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We Provide You Confidence in Your Product ReliabilityTM
   Ops A La Carte / (408) 654-0499 / askops@opsalacarte.com / www.opsalacarte.com
Statistical
               Process
               Control
Greg Swartz // (650) 274-6001 // gregs@opsalacarte.com

         Ops A La Carte LLC // www.opsalacarte.com
The following presentation materials are
    copyright protected property of
         Ops A La Carte LLC.
These materials may not be distributed
      outside of your company.
Presenter’s Biographical Sketch – Greg Swartz

◈Greg Swartz has worked successfully for over twenty years in the fields
 of statistics and process improvement, as a Consultant and Trainer.
 His consulting experience includes working with a number of Biotech,
 high tech companies, Aerospace, and Defense. His expertise includes
 analysis of technical data, a hands-on approach towards design of
 experiments, and Failure Analysis, e.g. with Ops A La Carte for
 Semiconductor Equipment. Greg was a Sr. Quality Program Manager
 at Sun Microsystems for 6 years.

◈Mr. Swartz has worked in the fields of Applied Data Analysis (ADA)
 techniques, yield improvement, quality assessments, and reliability
 studies. Additionally, Greg has a background in software reliability,
 CMM, and Software Product Life Cycle (SPLC).




                            © 2008 Ops A La Carte
Metrics and
       Statistical Process Control

                     Level II for Operations,
                    Engineering and Research




                         Developed and Presented by:

                              Greg Swartz, CQE
                               Ops A La Carte

                               April 11, 2008




Gregory Swartz, © 2008          (650) 274-6001         Page 1
Metrics and
            Statistical Process Control

                         Learning Objectives

Overview:
This Level II Statistical Process Control (SPC) course presents
a number of valuable tools to assist you in evaluating process
variation and to make sound decisions based on your data.
Topics covered included the following:

   ♦ Pareto Charts and Check sheets for Attribute and Visual Data
   ♦ Histograms for understanding variation in measurable data
   ♦ Variables and Attribute Control Charts including p Charts for
     varying sample sizes
   ♦ Process Capability (Cp & Cpk) and Sample Size Determination
   ♦ Interpretation and Corrective Action including
     Out-Of-Control guidelines
   ♦ Correlation and Regression Studies with
     guard-banding techniques.

Learning Objectives:
Upon completion of this Metrics/SPC Level II course,
participants will be able to do the following:

   ♦ Construct p, NP, and C Charts for attribute process control
   ♦ Be able to construct Ave. and Range control charts for
     variables data
   ♦ Construct 90 and 95% Confidence Intervals for process data.
   ♦ Distinguish between Process Control and Process Capability.
   ♦ Perform a Correlation Studies and interpret results.




Gregory Swartz, © 2008       (650) 274-6001                       Page 2
Metrics/Statistical Process Control
                         Level II Content Outline
Chapter 1:         INTRODUCTION TO SPC
                   • Benefits of Metrics and SPC
                   • SPC Tools — Overview
                   • SPC Implementation Strategy
Chapter 2:         PROBLEM SOLVING TOOLS
                   • Cause and Effect Diagrams (Fishbone)
                   • Check Sheets
                   • Pareto Analysis using Excel with ExcelTM
Chapter 3:         DESCRIPTIVE STATISTICS
                   • Measures of Central Tendency and Variation
                   • Histograms and Specification Limits
                   • SPC vs. Process Capability
Chapter 4:         PROCESS CAPABILITY AND YIELD STUDIES
                   • "Central Limit Theorem"
                   • Cp and Cpk Indices — A practical approach
                   • “t” Test and Confidence Intervals in Excel
                   * Sample Size Determination
Chapter5:          PROCESS CONTROL TOOLS FOR VARIABLES DATA
                   • X Bar & R Chart
                   • X Bar & S Charts (n>10) (for reference)
                   • Short Run Charting Techniques
Chapter 6:         PROCESS CONTROL TOOLS FOR ATTRIBUTE DATA
                   • NP Charts and • P Charts (fraction defective)
                   • C Charts
Chapter 7:         INTERPRETATION AND CORRECTIVE ACTION
                   • Interpreting Trends and Shifts in Data
                   • Planning Corrective Action
                   • Implementing Continuous Process Improvement
Chapter 8:         CORRELATION AND REGRESSION

Appendix           Terms and Definitions
                   Formula Summary




Gregory Swartz, © 2008            (650) 274-6001                     Page 3
Metrics and Statistical Process Control

Chapter One:                  Introduction to SPC

   • SPC is a tool that uses analytical techniques to:

     Investigating             Monitoring               Improving




   • SPC measures quality during the production
     process, using statistics to determine and
     maintain a state of process control in your area.


   • SPC ensures that quality is built into the product
     at each step, as shown in the overview process
     flow of Genotyping.



                     Sample     Combine        Auto-
Receiving (VI)         QC       Assays         caller   Bioinformatics




Gregory Swartz, © 2008        (650) 274-6001                        Page 1
Metrics and Statistical Process Control




Key Features of Implementing
Metrics and SPC

   • Baseline Data

   1st thing to do: catching abnormal variations
    where special causes to problems can be
    identified and corrected!

   • SPC responds to trends by making changes
     before reaching an out of control condition.
     Emphasis is on prevention, versus after the fact.

   • "Corrective action guidelines" are determined
     statistically, and are commonly known as
     Control Limits.

   • Corrective Action Planning can be performed by
     cross-functional metric improvement teams.




Gregory Swartz, © 2008   (650) 274-6001                    Page 2
Metrics and Statistical Process Control




Benefits of Measuring your
process with SPC

   Improved customer
   satisfaction, both
   internal and external


                                                             %
                                                      %
                                          %       %
   Increased product yield
   Failure rate = 1-yield                     %


   Reduced operating costs


   Improved product flow


   Increased profits




Gregory Swartz, © 2008   (650) 274-6001                    Page 3
Metrics and Statistical Process Control




             Value Add of Statistical
                 Process Control

       Process decisions are made based on
      ”Fact versus Opinion.”

      Increases knowledge base regarding analysis of
      your process data, in-process inspection, and
      improves your out-going quality!

      Improves long-term relationships between your
      company, suppliers, and your customers.

      Targets critical process, for product optimization
      and Capability, for example, in meeting Six
      Sigma criteria.

      Allows sound decision making, using empirical
      methods, versus opinions, or whims.




Gregory Swartz, © 2008   (650) 274-6001                    Page 4
Metrics and Statistical Process Control




            Types of Data – Flowchart


            Raw          Fabri-
                                          Assembly        Test
          Materials      cation




                               TYPES OF DATA




                            Variable          Attribute




                                    Process
                                  Improvement
                                      with
                                       SPC!




Gregory Swartz, © 2008       (650) 274-6001                      Page 5
Metrics and Statistical Process Control




            SPC Implementation - Overview

               Initially, Flowchart
                   Your Process




                                                 Variable Data i.e. measurable -
             Identify Critical                   costs, cycle time, or response time
             Product or Service                                or
             Process Parameters                  Attribute Data e.g. categorical -
                                                 error types, PPM, defects by type

                                                   Independent
                                                    Causes
                                                                        Dependent
                                                                        Effect
               Use Cause & Effect
             Diagrams to Brainstorm
               all Cause Variables




              Use Pareto Charts
                 to Prioritize             $
             Key Problem Areas

                                                 Key Problem Areas



                    Continue
                   To Page 7




Gregory Swartz, © 2008          (650) 274-6001                          Page 6
Metrics and Statistical Process Control


   Continued             Tools of Quality - (Con’t.)
     from
    Page 6




       Do you
                         2
    have one or               Build a Scatter        Y
     two variables                 Diagram
          ?

     1
                                                                    X
                               Snapshot
                                                 Y
     Do you
                         No
  wish to display             Construct a
    your data                 Histogram          #
    over time
           ?

    Yes                                                  Measurement Scale             X


                                                                                 UCL
Plot data over time
on the chart, then                                                               Ave.
calculate controls.
                                                                                 LCL

                                                          Time / Date

Assign causes to
out- of - control points                                 Monitor Charts for
with corrective action                                     Improvement

Gregory Swartz, © 2008          (650) 274-6001                                Page 7
Metrics and Statistical Process Control




Symbols Summary
      Σ            To Sum

      X            Individual Score

      X            Mean, or average

      R            Range (max-min)

      σ or S       Standard Deviation

      UCL          Upper Control Limit

      LCL          Lower Control Limit

      K            # of groups

      n            Subgroup sample size

      p            Proportion Defective

      NP           Number of Defects per sample

      C            Number of defects per unit or area

      Cp           Basic Capability Index

      Cpk          Capability Index (including process shifts)

      t            Used to determine yield with n < 30

      Z            Used to determine yield with large samples




Gregory Swartz, © 2008           (650) 274-6001                   Page 8
Metrics and Statistical Process Control


SPC Tools Overview
   Continuous Quality
      Improvement



                        Need for                     Feedback
                          Data                     based on data




                        Type of
                          Data


    Attribute                          Variables
     Data                                Data



     Check
                                       Histogram           Process                Yield
     Sheets                                               Capability          Improvement



      Pie
     Charts                              Two              Yes      Scatter-
                                       Variables                    grams


    Pareto
    Charts                                No
                                                                   Correlation

                                          Run
                                         Chart
     Attribute
      Charts

                                        Control
                                         Chart




Gregory Swartz, © 2008             (650) 274-6001                                    Page 9
Metrics and Statistical Process Control



Chapter Two:

Problem Solving Techniques

      •    Process Flow Analysis

      •    Cause and Effect Diagrams (Fishbone)

      •    Check Sheets

      •    Pareto Analysis with Excel Example




Gregory Swartz, © 2008    (650) 274-6001                   Page 10
Metrics and Statistical Process Control


Problem Solving Tools Flow Chart


                             Start


                        Big Picture
                     Detailed Flowchart



                         Check Sheet


                            Pareto
                            Analysis




                           Determine          NO        Fishbone
                          root cause??                  Diagram



                                     YES

                         Take Corrective
                              Action




      pp. 9-13




Gregory Swartz, © 2008                 (650) 274-6001                 Page 11
Metrics and Statistical Process Control

                    Process Flow Chart Exercise:

PROCESS FLOW STEPS                   A/V         TYPES OF DATA




Gregory Swartz, © 2008      (650) 274-6001                   Page 12
Metrics and Statistical Process Control


Cause and Effect Diagrams
(Ishikawa Diagram)

      • Cause and Effect Diagrams can be used
        for any service or product problem

      • Serve as the basis for group discussion
        and brainstorming

      • Effect could be a quality, yield or
        productivity problem

      • Provide guidance for concrete
        corrective action



         People           Equipment       Methods

                                                          Effect
                                                        (Problem)
                     Causes (Independent Variables)




        Materials        Measurement    Environment




      24-29

Gregory Swartz, © 2008           (650) 274-6001                     Page 13
Metrics and Statistical Process Control


How to Create a Cause and
Effect Diagram
      1.    Identify the problem (effect).

