carlo Analysis Example (13 of 14)
Revision 4: Define assumption based on real data.
The TL431 is supplied by a company who promotes its six sigma program,
so it should be of high quality, suggesting the reference voltage tolerance
may be tighter than the data sheet suggests.
50 samples are taken from stock, including samples from different date
codes, and the reference voltage measured.
From the measurements it is concluded that the mean is 2.497V with a
standard deviation of 7.7mV.
Monte Carlo Analysis Example (14 of 14)
Vref can now be modified.
The obtained data can be used to more accurately model the reference
voltage.
Crystal Ball returns a Cpk of 2.04 and a Zst of 6.11.
Even accounting for the 1.5 Z shift over the entire production run, Zlt
should not fall below 4.61, which represents a long term failure rate of 2
units per million.
Prototype Capability
Once the prototypes have been debugged and results obtained, the
capability study can be repeated to verify the earlier Monte Carlo
analysis conclusions.

This provides a revised
short term capability
metric.
However, over a long
term production run Zst
will degrade by 1.5
sigma. The ideal for the
long term Z is 4.5,
which relates to a
capability of 4.5 sigma.

It is important to repeat this using the results of other testing such as
environmental tests in order to assess how external factors such as
temperature and humidity affect the circuits capability.
Take Aways
Capability is not just a production metric, it is not just influenced by
the process but by the product design as well.
High capability equates to higher manufacturing yields.
A target for Critical To Quality parameters should be a Zst of 6.0 –
world class!
Statistically, there will be a long term 1.5 sigma shift.
Capability assessment can be started before the first prototype has
been produced.
Capability assessment should be repeated during prototype
development.
Capability studies are simple to conduct. Products should not be
released for volume manufacture without having ensured capability
targets have been achieved in advance of the volume ramp.
The manufacturing process cannot compensate for
inherent variation present in a product’s design.

Contenu connexe

Tendances

Sudarshana Hore_2015 Intern MISO
Sudarshana Hore_2015 Intern MISOSudarshana Hore_2015 Intern MISO
Sudarshana Hore_2015 Intern MISO
Sudarshana Hore
 
Enhanced Skewed Load and Broadside Power Reduction in Transition Fault Testing
Enhanced Skewed Load and Broadside Power Reduction in Transition Fault TestingEnhanced Skewed Load and Broadside Power Reduction in Transition Fault Testing
Enhanced Skewed Load and Broadside Power Reduction in Transition Fault Testing
IJERA Editor
 

Tendances (20)

Javier Garcia - Verdugo Sanchez - Six Sigma Training - W4 Reliability
Javier Garcia - Verdugo Sanchez - Six Sigma Training - W4 Reliability Javier Garcia - Verdugo Sanchez - Six Sigma Training - W4 Reliability
Javier Garcia - Verdugo Sanchez - Six Sigma Training - W4 Reliability
 
Start MPC
Start MPC Start MPC
Start MPC
 
Conducting and reporting the results of a cfd simulation
Conducting and reporting the results of a cfd simulationConducting and reporting the results of a cfd simulation
Conducting and reporting the results of a cfd simulation
 
Javier Garcia - Verdugo Sanchez - Six Sigma Training - W2 Non Normal Data
Javier Garcia - Verdugo Sanchez - Six Sigma Training - W2 Non Normal DataJavier Garcia - Verdugo Sanchez - Six Sigma Training - W2 Non Normal Data
Javier Garcia - Verdugo Sanchez - Six Sigma Training - W2 Non Normal Data
 
Virtual hybrid simualtion test - Modelling experimental errors
Virtual hybrid simualtion test - Modelling experimental errorsVirtual hybrid simualtion test - Modelling experimental errors
Virtual hybrid simualtion test - Modelling experimental errors
 
CFD Best Practices & Key Features
CFD Best Practices & Key FeaturesCFD Best Practices & Key Features
CFD Best Practices & Key Features
 
CFD & ANSYS FLUENT
CFD & ANSYS FLUENTCFD & ANSYS FLUENT
CFD & ANSYS FLUENT
 
Role of CFD in Engineering Design
Role of CFD in Engineering DesignRole of CFD in Engineering Design
Role of CFD in Engineering Design
 
Sudarshana Hore_2015 Intern MISO
Sudarshana Hore_2015 Intern MISOSudarshana Hore_2015 Intern MISO
Sudarshana Hore_2015 Intern MISO
 
Aws90 ch06 thermal
Aws90 ch06 thermalAws90 ch06 thermal
Aws90 ch06 thermal
 
Robust and efficient nonlinear structural analysis using the central differen...
Robust and efficient nonlinear structural analysis using the central differen...Robust and efficient nonlinear structural analysis using the central differen...
Robust and efficient nonlinear structural analysis using the central differen...
 