      2.    Brainstorm several causes — include all
            ideas generated without evaluating causes.

      3.    Identify and circle a branch for corrective
            action.




                         CAUSES                      EFFECT




      pg. 24




Gregory Swartz, © 2008        (650) 274-6001                  Page 14
Metrics and Statistical Process Control




                Process Improvement Flow
           “Plan, Do, Check, Act” PDCA Method.



                Ca uses                 Effect




                       Ne ed                     No     Take
                     More Data?                       Corrective
                                                       Action

                          Yes


                   Ca use       Tally




Gregory Swartz, © 2008              (650) 274-6001                  Page 15
Metrics and Statistical Process Control


Pareto Analysis (The 80-20 effect)
    Errors in a process are categorical (attribute) in
    nature where defects can easily be tallied with a
    check sheet. Pareto charts display the 80-20
    effect.

    Key Advantages:

           • When you identify the “vital few” you
             improve your ability to identify the
             root causes to the majority of the
             problems.

           • By solving the largest problem decreases
             the overall percent defective product.

           • Cost benefit of product can be
             determined with the assistance of
             Pareto Analysis.

           • Solving major problems often
             reduces or eliminates the minor
             problems.



           17-23




Gregory Swartz, © 2008   (650) 274-6001                   Page 16
Metrics and Statistical Process Control



Procedure for Using Check Sheets for Pareto Charts

      1.    Rank causes by frequency of occurrence.

      2.    Calculate both percentage and Cum %.

      3.    Draw Pareto Diagram.

      4.    Concentrate corrective action on the "vital few."




                        Pareto Analysis Worksheet

  Causes              Tally Mark                     Freq.    Rank      %

  Smear          II                                    2

  Color          IIII I                                6

                 IIII IIII IIII IIII IIII
 Contaminatio    IIII I                               36

                IIII IIII IIII IIII
  M isc.                                              24
                IIII

  Misc.2         IIII
                                                       4
                IIII IIII IIII IIII IIII IIII
                IIII IIII IIII IIII IIII IIII         78
  empty well    IIII III
  Totals                                             150




Gregory Swartz, © 2008                      (650) 274-6001                   Page 17
Metrics and Statistical Process Control


Procedure for Creating a Pareto Diagram in ExcelTM
      1. Sort your cause categories so they are ranked (highest to
         lowest).
      2. Create an ordered Check Sheet as in page 14.
      3. Tabulate both % and Cum. % as in the table below:


             R a n k in g   C auses          Count           F re q . (% ) C u m . (% )
                    1       S c r a tc h e s            77       5 1 .3 0 %    5 1 .3 0 %
                    2       M is a lig n e d            36       2 4 .0 0 %    7 5 .3 0 %
                    3       M is c .                    25
                    4       W ro n g #                  11
                    5
                    6




      4. Use the mouse to block off the causes, Frequency in %,
         and Cumulative %.

      5. Use the Chart Wizard to create your Pareto
         Chart (see below).



                               Partially Completed Pareto Exercise

      0.6                                                                      100.00%
      0.5                                                                      80.00%
      0.4
                                                                               60.00%
      0.3
                                                                               40.00%       Freq. (%)
      0.2
                                                                               20.00%       Cum. (%)
      0.1
        0                                                                      0.00%
             Scratches       Misaligned         Misc.             Wrong #




Gregory Swartz, © 2008                    (650) 274-6001                                          Page 18
Metrics and Statistical Process Control




            Procedure for Performing a
            Cost Pareto Analysis
            1.     List all possible causes to problem.

            2.     Tally frequency for each cause.

            3.     Assign option $ cost value to causes (unit cost).

            4.     Rank causes by total cost for each category.

            5.     Derive the cumulative cost.

            6.     Concentrate corrective action on
                   the most costly cause(s).




            p.20




Gregory Swartz, © 2008        (650) 274-6001                    Page 19
Metrics and Statistical Process Control




Cost ($) Pareto Procedure in Excel:
   1. Create a new table with your Unit Cost per defect type

   2. Determine your total cost by multiplying Unit $ x Freq.

   3. Rank your whole table by (total) Cost, and then Create a Cumulative Cost
      Column

   4. Swipe your mouse over the Causes, Cost, and Cumulative Cost.

   5. Create a bar and line chart with the Chart Wizard

   6. Comment on Leading Cost Issue and compare it with the Freq. Pareto



        Freq.         Unit Cost    (total) Cost
                  2   $      0.015 $         0.030
                  6   $      0.010 $         0.060
                 36   $      0.030 $         1.080
                 24   $      0.005 $         0.120
                  4   $      0.005 $         0.020
                 78   $      0.010 $         0.780
                150




Gregory Swartz, © 2008               (650) 274-6001                              Page 20
Metrics and Statistical Process Control


SPC Tools Integration

      1.    Use Pareto Diagram to determine the
            major causes of rejects.




           1




                                          1




      2.    Brainstorm possible causes for the biggest
            problem.

      3.    Plan Corrective Action


Gregory Swartz, © 2008   (650) 274-6001                   Page 21
Metrics and Statistical Process Control




Chapter Three: DESCRIPTIVE
               STATISTICS

            Concept Variation

            Measures of Central Tendency

            Measures of Variation

              Histograms and Specification Limits

            Coefficient of Variation (CV)




Gregory Swartz, © 2008    (650) 274-6001                  Page 22
Metrics and Statistical Process Control



Variation defined by Cause
      There are two types of causes of variation:

            • Normal causes of variation result
              from the problems in the system as
              a whole.

            • Abnormal causes of variation
              result from special problems within
              a system.


          Normal cause                Abnormal cause
          common                      special
          random                      non-random
          systematic                  local
          expected                    irregular
          unidentifiable              identifiable


      One recommended method is to identify
      abnormal causes of variation, first. And
      then, to continually reduce variation by
      effecting both abnormal and normal
      causes.




Gregory Swartz, © 2008     (650) 274-6001                 Page 23
Metrics and Statistical Process Control



      Measures of Variation

      Variation:            Spread, dispersion or
                            scatter around the Central
                            Tendency

      Range:             Difference between the largest
                              and smallest value (Max. –
                              Min.)

      Standard Deviation ( σ or S ):
               A measure of the differences
                  around the average.

                                mean




              -3 o -2 o -1o        X     +1 o +2 o +3 o
      Normal Distribution Curve

Gregory Swartz, © 2008         (650) 274-6001                   Page 24
Metrics and Statistical Process Control




The Standard Deviation (Sigma)

            Sigma           % of Distribution

               X +/- 1σ                  68 %

               X +/- 2   σ (1.96)        95 %

               X +/- 3σ                  99.97 %


                               mean




              -3 o -2 o -1o       X     +1 o +2 o +3 o



Gregory Swartz, © 2008        (650) 274-6001                 Page 25
Metrics and Statistical Process Control



      Histograms
      A histogram graphically represents the
      frequency of an attribute or variable, and
      displays its distribution of data as a snap shot
      representation. This visual format shows the
      variability of your data and can be use for
      further analysis, e.g. capability analysis.



           160

           140
      N    120
      u    100
      m
            80
      b
            60
      e
      r     40

            20

             0
                  60     65   70    75      80   85   90   95   100

                               Yield Percentages



             pp. 36-43



Gregory Swartz, © 2008         (650) 274-6001                    Page 26
Metrics and Statistical Process Control


      Histograms vs. Specs


               LS           US                        LS   US




       1                                      5




           2                                      6




       3                                  7




           4                                  8




Gregory Swartz, © 2008   (650) 274-6001                    Page 27
Metrics and Statistical Process Control


      Standard Deviation Exercise

      Pick a sequence of seven numbers and list
      them below in the left column. Units.
      Determine the standard deviation.


                                                     2
                X         (X - X)          (X - X)




               Σ            0

                            Σ (X-X)2
      Formula:       σ=        n




Gregory Swartz, © 2008    (650) 274-6001                   Page 28
Metrics and Statistical Process Control

Standard Deviation for Attribute Data
      Binomial Standard Deviation or                         σp   =
                             p    x   (1 – p )
                                 n
      Where, p is the average fraction defective               ∑ np
                                                           --------------
                  n is the average sample size               Total N

      Standard Deviation Attribute Exercise:

      Given the following set of data, determine the standard
      deviation of the fraction defective, and then create a 95%
      confidence interval.

      Sample       Sample
        #          Size n        np             p = np/n
          1          45          2
          2          50          1
          3          60          3
           4         40          0
          5          35          1
          6          70          2
          7          30          5
          8          65          3
          9          55          4
         10         50           3
       Totals       500     ∑ = 24             ∑=




Gregory Swartz, © 2008        (650) 274-6001                        Page 29
Metrics and Statistical Process Control




                   Coefficient of Variation
      The standard deviation depends on units as a
      measure of variation. A comparison of relative
      variation cannot be made using the standard
      deviation, so a unitless (dimensionless) measure
      called the coefficient of variation (CV) is used.

            population standard deviation = σ

            the population mean = μ

            sample standard deviation = S
                           __
            sample mean = X

      Sometimes the CV is normally expressed as a
      percentage. Then, the equation becomes:

                         S
            CV % = 100 • X

      The Coefficient of Variation (CV) can be used to
      signal changes in the same group of data, or to
      compare the relative variability to two or more
      different sets of data. The larger the CV, the
      greater its relative variability.




Gregory Swartz, © 2008   (650) 274-6001                   Page 30
Metrics and Statistical Process Control



Coefficient of Variation for Variables Data

Procedure:

         a.   Determine the (Grand) Average of ROX at 2 Ul
         b.   Determine the Std. Dev. of ROX
         c.   Divide the Std. Dev. by the Average to obtain CV.
         d.   Now repeat procedure for the .5 ul group
         e.   Label each CV value
         f.   Compare the relative variability between the two groups.