POST OPTIMALITY ANALYSIS.doc
POST OPTIMALITY ANALYSIS.docPOST OPTIMALITY ANALYSIS.doc
POST OPTIMALITY ANALYSIS.doc
 
Kalman Filter
Kalman FilterKalman Filter
Kalman Filter
 
Javier Garcia - Verdugo Sanchez - Six Sigma Training - W2 Multi - vari Studies
Javier Garcia - Verdugo Sanchez - Six Sigma Training - W2 Multi - vari StudiesJavier Garcia - Verdugo Sanchez - Six Sigma Training - W2 Multi - vari Studies
Javier Garcia - Verdugo Sanchez - Six Sigma Training - W2 Multi - vari Studies
 
Introduction to cfd
Introduction to cfdIntroduction to cfd
Introduction to cfd
 
Approaches to formal verification of ams design
Approaches to formal verification of ams designApproaches to formal verification of ams design
Approaches to formal verification of ams design
 
Process capability
Process capabilityProcess capability
Process capability
 
Fluid Mechanics in CFD Perspective
Fluid Mechanics in CFD PerspectiveFluid Mechanics in CFD Perspective
Fluid Mechanics in CFD Perspective
 
Enhanced Skewed Load and Broadside Power Reduction in Transition Fault Testing
Enhanced Skewed Load and Broadside Power Reduction in Transition Fault TestingEnhanced Skewed Load and Broadside Power Reduction in Transition Fault Testing
Enhanced Skewed Load and Broadside Power Reduction in Transition Fault Testing
 
Application Fault Tolerance (AFT)
Application Fault Tolerance (AFT)Application Fault Tolerance (AFT)
Application Fault Tolerance (AFT)
 

En vedette

Meet minitab tutorial
Meet minitab tutorialMeet minitab tutorial
Meet minitab tutorial
shanmu31
 
Diseño y analisis de experimentos montgomery
Diseño y analisis de experimentos montgomeryDiseño y analisis de experimentos montgomery
Diseño y analisis de experimentos montgomery
MARTIN R. V.
 
Probabilidad y estadistica 2
Probabilidad y estadistica 2Probabilidad y estadistica 2
Probabilidad y estadistica 2
Navarro76
 

En vedette (11)

Seminário-O Passe-Marcelo do N.Rodrigues-CEM
Seminário-O Passe-Marcelo do N.Rodrigues-CEMSeminário-O Passe-Marcelo do N.Rodrigues-CEM
Seminário-O Passe-Marcelo do N.Rodrigues-CEM
 
2003 Deming Institute PowerPoint Slides
2003 Deming Institute PowerPoint Slides2003 Deming Institute PowerPoint Slides
2003 Deming Institute PowerPoint Slides
 
Evangeliza - Passe
Evangeliza - PasseEvangeliza - Passe
Evangeliza - Passe
 
Advanced DOE with Minitab (presentation in Costa Rica)
Advanced DOE with Minitab (presentation in Costa Rica)Advanced DOE with Minitab (presentation in Costa Rica)
Advanced DOE with Minitab (presentation in Costa Rica)
 
Meet minitab tutorial
Meet minitab tutorialMeet minitab tutorial
Meet minitab tutorial
 
Diseño y analisis de experimentos montgomery
Diseño y analisis de experimentos montgomeryDiseño y analisis de experimentos montgomery
Diseño y analisis de experimentos montgomery
 
Design and Analysis of Experiments
Design and Analysis of ExperimentsDesign and Analysis of Experiments
Design and Analysis of Experiments
 
Lean vs-six-sigma
Lean vs-six-sigmaLean vs-six-sigma
Lean vs-six-sigma
 
Curso do Passe Espírita - Associação Espírita Missionários da Luz - 2012 - Fe...
Curso do Passe Espírita - Associação Espírita Missionários da Luz - 2012 - Fe...Curso do Passe Espírita - Associação Espírita Missionários da Luz - 2012 - Fe...
Curso do Passe Espírita - Associação Espírita Missionários da Luz - 2012 - Fe...
 