 2 ul                        .5 ul

Avg ROX % Genotyped        Avg ROX % Genotyped
    857.2    100              196.74       0
   609.54    100              193.11       0             .5 ul
   775.25    100              235.59       0      Ave.       471.18
   742.79    100              174.13       0 Std. Dev.    52.61506
   834.79    100              300.52   12.5
   721.02    100               300.2   12.5              2ul
   791.38   87.5              340.55   12.5       Ave.     731.602
   834.03   37.5              192.79       0 Std. Dev.    69.75184
    791.5    100              260.26   12.5
   796.88    100              147.19       0   CV .5ul    0.111667
   744.67    100              305.19   12.5    CV 2ul     0.095341
   679.79   87.5              226.12     50
   722.99    100               266.5     50 CV .5ul%
   622.92    100              236.47   12.5 CV 2ul %
   654.22   87.5              322.33   12.5
   821.46     50              253.65       0
   758.24    100              309.33   12.5
   781.04     25              202.03   12.5
   726.51    100              269.09     25
    670.2    100              236.88     25
   697.83    100              214.98   12.5
   630.47    100              196.84       0
   704.11    100              364.15   12.5
   815.79   87.5              220.58       0
   715.18   87.5               242.1   37.5
   755.32   87.5              311.26       0
   721.65   87.5              294.34     25
   650.83    100              248.83     25
   699.65    100              284.14   37.5
   620.81    100              225.05       0




Gregory Swartz, © 2008           (650) 274-6001                          Page 31
Metrics and Statistical Process Control


    Attribute Coefficient of Variation Example

    Now, let’s try applying this concept
    to attribute data:
                                __
    Group one: Sp1 = .00142, P1 = .007
                                __
    Group two: Sp2 = .00178, P2 = .01

    Which group has the larger variability? Hint: At
    first you might be led to thinking that group two
    has the larger relative variation…


    CV1 = .00142/.007 x (100) =

    CV2 = .00178/.01 x (100) =




Gregory Swartz, © 2008   (650) 274-6001                   Page 32
Metrics and Statistical Process Control



      Chapter Four: Process Capability,
      Yield and Attribute Proportion Tests

      This chapter includes the following key areas for
      effectively performing process capability studies,
      accurate yield determination, and testing for
      single and two sample proportions:

            •      Central Limit Theorem

                         σx
                   •            =         σx
                          n



                   •     X =      X
                                      i




            •      Cp and Cpk Indices

            •      Yield Determination

            •      Attribute Proportional Testing


Gregory Swartz, © 2008         (650) 274-6001                  Page 33
Metrics and Statistical Process Control


Central Limit Theorem (CLT)
      The CLT states that the average of individual
      values (X) tends to be normally distributed
      regardless of the individual (x) distribution.
      Individual Data:
      If you randomly selected 100 four-digit numbers
      and charted them, the distribution will be
      somewhat uniform. Each digit shows
      approximately the same frequency.
10

 8



6



4



2



 0
        0       1        2     3     4           5   6       7   8   9
                               Phone Digit

Chart the number 4186 by using one each of 4, 1, 8, and 6.
Mean = 4.5225       Standard Deviation = 2.8266




Gregory Swartz, © 2008          (650) 274-6001                           Page 34
Metrics and Statistical Process Control

Averages Data

This histogram of average values shows the normal
distribution of the averages. For example, each digit
in the number 4286 would be averaged (4 + 2 + 8 +
6) = 20/4 = 5. Averages are distributed below:
                                        Averages Bar Chart

        27

        24

        21

        18

    (#) 15
        12

        9

        6

        3

        0
               1         2          3         4          5    6       7    8    9
                                        Phone Digit Midpoint
                             Mean = 4.5225   Standard Deviation = 1.4133




      Question: Can you now validate the Central
      Limit Theorem with the above example?




Gregory Swartz, © 2008                  (650) 274-6001                         Page 35
Metrics and Statistical Process Control


      Cp & Cpk: The Inherent
      Capability of a Process
      The Cp index relates the allowable spread of the
      specification limits (USL - LSL) to the actual
      variation of the process. The variation is
      represented by 6 sigma.

                                    USL − LSL
                             Cp =
                                      6σ

      If the tolerance width is exactly the same as the
      6 standard deviations width, then you have a
      Cp = 1.

      1.333
                  LSL                     X              USL
                                         mean




                           -3σ -2σ -1σ    X +1σ +2σ +3σ
                   12.5%                 75%            12.5%




Gregory Swartz, © 2008           (650) 274-6001                   Page 36
Metrics and Statistical Process Control



Cpk Defined
      Cpk expresses the worst case capability index —
      a process that is off-center.

      Cpk also takes into account the location of the
      process average.

      Cpk =        the smaller result of the following two
                   formulas:

                              USL − X                     X − LSL
                     C pu =               or C   pl   =
                                3s                           3s




      Where:
                   Cpu = Upper Capability Index
                                   and
                   Cpl = Lower Capability Index




                pp. 64-66




Gregory Swartz, © 2008          (650) 274-6001                      Page 37
Metrics and Statistical Process Control


         Process Capability Indices
         Example:
Your boss attended this statistical seminar and is
familiar with process capability indices. He or she
threatens to take away your new sports car if the
process capability indices (Cp) from the new oxide
manufacturing process is not greater than 1.0.

            Tolerances = 250 to 400 μ

            Average           = 300 μ

            sample S          = 35 μ


   Question: Will you be driving to work in
             your old car tomorrow?




Gregory Swartz, © 2008   (650) 274-6001                   Page 38
Metrics and Statistical Process Control

                                 400 − 250
                         Cp =              =.714
                                   6(35)


                                      6(35)
                         Cratio =             =1.4
                                    400 − 250

                                 400 − 300
                         Cpu =             =.95
                                   3(35)


                                 300 − 250
                         Cpl =             =.476 = Cpk
                                   3(35)




    Your boss has taken away your new sports car.




Gregory Swartz, © 2008              (650) 274-6001                Page 39
Metrics and Statistical Process Control


Process Capability Index Exercise
Given the following specifications,
determine Cp and Cpk.

      •     Upper Spec. (US) = 100.0

      •     Lower Spec. (LS) = 24.0

      •     Mean (X) =

      •     Sigma =

                   Cp = _________

                   Cpk = _________




Gregory Swartz, © 2008     (650) 274-6001                   Page 40
Metrics and Statistical Process Control



      MEAS     MIN            MAX
         26.81           24         100
         26.67           24         100
          26.9           24         100
         27.04           24         100
         26.63           24         100
         26.92           24         100
         26.73           24         100
          26.8           24         100
         26.94           24         100
         26.85           24         100
         27.54           24         100
         27.22           24         100
         25.84           24         100
         25.77           24         100
         26.93           24         100
            26           24         100
         26.96           24         100
         25.79           24         100
         27.04           24         100
         25.98           24         100
         27.48           24         100
         27.03           24         100
         26.92           24         100
         27.69           24         100
         26.83           24         100
         25.38           24         100
         25.87           24         100
         26.81           24         100
         27.36           24         100
          27.3           24         100
         26.73




Gregory Swartz, © 2008                    (650) 274-6001               Page 41
Metrics and Statistical Process Control



Interpretation of Cp and Cpk Indices



   Cpk < 1.00      Not Capable


                                                    Cp < 1


   Cpk = 1.00      Barely Capable



                                                   Cp = 1



   Cpk > 1.33      Very Capable


                                                  Cp = 1.33



Is the process truly capable of meeting the customer
requirements? _________

Why or why not?




Gregory Swartz, © 2008           (650) 274-6001                   Page 42
Metrics and Statistical Process Control



Creating Confidence Intervals for Variables Data
The fish and game commission have been feeding robin yearlings a special bird seed.
Sample weights of 13 robins are listed below. What are the 95% and 99%
confidence intervals?

Procedure:

1. Determine the Mean and Std. Deviation of the data set.

2. Create Lower and Upper Confidence Intervals
   based on the “t” values provided.

                                                       Data Set
     95% Confidence Interval (Mean)                    (in Grams)
        Mean =                                               12.5
      Std Dev.=                     Tinv(95)= 2.178813       12.3
            n=         13           Tinv(99)=  3.05454       12.7
     Confidencence Limits                                    12.5
        Lower=          0 Upper=             0               12.4
                                                             12.1
                                                             12.6
                                                             12.7
     99% Confidence Interval (Mean)                          12.2
        Mean =                                               12.1
       StdDev=                                               11.9
            n=         13                                    12.3
     Confidence Limits                                       12.6
     Lower              0 Upper              0   Sum =      160.9




Question: Why are we using “t” scores versus
          standardized “Z” scores?

Gregory Swartz, © 2008            (650) 274-6001                              Page 43
Metrics and Statistical Process Control

Sample Size Determination for Means and Proportions
Determining a sample size for means.

The formula for determining a sample size for a mean is


                                            Ζ 2σ 2
                                 η=
                                           (χ − μ )  2



The Ζ -value depends on the level of confidence required. Remembering that:

      A 99 percent confidence results in a Ζ -value of 2.58.

      A 95 percent confidence results in a Ζ -value of 1.96.

      A 90 percent confidence results in a Ζ -value of 1.645.

σ is the standard deviation or variance.

χ −μ     is the difference between the sample mean and the population mean referred
to as the error.


Sample Size Determination

    Z-Value = 2.576321008
   Std. Dev.=         0.75
        error=        0.15
 sample size= 165.9357483




Gregory Swartz, © 2008             (650) 274-6001                             Page 44
Metrics and Statistical Process Control

Determining a sample size for proportion:

The formula for determining a sample size for a proportion is


                    n =
                          Ζ   2
                                    (
                                   p 1− p      )
                              (ρ    − p   )2




The Ζ -value depends on the level of confidence required.

p is the population proportion if known. If the proportion is not
known,    π   is assigned a value of .5

ρ − p is the difference between the sample proportion and the
population proportion referred to as the error.

The Easy technique for determining sample “n”:

                   np > 5




Gregory Swartz, © 2008             (650) 274-6001                   Page 45
Metrics and Statistical Process Control




Scenario: You have been selected as the “improvement Expert”
in your lab to determine the appropriate “n” size per sample after
your team has determined an average failure rate of .035. Due
to new equipment in the lab an initial confidence level of 95% is
selected, and degree of precision (error) @ .02.

Procedure:

   1. On a worksheet, key in the following information:

   Sample Size Determination - Proportion

         Z-Value=
       Pop.Prop.=
            error=
     sample size= #DIV/0!



   2. In cell B3, input the Z value for 95% Confidence

   3. In cell B4, input the failure rate

   4. In cell B5, input the error.

   5. In cell B6, key in =B3^2*B4*(1-B4)/B5^2

Questions:

Gregory Swartz, © 2008           (650) 274-6001                  Page 46
Metrics and Statistical Process Control

   1. What is the required random sample size for a degree of
      precision of .05?
   2. What sample size is required for the same precision, with
      99% confidence?




Chapter Five: Process Control Tools
               for Variables Data


      ♦     X Bar and R Charts

      ♦     X Bar and S Charts (n>10) for reference

      ♦     Short Run SPC Charting Technique




Gregory Swartz, © 2008    (650) 274-6001                    Page 47
Metrics and Statistical Process Control




      Control Limits
      • Help define acceptable variations
        of the process.