Probabilidad y Estadistica Para Ingenieros 6ta Edicion - Ronald E. Walpole ...
Probabilidad y Estadistica Para Ingenieros   6ta Edicion - Ronald E. Walpole ...Probabilidad y Estadistica Para Ingenieros   6ta Edicion - Ronald E. Walpole ...
Probabilidad y Estadistica Para Ingenieros 6ta Edicion - Ronald E. Walpole ...
 
Probabilidad y estadistica 2
Probabilidad y estadistica 2Probabilidad y estadistica 2
Probabilidad y estadistica 2
 

Similaire à Using capability assessment during product design

Cpk guide 0211_tech1
Cpk guide 0211_tech1Cpk guide 0211_tech1
Cpk guide 0211_tech1
Piyush Bose
 
Chap 9 A Process Capability & Spc Hk
Chap 9 A Process Capability & Spc HkChap 9 A Process Capability & Spc Hk
Chap 9 A Process Capability & Spc Hk
ajithsrc
 
SolAero Tech Intern_Project Overview
SolAero Tech Intern_Project OverviewSolAero Tech Intern_Project Overview
SolAero Tech Intern_Project Overview
Eddie Benitez-Jones
 
LVTS - Image Resolution Monitor for Litho-Metrology
LVTS - Image Resolution Monitor for Litho-MetrologyLVTS - Image Resolution Monitor for Litho-Metrology
LVTS - Image Resolution Monitor for Litho-Metrology
Vladislav Kaplan
 
GaN-reliability-whitepaper-TI-Sandeep-Bahl-2015
GaN-reliability-whitepaper-TI-Sandeep-Bahl-2015GaN-reliability-whitepaper-TI-Sandeep-Bahl-2015
GaN-reliability-whitepaper-TI-Sandeep-Bahl-2015
Sandeep Bahl
 

Similaire à Using capability assessment during product design (20)

Applied Reliability Symposium 2009 M Turner
Applied Reliability Symposium 2009 M TurnerApplied Reliability Symposium 2009 M Turner
Applied Reliability Symposium 2009 M Turner
 
Cpk guide 0211_tech1
Cpk guide 0211_tech1Cpk guide 0211_tech1
Cpk guide 0211_tech1
 
Facility Location
Facility Location Facility Location
Facility Location
 
Javier Garcia - Verdugo Sanchez - Six Sigma Training - W4 Monte Carlo Simulat...
Javier Garcia - Verdugo Sanchez - Six Sigma Training - W4 Monte Carlo Simulat...Javier Garcia - Verdugo Sanchez - Six Sigma Training - W4 Monte Carlo Simulat...
Javier Garcia - Verdugo Sanchez - Six Sigma Training - W4 Monte Carlo Simulat...
 
Chap 9 A Process Capability & Spc Hk
Chap 9 A Process Capability & Spc HkChap 9 A Process Capability & Spc Hk
Chap 9 A Process Capability & Spc Hk
 
Fault Modeling of Combinational and Sequential Circuits at Register Transfer ...
Fault Modeling of Combinational and Sequential Circuits at Register Transfer ...Fault Modeling of Combinational and Sequential Circuits at Register Transfer ...
Fault Modeling of Combinational and Sequential Circuits at Register Transfer ...
 
FAULT MODELING OF COMBINATIONAL AND SEQUENTIAL CIRCUITS AT REGISTER TRANSFER ...
FAULT MODELING OF COMBINATIONAL AND SEQUENTIAL CIRCUITS AT REGISTER TRANSFER ...FAULT MODELING OF COMBINATIONAL AND SEQUENTIAL CIRCUITS AT REGISTER TRANSFER ...
FAULT MODELING OF COMBINATIONAL AND SEQUENTIAL CIRCUITS AT REGISTER TRANSFER ...
 
SolAero Tech Intern_Project Overview
SolAero Tech Intern_Project OverviewSolAero Tech Intern_Project Overview
SolAero Tech Intern_Project Overview
 
Fault Modeling for Verilog Register Transfer Level
Fault Modeling for Verilog Register Transfer LevelFault Modeling for Verilog Register Transfer Level
Fault Modeling for Verilog Register Transfer Level
 
SAF ANALYSES OF ANALOG AND MIXED SIGNAL VLSI CIRCUIT: DIGITAL TO ANALOG CONVE...
SAF ANALYSES OF ANALOG AND MIXED SIGNAL VLSI CIRCUIT: DIGITAL TO ANALOG CONVE...SAF ANALYSES OF ANALOG AND MIXED SIGNAL VLSI CIRCUIT: DIGITAL TO ANALOG CONVE...
SAF ANALYSES OF ANALOG AND MIXED SIGNAL VLSI CIRCUIT: DIGITAL TO ANALOG CONVE...
 
IRJET- Metastability Mitigation & Error Masking of High Speed Flip-Flop
IRJET- Metastability Mitigation & Error Masking of High Speed Flip-FlopIRJET- Metastability Mitigation & Error Masking of High Speed Flip-Flop
IRJET- Metastability Mitigation & Error Masking of High Speed Flip-Flop
 
digit_twin.pptx
digit_twin.pptxdigit_twin.pptx
digit_twin.pptx
 
A survey of scan-capture power reduction techniques
A survey of scan-capture power reduction techniquesA survey of scan-capture power reduction techniques
A survey of scan-capture power reduction techniques
 
MULTIPLE TESTS ON TRANSFORMER WITH THE HELP OF MATLAB SIMULINK
MULTIPLE TESTS ON TRANSFORMER WITH THE HELP OF MATLAB SIMULINKMULTIPLE TESTS ON TRANSFORMER WITH THE HELP OF MATLAB SIMULINK
MULTIPLE TESTS ON TRANSFORMER WITH THE HELP OF MATLAB SIMULINK
 
LVTS - Image Resolution Monitor for Litho-Metrology
LVTS - Image Resolution Monitor for Litho-MetrologyLVTS - Image Resolution Monitor for Litho-Metrology
LVTS - Image Resolution Monitor for Litho-Metrology
 
Kaizenreport
KaizenreportKaizenreport
Kaizenreport
 
digit_twin.pptx
digit_twin.pptxdigit_twin.pptx
digit_twin.pptx
 
5 1 voss_panasonic_sandia_epri_160509_3
5 1 voss_panasonic_sandia_epri_160509_35 1 voss_panasonic_sandia_epri_160509_3
5 1 voss_panasonic_sandia_epri_160509_3
 
GaN-reliability-whitepaper-TI-Sandeep-Bahl-2015
GaN-reliability-whitepaper-TI-Sandeep-Bahl-2015GaN-reliability-whitepaper-TI-Sandeep-Bahl-2015
GaN-reliability-whitepaper-TI-Sandeep-Bahl-2015
 
Matopt
MatoptMatopt
Matopt
 

Dernier

Dernier (20)

Polkadot JAM Slides - Token2049 - By Dr. Gavin Wood
Polkadot JAM Slides - Token2049 - By Dr. Gavin WoodPolkadot JAM Slides - Token2049 - By Dr. Gavin Wood
Polkadot JAM Slides - Token2049 - By Dr. Gavin Wood
 
AWS Community Day CPH - Three problems of Terraform
AWS Community Day CPH - Three problems of TerraformAWS Community Day CPH - Three problems of Terraform
AWS Community Day CPH - Three problems of Terraform
 
EMPOWERMENT TECHNOLOGY GRADE 11 QUARTER 2 REVIEWER
EMPOWERMENT TECHNOLOGY GRADE 11 QUARTER 2 REVIEWEREMPOWERMENT TECHNOLOGY GRADE 11 QUARTER 2 REVIEWER
EMPOWERMENT TECHNOLOGY GRADE 11 QUARTER 2 REVIEWER
 