      • Are calculated and represent true capability
        of the target process, or where baseline
        metrics have been implemented.

      • Can change in time as the process improves.


                                                           UCL


                                                             X
                                                            LCL
               1     2   3 4 5 6 7 8 9 10 11 12
                         Time or Sample Number


            General Rule: Don’t apply specification
            limits on control charts.




Gregory Swartz, © 2008      (650) 274-6001                  Page 48
Metrics and Statistical Process Control




X and R Control Chart

                                                     UCL x
M
E
A
S
U
R
E
                                                      x
M
E
N
T                                                    LCL x




                                                     UCL R


                                                     R




Gregory Swartz, © 2008   (650) 274-6001                   Page 49
Metrics and Statistical Process Control

Control Limits vs. Spec. Limits

Control limits monitor the performance of the
process.
          y
                                                                    UCL
                                                                          X
Measure




                                                                    X


                                                                    LCL
                                                                          X
                                                                    X
              1     2    3    4    5      6       7   8   9   10
              time or sample number -->

Spec. limits monitor the quality of the product as to
the individual distribution below:

                                              X

                    LS                                             US




Gregory Swartz, © 2008               (650) 274-6001                     Page 50
Metrics and Statistical Process Control


Short Run SPC


The Short Run Individual X and Moving Range
Charts can be applied to the following:


      • Low production volume

      • Temperature, humidity, concentration of
        solutions

      • When data must be obtained at the end of a
        reporting period (per quarter, month, day)

      • When the testing is costly or time consuming




Gregory Swartz, © 2008   (650) 274-6001                   Page 51
Metrics and Statistical Process Control



   X & R Charts

   Control Chart Plotting Procedure:

   1. Accurately measure the required number of
      readings for the lot.

   2. Calculate the mean. (Add readings together and
      divide by the number of readings.)

   3.Calculate the range. (Subtract lowest reading
     from the highest reading.)

   4. Plot both the mean and range on the SPC chart.
      Log the lot number and date.



         pg. 59




Gregory Swartz, © 2008   (650) 274-6001                   Page 52
Metrics and Statistical Process Control


Example Data /Analysis for Control

     Date             MEAS 1 Meas. 2 Meas. 3 Ave.     Grand AveUCL   LCL
       1/18/2007 0:00    0.3637   0.3663    0.2118
       1/19/2007 0:00    0.1322    0.426    0.2178
       1/20/2007 0:00 0.09442 -0.02428 0.02284
       1/21/2007 0:00    0.3333   0.1105    0.2807
       1/22/2007 0:00 0.04403     0.2663 0.02492
       1/23/2007 0:00    0.4842   0.1715    0.0816
       1/24/2007 0:00 0.07829     0.1304    0.1919
       1/25/2007 0:00 -0.04909 -0.09284    -0.2375
       1/26/2007 0:00    0.1948   0.4446 -0.02368
       1/27/2007 0:00    0.1614  -0.1326    0.2387
       1/28/2007 0:00    -0.206   0.0127    0.2065
       1/29/2007 0:00    0.0201   0.1632    0.2199
       1/30/2007 0:00 0.04176     0.1323    0.2523
       1/31/2007 0:00     0.338 0.09527     0.9097
        2/1/2007 0:00    0.2842 -0.05588      -8.97
        2/2/2007 0:00   -0.1014 0.04255 0.07366
        2/3/2007 0:00   -0.2253   0.3117    0.2042
        2/4/2007 0:00     6.543   0.2073 0.000886
        2/5/2007 0:00     10.03  -0.1436     9.883
        2/6/2007 0:00    0.2127   0.1612    0.4555
        2/7/2007 0:00    0.4352   0.1162    0.1387
        2/8/2007 0:00     0.744   0.2604    0.5681
        2/9/2007 0:00    0.1054   0.2471 0.04124
       2/10/2007 0:00   -0.2962 0.05815     0.6354
       2/11/2007 0:00    0.4714    9.732    0.2281
       2/12/2007 0:00    0.2151   0.0752    0.2977
       2/13/2007 0:00    0.2146   0.6519    0.6632
       2/14/2007 0:00    0.3294   0.7231    0.1349
       2/15/2007 0:00    0.7159   0.2251    0.3108
       2/16/2007 0:00    0.5853   0.4141    0.2791




Gregory Swartz, © 2008           (650) 274-6001                        Page 53
Metrics and Statistical Process Control

    Average Control Chart using 2 Sigma Limits


      Below is an Average Control Chart using the
      data from the previous page. Limits were
      generated in Excel at the 95% confidence
      interval using 1.96 Sigma + Grand Average.


                      Control Chart of Plate Data w ith 2 Sigma Limits

     180.0
     175.0
     170.0
     165.0                                                                                                 Average
     160.0                                                                                                 UCL
     155.0                                                                                                 LCL
     150.0                                                                                                 Grand Ave.
     145.0
     140.0
     135.0
                                           4

                                                     4

                                                               4

                                                                         4

                                                                                   4

                                                                                             4

                                                                                                       4
            04

                      04

                                04

                                          00

                                                    00

                                                              00

                                                                        00

                                                                                  00

                                                                                            00

                                                                                                      00
        20

                 20

                           20

                                      /2

                                                /2

                                                          /2

                                                                    /2

                                                                              /2

                                                                                        /2

                                                                                                  /2
       4/

                 6/

                           8/

                                     10

                                               12

                                                         14

                                                                   16

                                                                             18

                                                                                       20

                                                                                                 22
       1/

             1/

                       1/

                                 1/

                                           1/

                                                     1/

                                                               1/

                                                                         1/

                                                                                   1/

                                                                                             1/




      Interpretation: There is good reason with the
      above data set to consider implementing 2 Sigma
      Control Limits as shown. In this case, data point on
      1/09/04 fell just outside the Upper Control Limit.

      Do you think 3 Sigma Limits would have caught the
      abnormal cause?




Gregory Swartz, © 2008                                    (650) 274-6001                                          Page 54
Metrics and Statistical Process Control


Factors and Control Limits

                              Shewhart Factors

      n            2                3          4       5         6

      D4           3.268            2.574      2.282   2.115     2.004
      D3           0                0          0       0         0
      A2           1.880            1.023      0.729   0.577     0.483
      d2           1.128            1.693      2.059   2.326     2.534


Control Limit Formulas

             UCL X = X + (A2• R)

             LCL X = X − (A2• R)


             UCL R = RD4


              LCL        =   RD 3
                     R




Gregory Swartz, © 2008              (650) 274-6001                   Page 55
Metrics and Statistical Process Control



Exercise - Short-Run Control Charts

Key Points for Plotting the X (individual)
Control Charts:

      • X is the individual measurement to be plotted.

      • X is the average of the individual plot points.
        This becomes the center line for the control
        chart.

         • UCL is the Upper Control Limit and is
           calculated by: UCL = [ Average + (2 x σ) ]

         • LCL is the Lower Control Limit and is
           calculated by: LCL = [ Average - (2 x σ) ]




Gregory Swartz, © 2008   (650) 274-6001                   Page 56
Metrics and Statistical Process Control




Creating a Short-Run Control Chart in ExcelTM


   1. Arrange your data from left to right as seen in table below.

   2. Assign a # or date for the individual data being
      collected (see table below).

   3. Calculate the average of your data with the function wizard and
      create separate rows repeating the average across all data points.

   4. Determine the Standard Deviation (σ ) with the function wizard.

    5. Calculate the Upper & Lower Control Limits (UCL & LCL) by
        multiplying the Standard Deviation times 2, and then both add and
        subtract the product from the [X ± (2 xσ )]

    6. Repeat the Control Limits across all data points.

    7. Use the mouse to block off date, data, average, & control limits.

   8.   Use the Chart Wizard to create your Control Chart (see below).

    9. Interpret Control Chart for shifts, trends, or out-of-control points.




           pp. 51-63




Gregory Swartz, © 2008          (650) 274-6001                           Page 57
Metrics and Statistical Process Control


Variables Data Excel Exercise

   1. Determine Averages across date or assay type
   2. Create Upper Control Limit = Ave. plus 1.96 Std. Dev.
   3. Create Lower Control Limit = Ave. minus 1.96 Std. Dev.
   4. Create 3 additional columns for UCL, LCL, and Ave.
   5. Swipe Mouse over Dates, Averages, UCL, LCL, and Average
   6. Use chart wizard to create a multiple line chart
   7. Include Interpretation Section for Out-Of-Control points
                Date     Phred 20      Ave.    UCLx   LCLx
                5/1/2007       351
                5/2/2007       375
                5/3/2007       368
                5/4/2007       364
                5/5/2007       321
                5/6/2007       289
                5/7/2007       325
                5/8/2007       366
                5/9/2007       378
               5/10/2007       347
               5/11/2007       339
               5/12/2007       335
               5/13/2007       389
               5/14/2007       348
               5/15/2007       354
               5/16/2007       368
               5/17/2007       356
               5/18/2007       392
               5/19/2007       373
               5/20/2007       352
                   Sum=
                  Ave. =
              Std. Dev.=



Questions:
  1. Since the above Phred scores are individual readings, what
     might be a realistic lower specification limit?
  2. What degree of confidence in % have you created with your
     control limits?
Gregory Swartz, © 2008               (650) 274-6001                   Page 58
Metrics and Statistical Process Control

Now: Let’s try this with another example with min and
max specifications:


Date        MEAS    MIN   MAX
7/23/2007   26.81   24    100
7/24/2007   26.67   24    100
7/25/2007   26.9    24    100
7/26/2007   27.04   24    100
7/27/2007   26.63   24    100
7/28/2007   26.92   24    100
7/29/2007   26.73   24    100
7/30/2007   26.8    24    100
7/31/2007   26.94   24    100
 8/1/2007   26.85   24    100
 8/2/2007   27.54   24    100
 8/3/2007   27.22   24    100
 8/4/2007   25.84   24    100
 8/5/2007   25.77   24    100
 8/6/2007   26.93   24    100
 8/7/2007   26      24    100
 8/8/2007   26.96   24    100
 8/9/2007   25.79   24    100
8/10/2007   27.04   24    100




Gregory Swartz, © 2008          (650) 274-6001                   Page 59
Metrics and Statistical Process Control




              Control Chart Tools Overview



                                            Data

                                                                  Yes/No
              Measurable                                         Good/Bad
                                                                 Pass/ Fail


             Variable Data                                      Attribute Data



                                                   Defects               Defects
                                                  Unlimited              Limited


                             X/MR
 X/R Chart   X/S Chart                      c Chart   u Chart      p Chart       np Chart
                             Chart


 Sample       Sample                         Fixed    Variable      Variable      Fixed
 size less   size more   Individuals        Sample    Sample        Sample       Sample
  than 7       than 6                         Size     Size          Size          Size




Gregory Swartz, © 2008               (650) 274-6001                               Page 60
Metrics and Statistical Process Control




Chapter Six: Process Control Tools
             For Attribute Data

                  NP Charts - # of defective in a sample
                                   (sample size is constant

                   P Charts - fraction defective
                                    (sample size can vary

                   C Charts - # of defects per unit


                   SPC Charting Guidelines




Gregory Swartz, © 2008      (650) 274-6001                   Page 1
Metrics and Statistical Process Control




Attribute Control Charts
Attribute Control Charts consist of primarily three
basic types of charts following the binomial and
poisson distributions:

      • np Charts - used for monitoring the # of
        defects per sample when the sample size is
        constant, for example, n = 50.

      • p Charts - can be used either with a constant
        sample size or variable sample (n) size.
        (variable control limits or average control
        limits may be imposed)

      • c Charts – is applicable for the number on
        defects per sample unit, e.g. # of defects on a
        car. Sample unit size is constant.

      • u Charts – is used in the same way as a
        c Chart, but the sample unit size may vary.




Gregory Swartz, © 2008   (650) 274-6001                    Page 2
Metrics and Statistical Process Control




p Chart Formulas                                   NP Chart Formulas

                     (
                   p 1− p   )
UCL p = p + 3.
                      n                                           (
                                             UCLnp = np + 3. np 1 − p    )
                     (
                   p 1− p   )
LCL p = p − 3.
                      n                                           (
                                              LCLnp = np − 3. np 1 − p   )
                                C Chart Formulas


                                UCLc = c + 3. c

                                LCLc = c − 3. c




Gregory Swartz, © 2008            (650) 274-6001                       Page 3
Metrics and Statistical Process Control




Benefits of an “Attribute P Chart”

      Allows for accurate monitoring of fraction defective.

      Control Limits act as guidelines when your process is
      producing bad product.

      The average fraction defective is a good indicator of
      “Failure Rate.”


Attribute P Chart Procedure
   1. Determine fraction defective for each sample in adjacent
      column

   2. Calculate the average fraction defective (Ave. p) into
      additional column

   3. Determine the Std. Dev. Of the proportion defective.

   4. Create Upper and Lower Control Limits based on 1.96 Sigma

   5. Drag mouse over p, Ave. p, UCLp, and LCLp

   6. Create multiple line chart in Chart Wizard

   7. Interpret Results and comment on Outliers


Gregory Swartz, © 2008     (650) 274-6001                      Page 4
Metrics and Statistical Process Control



P Chart Exercise with variable sample sizes in Excel

Instructions: Using the data set below with varying sample n, construct a P Chart in
Excel, using +/- 2.58 standard deviation limits.

Question: What confidence Interval am I generating?

                 sample n     np (defects   np/n =p   Ave. p   UCLp        LCLp
          1         50             2          0.040
          2         35             4          0.114
          3         45             3          0.067
          4         65             5          0.077
          5         75             1          0.013
          6         35             3          0.086
          7         45             2          0.044
          8         75             3          0.040
          9         50             2          0.040
          10        45             5          0.111
          11        58             8          0.138
          12        25             5          0.200
          13        40             3          0.075
          14        60             1          0.017
          15        80             0          0.000
          16        65             1          0.015
          17        46             4          0.087
          18        50             3          0.060
          19        25             4          0.160
          20        85             5          0.059
      Totals       1054           64

                                                               Average P   0.060721




Questions:

   1. Is the average fraction defective a good indicator of the failure rate?

   2. What processes would lend themselves to p charts in your lab areas?




Gregory Swartz, © 2008              (650) 274-6001                                    Page 5
Metrics and Statistical Process Control




                 Process Control Tools
                  Overview Flowchart
                                        Data

            Attribute                                       Variable




             Display                                         Display
            Data Over                                       Data Over
             Time?                                           Time?

    No                      Yes                       No                   Yes




   Check                                         Data                   X and MR
                         P, NP, or
   Sheet                                       Collection               Run Chart
                         C Charts               Sheet



                                                                         _
  Pareto                                                                 X and R
  Chart                                        Histogram
                                                                         Control
                                                                           Chart


    Pie                                         Process
   Chart                                       Capability
                                                 Tools




Gregory Swartz, © 2008               (650) 274-6001                                 Page 6
Metrics and Statistical Process Control




Chapter
Seven: INTERPRETATION &
        CORRECTIVE ACTION


      • Interpreting Trends and Shifts in Data


      • Planning Corrective Action


      • Implementing Continuous Process
        Improvement




Gregory Swartz, © 2008   (650) 274-6001                    Page 7
Metrics and Statistical Process Control




      Control Chart Interpretation

            • Detecting "Out-of-Control" Conditions

            • Assigning Causes to Problems

            • Guidelines for Control and Stability


      Corrective Action

            • Assigning Causes to Problems

            • Selecting SPC Tools

            • Corrective Action Plan

            • SPC Report Form




Gregory Swartz, © 2008   (650) 274-6001                    Page 8
Metrics and Statistical Process Control




Detecting Out of Control Conditions

Bonnie Small's guidelines for interpreting control
chart data

      • Points beyond the control limits usually
        indicate:
         - The process performance is sporadic
         - Measurement has changed (inspector, shift,
           gage, etc.)


      • Runs indicate    a shift or trend. Runs include:
         - 7 points in   a row on one side of the average
         - 7 points in   a row that are consistently
           increasing    or decreasing


      • Non-random patterns may indicate:
         - The plot points have been miscalculated or
           misplotted.
         - Subgroups may have data from two or more
           processes




Gregory Swartz, © 2008   (650) 274-6001                    Page 9
Metrics and Statistical Process Control



Determine whether Bonnie Small rules were
broken:

      • One average (mean) above or below control
        limit.

      • Seven consecutive averages (means) above or
        below the center line.

      • A trend of seven consecutive points in an
        upward or downward trend.


Now, take corrective action as follows:

      1. Circle the point or group of points

      2. Comment on the cause(s) of the unstable
         point(s).

      3. Detail Corrective Action Plan.




Gregory Swartz, © 2008   (650) 274-6001                   Page 10
Metrics and Statistical Process Control




Taking Corrective Action

      • Implementing change in the process

         • Identify key problem area(s)

         • Determine root cause(s)

         • Document causes and Corrective Action

         • Implement SPC Team Action Plan




Gregory Swartz, © 2008   (650) 274-6001                   Page 11
Metrics and Statistical Process Control




                         SPC Report Form

      Name:                                  Date:

      Department:                            Extension:


      Statement of the Problem:




      Corrective Action Objective:




      Method:




      Results: (attach charts, data analysis to form)



      Corrective Action/Recommendation:




Gregory Swartz, © 2008      (650) 274-6001                  Page 12
Metrics and Statistical Process Control




Chapter
Eight:  Correlation and Regression


Procedure for Creating a Scatter Diagram in ExcelTM


Arrange your paired (X and Y) data in table format.

Assign a # for each pair of data being collected (see table below).

          Conc.     % Genotype
               1.50       72
               1.00       65
               2.50       87
               1.00       63
               3.00       92
               4.00       95
               1.00       60
               2.00       80
               1.50       68
               3.00       90




Use the mouse to block off the X and Y data columns.

Use the Chart Wizard to create your Scatter Diagram.




Gregory Swartz, © 2008              (650) 274-6001                    Page 13
Metrics and Statistical Process Control



Appendix: Terms & Definitions:
Acceptance Criteria -the amount of acceptable rejects before a lot
will be rejected based on the sample. Used in sampling plans as the
criteria for passing or failing a lot of items inferred from the sample.

Acceptable Quality Level (AQL) - a coordinate point for the fraction
defective on the x axis of the Operating Characteristic Curve of an
attribute sampling plan. This point is the region of good quality and
reasonably low rejection probability - 5% alpha error.

Accuracy - how close a measurement comes to its actual value. In a
particular process, accuracy could be a function of calibration. See
Precision.

Alpha Error - the probability of error in making an assumption
incorrectly. In sampling plans, it is the probability of rejecting a lot
which is truly good. In Control Charts, it is the assumption that a
process point is out-of-control, when in fact it is not, and is due to
statistical chance alone. Therefore, the smaller the alpha error in any
case, the more confidence there is in the result(s) we‘ve obtained.

Analysis - implies some conclusion based on statistical results in
order to interpret some meaning from the statistical test(s) performed.
Interpretation.

Ambient -certain intervening variables in a environment that have
some effect on the result being measured.         Generally, ambient
variables or factors in an industrial environment are those which are
not wanted, such as dust particles, temperatures, or sources of light.

Arithmetic Average - the mean of the distribution. It is a measure of
Central Tendency indicating the center weight of a distribution of
scores.

Assignable Causes - those causes to problems which are sporadic in
nature and not due to statistical chance alone. Assignable causes can
be assigned a reason as to why that problem point exists. Usually,
points outside of control chart limits are associated with an
assignable cause and this cause can be identified.

Attribute Data - qualitative data based on the absence or presence of
a characteristic, usually determined by a specification. Common
types of attribute data would include: go no-go data, pass-fail,
Gregory Swartz, © 2008          (650) 274-6001                             Page 14
Metrics and Statistical Process Control



accept/reject, yield/reject.  Attribute data is based on binomial
population of mutually exclusive events designated by P and Q= (1-P).

Average Outgoing Quality (A.O.Q.) - based on the fraction defective
(P) and the probability of acceptance (PA) for that fraction defective.
Also takes into account the characteristics of an attribute sampling
plan, that is, its sample size and decision criteria. A.O.Q. = P.A. x P.

Average Outgoing Quality Limit (A.O.Q.L.) - the threshold point on
the A.O.Q. curve. It is the worst possible case outgoing quality, and is
generally derived from the area of indifference off the Operating
Characteristic Curve.

Awareness - attention to the relationships between quality and
productivity. Directing this attention to the requirement for
management commitment and statistical thinking leads toward
improvement.

Beta Error - In sampling plans, beta error is associated with the
L.T.P.D. point and implies a 10% risk in accepting a lot which is truly
rejectable. In hypothesis testing, it is the error made in rejecting an
alternative hypothesis when in fact, it is true. In control charts, beta
is the error made in assuming the process is in control when in fact, it
is not.

Bimodal Distribution - a distribution having two modes depicted by
two distinctive humps in the curve. The presence of two frequently
occurring scores, or groups of scores is noticeable.

Binomial Distribution - A discrete probability distribution for
attributes data that applies to the conformance and non conformance
of units. This distribution also is the basis for attribute control charts
such as p and np charts.