Mcleodganj Call Girls 🥰 8617370543 Service Offer VIP Hot Model
Mcleodganj Call Girls 🥰 8617370543 Service Offer VIP Hot ModelMcleodganj Call Girls 🥰 8617370543 Service Offer VIP Hot Model
Mcleodganj Call Girls 🥰 8617370543 Service Offer VIP Hot Model
 
TrustArc Webinar - Unlock the Power of AI-Driven Data Discovery
TrustArc Webinar - Unlock the Power of AI-Driven Data DiscoveryTrustArc Webinar - Unlock the Power of AI-Driven Data Discovery
TrustArc Webinar - Unlock the Power of AI-Driven Data Discovery
 
presentation ICT roal in 21st century education
presentation ICT roal in 21st century educationpresentation ICT roal in 21st century education
presentation ICT roal in 21st century education
 
AI in Action: Real World Use Cases by Anitaraj
AI in Action: Real World Use Cases by AnitarajAI in Action: Real World Use Cases by Anitaraj
AI in Action: Real World Use Cases by Anitaraj
 
Apidays New York 2024 - Passkeys: Developing APIs to enable passwordless auth...
Apidays New York 2024 - Passkeys: Developing APIs to enable passwordless auth...Apidays New York 2024 - Passkeys: Developing APIs to enable passwordless auth...
Apidays New York 2024 - Passkeys: Developing APIs to enable passwordless auth...
 
How to Troubleshoot Apps for the Modern Connected Worker
How to Troubleshoot Apps for the Modern Connected WorkerHow to Troubleshoot Apps for the Modern Connected Worker
How to Troubleshoot Apps for the Modern Connected Worker
 
MINDCTI Revenue Release Quarter One 2024
MINDCTI Revenue Release Quarter One 2024MINDCTI Revenue Release Quarter One 2024
MINDCTI Revenue Release Quarter One 2024
 
Rising Above_ Dubai Floods and the Fortitude of Dubai International Airport.pdf
Rising Above_ Dubai Floods and the Fortitude of Dubai International Airport.pdfRising Above_ Dubai Floods and the Fortitude of Dubai International Airport.pdf
Rising Above_ Dubai Floods and the Fortitude of Dubai International Airport.pdf
 
Corporate and higher education May webinar.pptx
Corporate and higher education May webinar.pptxCorporate and higher education May webinar.pptx
Corporate and higher education May webinar.pptx
 
Six Myths about Ontologies: The Basics of Formal Ontology
Six Myths about Ontologies: The Basics of Formal OntologySix Myths about Ontologies: The Basics of Formal Ontology
Six Myths about Ontologies: The Basics of Formal Ontology
 
Repurposing LNG terminals for Hydrogen Ammonia: Feasibility and Cost Saving
Repurposing LNG terminals for Hydrogen Ammonia: Feasibility and Cost SavingRepurposing LNG terminals for Hydrogen Ammonia: Feasibility and Cost Saving
Repurposing LNG terminals for Hydrogen Ammonia: Feasibility and Cost Saving
 
Navigating the Deluge_ Dubai Floods and the Resilience of Dubai International...
Navigating the Deluge_ Dubai Floods and the Resilience of Dubai International...Navigating the Deluge_ Dubai Floods and the Resilience of Dubai International...
Navigating the Deluge_ Dubai Floods and the Resilience of Dubai International...
 
Spring Boot vs Quarkus the ultimate battle - DevoxxUK
Spring Boot vs Quarkus the ultimate battle - DevoxxUKSpring Boot vs Quarkus the ultimate battle - DevoxxUK
Spring Boot vs Quarkus the ultimate battle - DevoxxUK
 
Apidays New York 2024 - Scaling API-first by Ian Reasor and Radu Cotescu, Adobe
Apidays New York 2024 - Scaling API-first by Ian Reasor and Radu Cotescu, AdobeApidays New York 2024 - Scaling API-first by Ian Reasor and Radu Cotescu, Adobe
Apidays New York 2024 - Scaling API-first by Ian Reasor and Radu Cotescu, Adobe
 
Introduction to Multilingual Retrieval Augmented Generation (RAG)
Introduction to Multilingual Retrieval Augmented Generation (RAG)Introduction to Multilingual Retrieval Augmented Generation (RAG)
Introduction to Multilingual Retrieval Augmented Generation (RAG)
 
Vector Search -An Introduction in Oracle Database 23ai.pptx
Vector Search -An Introduction in Oracle Database 23ai.pptxVector Search -An Introduction in Oracle Database 23ai.pptx
Vector Search -An Introduction in Oracle Database 23ai.pptx
 
Understanding the FAA Part 107 License ..
Understanding the FAA Part 107 License ..Understanding the FAA Part 107 License ..
Understanding the FAA Part 107 License ..
 