Capability - whether or not product is truly capable of conforming to
specifications. This capability can only be determined after the
process is in statistical control. A process may be defined as being
truly capable when the aim of the process is well centered and the
variance or spread of the process on an individual unit basis does not
exceed the specification limits.

Cause and Effect Diagram - a simple tool for individual or group
problem-solving that uses a graphic description of the various process
elements to analyze potential sources of process variation. Also called

Gregory Swartz, © 2008           (650) 274-6001                              Page 15
Metrics and Statistical Process Control



a fishbone diagram (because of its appearance) and developed by
Ishikawa.

Capricious Data - the natural occurring chaos in all things, or the
unexpected results one derives from attempting to sort out dirty data,
like sudden shifts or abnormal changes.

Central Limit Theorem (C.L.T.) - when collecting a distribution of
averages or subgroup scores, the distribution will tend to centralize
around the center value. The distribution will be evenly distributed
about the mean or average. This is true if the averages are sampled
from an abnormal distribution (skewed, bimodal, etc.).

Control - in Statistical Quality Control, control means to get a
handle on the process and be able to manipulate it in a desirable
fashion.

Control Charts - a tool one uses to visualize a particular process
over time and/or across units. It is a way to graphically represent a
parameter in an unbiased manner. The various types of control charts
are as follows:

       C Charts - used to depict the number of defects per unit. For
example, the number of defects per automobile. An average number
of defects per automobile can also be obtained - (C bar).

      P Charts - used when the Percent or Fraction Defective is
graphically desired. It depicts the fraction defection per sample, and
an average can be obtained.

      NP Charts - used to the depict the number of defects per
sample. Similar to a C Chart, NP easily counts the number of defects
which makes charting fairly simple. The main requirement for a NP
Chart is the sample size must remain constant.

      R Charts - used to monitor the range variation when collecting
averaged or subgroup data. Usually seen in conjunction with an X
Bar Chart, the range chart gives information to the variance of a
process over time, across units, or across samples.
S Charts - similar to R charts and measure the process variation via
the sample standard deviations. The S Chart is especially applicable
with larger sample sizes.



Gregory Swartz, © 2008         (650) 274-6001                            Page 16
Metrics and Statistical Process Control



X Bar Charts - used to monitor variables data (continuous variables)
over time. Generally, X Bar Charts, graphically represent averages or
groups of data over time. They serve as a good indication of any
process which has been       identified as a problem area or for
monitoring purposes.

Control Limits - c the boundary lines set up on any control chart for
the purpose of determining whether a process is in or out of control.
Typically, the area between the control limits account for 99.7% of the
distribution of scores making up the control chart. When control
limits are set plus and minus three sigma (standard deviations), it
will accommodate again 99.7% of the distribution.

Control Limits for Averages - when taking average or subgroup
data, these limits are used for averages on an X Bar Chart. They also
serve as a boundary parameter for a majority of the scores being
marked on the chart (99.7%), but in this case it applies for averages
and not individual scores.

Control Limits for Individuals - also known as the natural process
limits help determine, with 99.7% confidence, where the expected
process will go. Because these limits are for individual scores, they
assist in determining the yield for a particular process.

Cost-Effectiveness - The reduction of quality costs, such as rework,
and waste, makes any operation more cost-effective. By being cost-
effective, savings and efficient operations will ensue. Quality is really
free, it only cost money when you don’t have it.

Fault-Tree Analysis - is a brainstorming and communication tool in
order to figure out all the possible causes to any particular yield,
productivity, or quality problem. This tool uses a fish-bone diagram
to analyze all the possible causes to an identified problem in the
categorized areas of People, Equipment, Specifications, Flow, Raw
Materials, and Measurement.

Kurtosis - Refers to the height of a distribution of scores. Platykurtic
means a flat and very dispersed distribution, whereas leptokurtic
means a tall and very tightened distribution.

L.T.P.D. - Lot Tolerance Percent Defective. Let Them Pay Dearly.
This particular defective level is guaranteed with 90% confidence of
meeting the plan, and a 10% Beta Error or probability of rejection. See
Beta Error.

Gregory Swartz, © 2008           (650) 274-6001                             Page 17
Metrics and Statistical Process Control




Mean - arithmetic average.

Measure - the dictionary defines measure as the dimensions,
quantity, or capacity of anything ascertained by a scale or by the
variable condition. In S.Q.C., measure could be a reference standard
or sample used for the quantitative comparison of properties.

Median - is the middle score when the scores are ranked from highest
to lowest or lowest to highest. When the median is resolved half of the
scores will be on one side, and the other half will be on the other side.


Methodology - the systematic way in which an application is
addressed to a problem.        S.Q.C. methodology involves a logical
approach with statistical tools to effectively solve problems.

Midpoint - in reference to cell intervals, it is the middle point of any
particular cell.

Modified Control Limits - are generally performed when the process
is well within the Specification Limits, and both the upper and lower
specification limits are outside the natural limits of the process.

Mode - a measure of central tendency indicating where the most
frequently occurring score or group of scores lies in a distribution.

Motivation - the impetus influencing the use of S.P.C. to its
maximum potential.
Participation.

Normal - a continuous, symmetrical, bell-shaped frequency
distribution for variables data which is the basis for control charts for
variables. The mean, median, and mode are approximately the same,
and a standard deviation (S) exists where plus and minus one S =
68%, plus and minus two S = 95%, and plus and minus three S =
99.7% which is a standard setting for control charts limits.



Pareto Chart - A simple tool for problem-solving that involves making
all potential problem areas or sources of variation. Pareto was an
Italian economist who resolved that a majority of the wealth resides in


Gregory Swartz, © 2008           (650) 274-6001                             Page 18
Metrics and Statistical Process Control



a few elite or upper class. In relation to a process, this means a few
causes account for most of the cost (or variation).

Poisson Distribution - Another discrete probability distribution for
attributes data used as an approximation to the binomial. It can be
used when p<.1 and np<5. It is the basis for C charts using
attributes data.

Prevention - a strategy for maintenance of a process. This implies an
awareness of potential problems that can occur in the process and to
act on those problems before an “out-of-control” situation happens. A
preventative maintenance program (PM).

Process - a series of events leading to a desired result or product. A
process can involve any part of a business.

Process Control - having a process behave under an expected
frequency of occurrence or within        the limits which have been
statistically derived. It is a state in which all the points fall in and
around the average in a random manner and very few of these
approach the limits of the distribution.

Quality - usually determined by the customer, quality is a current
issue today that challenges U.S. companies to surpass its
competition. Quality gives a product a characteristic of customer
satisfaction. If we care for good quality we should have the priority of
pleasing our customer.

Randomness - the state of collecting individual data values without
any expected frequency or basis. They may become defined once a
distribution is perceived.

Range - the difference between the minimum and maximum score.

Sample - a known quantity designated by (n) or the size of the
sample. It is randomly pulled from a population parameter in order to
provide statistical data.

Statistics - derived from a sampled population, the information is
arranged to make interpretation of the data easy and to infer
something about the population from the
sample which has been randomly drawn.



Gregory Swartz, © 2008          (650) 274-6001                             Page 19
Metrics and Statistical Process Control



Special Cause - cause attributable to an assignable item off the x axis
of a control chart. Special Causes are People, Machine, Materials, etc.

Specification - These may be quality specs. or product specs. They
are set by engineering or determined by the demands of the customer,
keeping in mind Deming’s philosophy: “The customer is King”.

Spread - variability in a distribution of data. Can also be thought of
as the dispersion of data around the measures of Central Tendency
such as the mean.

Stable Process - a process which is under statistical control as well
as lacking in assignable or special causes of variation.

Standard Deviation - the main statistic to measure the spread or
dispersion of a distribution or of a process when applied with the use
of Control Charts.

Student’s t Distribution - used when the sample size is less than 50
or the variance of the distribution is unknown. This distribution
compensates for smaller sample sizes, and is used primarily for mean
comparisons or process capability studies.

Type I Error - see Alpha Error.

Type II Error - see Beta Error.

Variables Data - continuous data obtainable via measurable results
such as dimensional data (heights, widths), or electrical data
(resistance, current).

Variation - the degree of change in the spread of a distribution of
scores. Many things built by man and nature have some inherent
natural variability. This variation shows up graphically in a
distribution of scores.




Gregory Swartz, © 2008            (650) 274-6001                          Page 20

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Ops A La Carte Statistical Process Control (SPC) Seminar

  • 1. & We Provide You Confidence in Your Product ReliabilityTM Ops A La Carte / (408) 654-0499 / askops@opsalacarte.com / www.opsalacarte.com
  • 2. Statistical Process Control Greg Swartz // (650) 274-6001 // gregs@opsalacarte.com Ops A La Carte LLC // www.opsalacarte.com
  • 3. The following presentation materials are copyright protected property of Ops A La Carte LLC. These materials may not be distributed outside of your company.
  • 4. Presenter’s Biographical Sketch – Greg Swartz ◈Greg Swartz has worked successfully for over twenty years in the fields of statistics and process improvement, as a Consultant and Trainer. His consulting experience includes working with a number of Biotech, high tech companies, Aerospace, and Defense. His expertise includes analysis of technical data, a hands-on approach towards design of experiments, and Failure Analysis, e.g. with Ops A La Carte for Semiconductor Equipment. Greg was a Sr. Quality Program Manager at Sun Microsystems for 6 years. ◈Mr. Swartz has worked in the fields of Applied Data Analysis (ADA) techniques, yield improvement, quality assessments, and reliability studies. Additionally, Greg has a background in software reliability, CMM, and Software Product Life Cycle (SPLC). © 2008 Ops A La Carte
  • 5. Metrics and Statistical Process Control Level II for Operations, Engineering and Research Developed and Presented by: Greg Swartz, CQE Ops A La Carte April 11, 2008 Gregory Swartz, © 2008 (650) 274-6001 Page 1
  • 6. Metrics and Statistical Process Control Learning Objectives Overview: This Level II Statistical Process Control (SPC) course presents a number of valuable tools to assist you in evaluating process variation and to make sound decisions based on your data. Topics covered included the following: ♦ Pareto Charts and Check sheets for Attribute and Visual Data ♦ Histograms for understanding variation in measurable data ♦ Variables and Attribute Control Charts including p Charts for varying sample sizes ♦ Process Capability (Cp & Cpk) and Sample Size Determination ♦ Interpretation and Corrective Action including Out-Of-Control guidelines ♦ Correlation and Regression Studies with guard-banding techniques. Learning Objectives: Upon completion of this Metrics/SPC Level II course, participants will be able to do the following: ♦ Construct p, NP, and C Charts for attribute process control ♦ Be able to construct Ave. and Range control charts for variables data ♦ Construct 90 and 95% Confidence Intervals for process data. ♦ Distinguish between Process Control and Process Capability. ♦ Perform a Correlation Studies and interpret results. Gregory Swartz, © 2008 (650) 274-6001 Page 2
  • 7. Metrics/Statistical Process Control Level II Content Outline Chapter 1: INTRODUCTION TO SPC • Benefits of Metrics and SPC • SPC Tools — Overview • SPC Implementation Strategy Chapter 2: PROBLEM SOLVING TOOLS • Cause and Effect Diagrams (Fishbone) • Check Sheets • Pareto Analysis using Excel with ExcelTM Chapter 3: DESCRIPTIVE STATISTICS • Measures of Central Tendency and Variation • Histograms and Specification Limits • SPC vs. Process Capability Chapter 4: PROCESS CAPABILITY AND YIELD STUDIES • "Central Limit Theorem" • Cp and Cpk Indices — A practical approach • “t” Test and Confidence Intervals in Excel * Sample Size Determination Chapter5: PROCESS CONTROL TOOLS FOR VARIABLES DATA • X Bar & R Chart • X Bar & S Charts (n>10) (for reference) • Short Run Charting Techniques Chapter 6: PROCESS CONTROL TOOLS FOR ATTRIBUTE DATA • NP Charts and • P Charts (fraction defective) • C Charts Chapter 7: INTERPRETATION AND CORRECTIVE ACTION • Interpreting Trends and Shifts in Data • Planning Corrective Action • Implementing Continuous Process Improvement Chapter 8: CORRELATION AND REGRESSION Appendix Terms and Definitions Formula Summary Gregory Swartz, © 2008 (650) 274-6001 Page 3
  • 8. Metrics and Statistical Process Control Chapter One: Introduction to SPC • SPC is a tool that uses analytical techniques to: Investigating Monitoring Improving • SPC measures quality during the production process, using statistics to determine and maintain a state of process control in your area. • SPC ensures that quality is built into the product at each step, as shown in the overview process flow of Genotyping. Sample Combine Auto- Receiving (VI) QC Assays caller Bioinformatics Gregory Swartz, © 2008 (650) 274-6001 Page 1
  • 9. Metrics and Statistical Process Control Key Features of Implementing Metrics and SPC • Baseline Data 1st thing to do: catching abnormal variations where special causes to problems can be identified and corrected! • SPC responds to trends by making changes before reaching an out of control condition. Emphasis is on prevention, versus after the fact. • "Corrective action guidelines" are determined statistically, and are commonly known as Control Limits. • Corrective Action Planning can be performed by cross-functional metric improvement teams. Gregory Swartz, © 2008 (650) 274-6001 Page 2
  • 10. Metrics and Statistical Process Control Benefits of Measuring your process with SPC Improved customer satisfaction, both internal and external % % % % Increased product yield Failure rate = 1-yield % Reduced operating costs Improved product flow Increased profits Gregory Swartz, © 2008 (650) 274-6001 Page 3
  • 11. Metrics and Statistical Process Control Value Add of Statistical Process Control Process decisions are made based on ”Fact versus Opinion.” Increases knowledge base regarding analysis of your process data, in-process inspection, and improves your out-going quality! Improves long-term relationships between your company, suppliers, and your customers. Targets critical process, for product optimization and Capability, for example, in meeting Six Sigma criteria. Allows sound decision making, using empirical methods, versus opinions, or whims. Gregory Swartz, © 2008 (650) 274-6001 Page 4
  • 12. Metrics and Statistical Process Control Types of Data – Flowchart Raw Fabri- Assembly Test Materials cation TYPES OF DATA Variable Attribute Process Improvement with SPC! Gregory Swartz, © 2008 (650) 274-6001 Page 5
  • 13. Metrics and Statistical Process Control SPC Implementation - Overview Initially, Flowchart Your Process Variable Data i.e. measurable - Identify Critical costs, cycle time, or response time Product or Service or Process Parameters Attribute Data e.g. categorical - error types, PPM, defects by type Independent Causes Dependent Effect Use Cause & Effect Diagrams to Brainstorm all Cause Variables Use Pareto Charts to Prioritize $ Key Problem Areas Key Problem Areas Continue To Page 7 Gregory Swartz, © 2008 (650) 274-6001 Page 6
  • 14. Metrics and Statistical Process Control Continued Tools of Quality - (Con’t.) from Page 6 Do you 2 have one or Build a Scatter Y two variables Diagram ? 1 X Snapshot Y Do you No wish to display Construct a your data Histogram # over time ? Yes Measurement Scale X UCL Plot data over time on the chart, then Ave. calculate controls. LCL Time / Date Assign causes to out- of - control points Monitor Charts for with corrective action Improvement Gregory Swartz, © 2008 (650) 274-6001 Page 7
  • 15. Metrics and Statistical Process Control Symbols Summary Σ To Sum X Individual Score X Mean, or average R Range (max-min) σ or S Standard Deviation UCL Upper Control Limit LCL Lower Control Limit K # of groups n Subgroup sample size p Proportion Defective NP Number of Defects per sample C Number of defects per unit or area Cp Basic Capability Index Cpk Capability Index (including process shifts) t Used to determine yield with n < 30 Z Used to determine yield with large samples Gregory Swartz, © 2008 (650) 274-6001 Page 8
  • 16. Metrics and Statistical Process Control SPC Tools Overview Continuous Quality Improvement Need for Feedback Data based on data Type of Data Attribute Variables Data Data Check Histogram Process Yield Sheets Capability Improvement Pie Charts Two Yes Scatter- Variables grams Pareto Charts No Correlation Run Chart Attribute Charts Control Chart Gregory Swartz, © 2008 (650) 274-6001 Page 9
  • 17. Metrics and Statistical Process Control Chapter Two: Problem Solving Techniques • Process Flow Analysis • Cause and Effect Diagrams (Fishbone) • Check Sheets • Pareto Analysis with Excel Example Gregory Swartz, © 2008 (650) 274-6001 Page 10
  • 18. Metrics and Statistical Process Control Problem Solving Tools Flow Chart Start Big Picture Detailed Flowchart Check Sheet Pareto Analysis Determine NO Fishbone root cause?? Diagram YES Take Corrective Action pp. 9-13 Gregory Swartz, © 2008 (650) 274-6001 Page 11
  • 19. Metrics and Statistical Process Control Process Flow Chart Exercise: PROCESS FLOW STEPS A/V TYPES OF DATA Gregory Swartz, © 2008 (650) 274-6001 Page 12
  • 20. Metrics and Statistical Process Control Cause and Effect Diagrams (Ishikawa Diagram) • Cause and Effect Diagrams can be used for any service or product problem • Serve as the basis for group discussion and brainstorming • Effect could be a quality, yield or productivity problem • Provide guidance for concrete corrective action People Equipment Methods Effect (Problem) Causes (Independent Variables) Materials Measurement Environment 24-29 Gregory Swartz, © 2008 (650) 274-6001 Page 13
  • 21. Metrics and Statistical Process Control How to Create a Cause and Effect Diagram 1. Identify the problem (effect). 2. Brainstorm several causes — include all ideas generated without evaluating causes. 3. Identify and circle a branch for corrective action. CAUSES EFFECT pg. 24 Gregory Swartz, © 2008 (650) 274-6001 Page 14
  • 22. Metrics and Statistical Process Control Process Improvement Flow “Plan, Do, Check, Act” PDCA Method. Ca uses Effect Ne ed No Take More Data? Corrective Action Yes Ca use Tally Gregory Swartz, © 2008 (650) 274-6001 Page 15
  • 23. Metrics and Statistical Process Control Pareto Analysis (The 80-20 effect) Errors in a process are categorical (attribute) in nature where defects can easily be tallied with a check sheet. Pareto charts display the 80-20 effect. Key Advantages: • When you identify the “vital few” you improve your ability to identify the root causes to the majority of the problems. • By solving the largest problem decreases the overall percent defective product. • Cost benefit of product can be determined with the assistance of Pareto Analysis. • Solving major problems often reduces or eliminates the minor problems. 17-23 Gregory Swartz, © 2008 (650) 274-6001 Page 16
  • 24. Metrics and Statistical Process Control Procedure for Using Check Sheets for Pareto Charts 1. Rank causes by frequency of occurrence. 2. Calculate both percentage and Cum %. 3. Draw Pareto Diagram. 4. Concentrate corrective action on the "vital few." Pareto Analysis Worksheet Causes Tally Mark Freq. Rank % Smear II 2 Color IIII I 6 IIII IIII IIII IIII IIII Contaminatio IIII I 36 IIII IIII IIII IIII M isc. 24 IIII Misc.2 IIII 4 IIII IIII IIII IIII IIII IIII IIII IIII IIII IIII IIII IIII 78 empty well IIII III Totals 150 Gregory Swartz, © 2008 (650) 274-6001 Page 17