Using capability assessment during product design

  • 1. Using Capability Assessment During Product Design Mark Turner
  • 2. Topics Covered in this Presentation Design Capability. Monte Carlo Analysis. Monte Carlo Analysis Example Prototype Capability. Capability Refinement. Objectives Understand the benefits of capability analysis in the design and development process. Gain proficiency in using Crystal Ball® for conducting Monte Carlo analysis. Understand through practical example how capability can be designed into a product.
  • 3. Design Capability (1 of 3) Capability assessments helps to identify design limits and potential problems early in the design process. All parameters have distributions in their operating point. The closer a parameter is to the specification limits, the more opportunity there is for the product to fail in the field due to insufficient margins or component degradation. Upper Nominal Lower limit operating point limit Collecting capability metrics is often left until the production ramp, but there is a hug benefit in conducting an academic analysis far sooner, in fact as soon as the paper design has been completed. In fact capability assessments can be conducted: At the academic design stage. During all prototype builds. During the production volume-ramp.
  • 4. Design Capability (2 of 3) This technique applies to both simple and complex designs equally. For presentation simplification an extremely basic example will be presented, an adjustable voltage regulator. The output is Critical To Quality (CTQ), and is governed by the inputs (Xs).
  • 5. Design Capability (3 of 3) Over a large production run there will be unit-to-unit variation on all three Xs, which will result in a variation on Y. The portion of the distribution that falls outside the specification limits represent failures. The portion that is close to the specification limits represents an opportunity for long term failures due to component degradation. The combination of the two areas is termed the “probability of failure.”
  • 6. Monte Carlo Analysis Estimate capability through Monte Carlo analysis before the initial prototype build. This can save a significant amount of development time as it can identify potential tolerancing issues before the first prototypes are built. DEFINE TRANSFER FUNCTION Mathematical derivation Design of Experiments Technical documentation CONDUCT MONTE CARLO ANALYSIS BASED ON SELECTED COMPONENT TOLERANCES Improvement needed? Yes ADJUST COMPONENT TOLERANCES AND/OR DESIGN APPROACH AND RE-RUN ANALYSIS No The prototype build can now be started
  • 7. Monte Carlo Analysis Example (1 of 14) For simplicity this will focus on the simple voltage regulator that has already been introduced. Process steps: Define the characteristic(s) of interest. Identify the output (Y). Identify the inputs (Xs). Develop the transfer function. Determine the variation of Xs. Calculate the resultant variation of Y.
  • 8. Monte Carlo Analysis Example (2 of 14) Characteristic of interest: Output voltage, tolerance 4.9V to 5.1V. Inputs: R1, R2, TL431 reference voltage and the Input voltage. Transfer function:  R1  VO = 1 + Vref  R  2   Here the input voltage can be ignored because it does not appear in the transfer function. This example will start off using a TL431C, which has a reference voltage tolerance of 2.44V to 2.55V. Assume a 1% tolerance of R1 and R2.
  • 9. Monte Carlo Analysis Example (3 of 14) The Crystal Ball® software tool, which is an Excel plugin will be used for this example, although there are numerous other software packages available that can also be used. Firstly data has to be input for the Xs. Next distributions have to be defined. At this stage the actual distributions may be unknown, in which case a uniform distribution could be used, as this will represent a worse case scenario.
  • 10. Monte Carlo Analysis Example (4 of 14) The next stage is to define a forecast for Y. Note that the number of decimal places in both assumptions and forecasts is defined by the value cell.
  • 11. Monte Carlo Analysis Example (5 of 14) Now the simulation can be run. Select 3000 runs and a confidence factor of 95%. Now start the simulation
  • 12. Monte Carlo Analysis Example (6 of 14) Crystal Ball® will now displays the frequency chart. The first pass suggests that there is a high probability for dissatisfaction since the output voltage is frequently outside the specification limits. Cpk = 0.64, Zst = 1.09 and Defects Per Million Units (DPMLT) = 659,097. The cause of variation in this circuit needs to be determined.
  • 13. Monte Carlo Analysis Example (7 of 14) Crystal Ball® provides a sensitivity chart that shows the influence that each assumption cell has on a particular forecast cell. Sensitivity charts provide a number of benefits: Quick determination of which assumptions influence the forecast the most, reducing the time needed to refine estimates. Identification of which assumptions influence the forecast the least, so that they can be addressed as a lower priority. Select Analyze > Sensitivity Charts. Select New. Select VOUT checkbox.
  • 14. Monte Carlo Analysis Example (8 of 14) The sensitivity chart shows the contribution of each assumption.
  • 15. Monte Carlo Analysis Example (9 of 14) Revision 1: Select a better regulator: use a TL431AQ, which has a reference voltage tolerance of 2.47V to 2.52V. Change the tolerance in the assumption cell and re-run the simulation. Cpk = 1.06, Zst = 2.49 and Defects Per Million Units (DPMLT) = 161,087 .
  • 16. Monte Carlo Analysis Example (10 of 14) Cpk = 1.74, ZST = 3.09 and Defects Per Million Units = 55,917. This is encouraging. None of the units exceed the limits, but two problems exist: 0.1% resistors are expensive. Zst is still not high enough for six sigma quality level.
  • 17. Monte Carlo Analysis Example (11 of 14) Revision 3: Control the R1/R2 ratio. This could improve the design and reduce the cost. A resistor network would be cheaper than changing to a TL431BC, and is also cheaper than 0.1% discrete resistors. To account for using a resistor network in Crystal Ball we specify R1 as 10,000 ± 0.1%. In the transfer function replace R2 with R2=(R1+R2A). Specify R2A as 0±2.5Ω. Therefore the new transfer function becomes: R1   VO =  1 + V ref R1 + R 2 A  
  • 18. Monte Carlo Analysis Example (12 of 14) Simulating this results in: The capability has been improved, but only slightly. The circuit cost has been reduced but there is little improvement to the capability. Neither R1 or R2 contribute to the variation, so the only way the circuit capability can be improved is by selecting a regulator with a tighter reference voltage.
  • 19. Monte Carlo Analysis Example (13 of 14) Revision 4: Define assumption based on real data. The TL431 is supplied by a company who promotes its six sigma program, so it should be of high quality, suggesting the reference voltage tolerance may be tighter than the data sheet suggests. 50 samples are taken from stock, including samples from different date codes, and the reference voltage measured. From the measurements it is concluded that the mean is 2.497V with a standard deviation of 7.7mV.
  • 20. Monte Carlo Analysis Example (14 of 14) Vref can now be modified. The obtained data can be used to more accurately model the reference voltage. Crystal Ball returns a Cpk of 2.04 and a Zst of 6.11. Even accounting for the 1.5 Z shift over the entire production run, Zlt should not fall below 4.61, which represents a long term failure rate of 2 units per million.
  • 21. Prototype Capability Once the prototypes have been debugged and results obtained, the capability study can be repeated to verify the earlier Monte Carlo analysis conclusions. This provides a revised short term capability metric. However, over a long term production run Zst will degrade by 1.5 sigma. The ideal for the long term Z is 4.5, which relates to a capability of 4.5 sigma. It is important to repeat this using the results of other testing such as environmental tests in order to assess how external factors such as temperature and humidity affect the circuits capability.
  • 22. Take Aways Capability is not just a production metric, it is not just influenced by the process but by the product design as well. High capability equates to higher manufacturing yields. A target for Critical To Quality parameters should be a Zst of 6.0 – world class! Statistically, there will be a long term 1.5 sigma shift. Capability assessment can be started before the first prototype has been produced. Capability assessment should be repeated during prototype development. Capability studies are simple to conduct. Products should not be released for volume manufacture without having ensured capability targets have been achieved in advance of the volume ramp. The manufacturing process cannot compensate for inherent variation present in a product’s design.