  • 25. Metrics and Statistical Process Control Procedure for Creating a Pareto Diagram in ExcelTM 1. Sort your cause categories so they are ranked (highest to lowest). 2. Create an ordered Check Sheet as in page 14. 3. Tabulate both % and Cum. % as in the table below: R a n k in g C auses Count F re q . (% ) C u m . (% ) 1 S c r a tc h e s 77 5 1 .3 0 % 5 1 .3 0 % 2 M is a lig n e d 36 2 4 .0 0 % 7 5 .3 0 % 3 M is c . 25 4 W ro n g # 11 5 6 4. Use the mouse to block off the causes, Frequency in %, and Cumulative %. 5. Use the Chart Wizard to create your Pareto Chart (see below). Partially Completed Pareto Exercise 0.6 100.00% 0.5 80.00% 0.4 60.00% 0.3 40.00% Freq. (%) 0.2 20.00% Cum. (%) 0.1 0 0.00% Scratches Misaligned Misc. Wrong # Gregory Swartz, © 2008 (650) 274-6001 Page 18
  • 26. Metrics and Statistical Process Control Procedure for Performing a Cost Pareto Analysis 1. List all possible causes to problem. 2. Tally frequency for each cause. 3. Assign option $ cost value to causes (unit cost). 4. Rank causes by total cost for each category. 5. Derive the cumulative cost. 6. Concentrate corrective action on the most costly cause(s). p.20 Gregory Swartz, © 2008 (650) 274-6001 Page 19
  • 27. Metrics and Statistical Process Control Cost ($) Pareto Procedure in Excel: 1. Create a new table with your Unit Cost per defect type 2. Determine your total cost by multiplying Unit $ x Freq. 3. Rank your whole table by (total) Cost, and then Create a Cumulative Cost Column 4. Swipe your mouse over the Causes, Cost, and Cumulative Cost. 5. Create a bar and line chart with the Chart Wizard 6. Comment on Leading Cost Issue and compare it with the Freq. Pareto Freq. Unit Cost (total) Cost 2 $ 0.015 $ 0.030 6 $ 0.010 $ 0.060 36 $ 0.030 $ 1.080 24 $ 0.005 $ 0.120 4 $ 0.005 $ 0.020 78 $ 0.010 $ 0.780 150 Gregory Swartz, © 2008 (650) 274-6001 Page 20
  • 28. Metrics and Statistical Process Control SPC Tools Integration 1. Use Pareto Diagram to determine the major causes of rejects. 1 1 2. Brainstorm possible causes for the biggest problem. 3. Plan Corrective Action Gregory Swartz, © 2008 (650) 274-6001 Page 21
  • 29. Metrics and Statistical Process Control Chapter Three: DESCRIPTIVE STATISTICS Concept Variation Measures of Central Tendency Measures of Variation Histograms and Specification Limits Coefficient of Variation (CV) Gregory Swartz, © 2008 (650) 274-6001 Page 22
  • 30. Metrics and Statistical Process Control Variation defined by Cause There are two types of causes of variation: • Normal causes of variation result from the problems in the system as a whole. • Abnormal causes of variation result from special problems within a system. Normal cause Abnormal cause common special random non-random systematic local expected irregular unidentifiable identifiable One recommended method is to identify abnormal causes of variation, first. And then, to continually reduce variation by effecting both abnormal and normal causes. Gregory Swartz, © 2008 (650) 274-6001 Page 23
  • 31. Metrics and Statistical Process Control Measures of Variation Variation: Spread, dispersion or scatter around the Central Tendency Range: Difference between the largest and smallest value (Max. – Min.) Standard Deviation ( σ or S ): A measure of the differences around the average. mean -3 o -2 o -1o X +1 o +2 o +3 o Normal Distribution Curve Gregory Swartz, © 2008 (650) 274-6001 Page 24
  • 32. Metrics and Statistical Process Control The Standard Deviation (Sigma) Sigma % of Distribution X +/- 1σ 68 % X +/- 2 σ (1.96) 95 % X +/- 3σ 99.97 % mean -3 o -2 o -1o X +1 o +2 o +3 o Gregory Swartz, © 2008 (650) 274-6001 Page 25
  • 33. Metrics and Statistical Process Control Histograms A histogram graphically represents the frequency of an attribute or variable, and displays its distribution of data as a snap shot representation. This visual format shows the variability of your data and can be use for further analysis, e.g. capability analysis. 160 140 N 120 u 100 m 80 b 60 e r 40 20 0 60 65 70 75 80 85 90 95 100 Yield Percentages pp. 36-43 Gregory Swartz, © 2008 (650) 274-6001 Page 26
  • 34. Metrics and Statistical Process Control Histograms vs. Specs LS US LS US 1 5 2 6 3 7 4 8 Gregory Swartz, © 2008 (650) 274-6001 Page 27
  • 35. Metrics and Statistical Process Control Standard Deviation Exercise Pick a sequence of seven numbers and list them below in the left column. Units. Determine the standard deviation. 2 X (X - X) (X - X) Σ 0 Σ (X-X)2 Formula: σ= n Gregory Swartz, © 2008 (650) 274-6001 Page 28
  • 36. Metrics and Statistical Process Control Standard Deviation for Attribute Data Binomial Standard Deviation or σp = p x (1 – p ) n Where, p is the average fraction defective ∑ np -------------- n is the average sample size Total N Standard Deviation Attribute Exercise: Given the following set of data, determine the standard deviation of the fraction defective, and then create a 95% confidence interval. Sample Sample # Size n np p = np/n 1 45 2 2 50 1 3 60 3 4 40 0 5 35 1 6 70 2 7 30 5 8 65 3 9 55 4 10 50 3 Totals 500 ∑ = 24 ∑= Gregory Swartz, © 2008 (650) 274-6001 Page 29
  • 37. Metrics and Statistical Process Control Coefficient of Variation The standard deviation depends on units as a measure of variation. A comparison of relative variation cannot be made using the standard deviation, so a unitless (dimensionless) measure called the coefficient of variation (CV) is used. population standard deviation = σ the population mean = μ sample standard deviation = S __ sample mean = X Sometimes the CV is normally expressed as a percentage. Then, the equation becomes: S CV % = 100 • X The Coefficient of Variation (CV) can be used to signal changes in the same group of data, or to compare the relative variability to two or more different sets of data. The larger the CV, the greater its relative variability. Gregory Swartz, © 2008 (650) 274-6001 Page 30
  • 38. Metrics and Statistical Process Control Coefficient of Variation for Variables Data Procedure: a. Determine the (Grand) Average of ROX at 2 Ul b. Determine the Std. Dev. of ROX c. Divide the Std. Dev. by the Average to obtain CV. d. Now repeat procedure for the .5 ul group e. Label each CV value f. Compare the relative variability between the two groups. 2 ul .5 ul Avg ROX % Genotyped Avg ROX % Genotyped 857.2 100 196.74 0 609.54 100 193.11 0 .5 ul 775.25 100 235.59 0 Ave. 471.18 742.79 100 174.13 0 Std. Dev. 52.61506 834.79 100 300.52 12.5 721.02 100 300.2 12.5 2ul 791.38 87.5 340.55 12.5 Ave. 731.602 834.03 37.5 192.79 0 Std. Dev. 69.75184 791.5 100 260.26 12.5 796.88 100 147.19 0 CV .5ul 0.111667 744.67 100 305.19 12.5 CV 2ul 0.095341 679.79 87.5 226.12 50 722.99 100 266.5 50 CV .5ul% 622.92 100 236.47 12.5 CV 2ul % 654.22 87.5 322.33 12.5 821.46 50 253.65 0 758.24 100 309.33 12.5 781.04 25 202.03 12.5 726.51 100 269.09 25 670.2 100 236.88 25 697.83 100 214.98 12.5 630.47 100 196.84 0 704.11 100 364.15 12.5 815.79 87.5 220.58 0 715.18 87.5 242.1 37.5 755.32 87.5 311.26 0 721.65 87.5 294.34 25 650.83 100 248.83 25 699.65 100 284.14 37.5 620.81 100 225.05 0 Gregory Swartz, © 2008 (650) 274-6001 Page 31
  • 39. Metrics and Statistical Process Control Attribute Coefficient of Variation Example Now, let’s try applying this concept to attribute data: __ Group one: Sp1 = .00142, P1 = .007 __ Group two: Sp2 = .00178, P2 = .01 Which group has the larger variability? Hint: At first you might be led to thinking that group two has the larger relative variation… CV1 = .00142/.007 x (100) = CV2 = .00178/.01 x (100) = Gregory Swartz, © 2008 (650) 274-6001 Page 32
  • 40. Metrics and Statistical Process Control Chapter Four: Process Capability, Yield and Attribute Proportion Tests This chapter includes the following key areas for effectively performing process capability studies, accurate yield determination, and testing for single and two sample proportions: • Central Limit Theorem σx • = σx n • X = X i • Cp and Cpk Indices • Yield Determination • Attribute Proportional Testing Gregory Swartz, © 2008 (650) 274-6001 Page 33
  • 41. Metrics and Statistical Process Control Central Limit Theorem (CLT) The CLT states that the average of individual values (X) tends to be normally distributed regardless of the individual (x) distribution. Individual Data: If you randomly selected 100 four-digit numbers and charted them, the distribution will be somewhat uniform. Each digit shows approximately the same frequency. 10 8 6 4 2 0 0 1 2 3 4 5 6 7 8 9 Phone Digit Chart the number 4186 by using one each of 4, 1, 8, and 6. Mean = 4.5225 Standard Deviation = 2.8266 Gregory Swartz, © 2008 (650) 274-6001 Page 34
  • 42. Metrics and Statistical Process Control Averages Data This histogram of average values shows the normal distribution of the averages. For example, each digit in the number 4286 would be averaged (4 + 2 + 8 + 6) = 20/4 = 5. Averages are distributed below: Averages Bar Chart 27 24 21 18 (#) 15 12 9 6 3 0 1 2 3 4 5 6 7 8 9 Phone Digit Midpoint Mean = 4.5225 Standard Deviation = 1.4133 Question: Can you now validate the Central Limit Theorem with the above example? Gregory Swartz, © 2008 (650) 274-6001 Page 35
  • 43. Metrics and Statistical Process Control Cp & Cpk: The Inherent Capability of a Process The Cp index relates the allowable spread of the specification limits (USL - LSL) to the actual variation of the process. The variation is represented by 6 sigma. USL − LSL Cp = 6σ If the tolerance width is exactly the same as the 6 standard deviations width, then you have a Cp = 1. 1.333 LSL X USL mean -3σ -2σ -1σ X +1σ +2σ +3σ 12.5% 75% 12.5% Gregory Swartz, © 2008 (650) 274-6001 Page 36
  • 44. Metrics and Statistical Process Control Cpk Defined Cpk expresses the worst case capability index — a process that is off-center. Cpk also takes into account the location of the process average. Cpk = the smaller result of the following two formulas: USL − X X − LSL C pu = or C pl = 3s 3s Where: Cpu = Upper Capability Index and Cpl = Lower Capability Index pp. 64-66 Gregory Swartz, © 2008 (650) 274-6001 Page 37
  • 45. Metrics and Statistical Process Control Process Capability Indices Example: Your boss attended this statistical seminar and is familiar with process capability indices. He or she threatens to take away your new sports car if the process capability indices (Cp) from the new oxide manufacturing process is not greater than 1.0. Tolerances = 250 to 400 μ Average = 300 μ sample S = 35 μ Question: Will you be driving to work in your old car tomorrow? Gregory Swartz, © 2008 (650) 274-6001 Page 38
  • 46. Metrics and Statistical Process Control 400 − 250 Cp = =.714 6(35) 6(35) Cratio = =1.4 400 − 250 400 − 300 Cpu = =.95 3(35) 300 − 250 Cpl = =.476 = Cpk 3(35) Your boss has taken away your new sports car. Gregory Swartz, © 2008 (650) 274-6001 Page 39
  • 47. Metrics and Statistical Process Control Process Capability Index Exercise Given the following specifications, determine Cp and Cpk. • Upper Spec. (US) = 100.0 • Lower Spec. (LS) = 24.0 • Mean (X) = • Sigma = Cp = _________ Cpk = _________ Gregory Swartz, © 2008 (650) 274-6001 Page 40
  • 48. Metrics and Statistical Process Control MEAS MIN MAX 26.81 24 100 26.67 24 100 26.9 24 100 27.04 24 100 26.63 24 100 26.92 24 100 26.73 24 100 26.8 24 100 26.94 24 100 26.85 24 100 27.54 24 100 27.22 24 100 25.84 24 100 25.77 24 100 26.93 24 100 26 24 100 26.96 24 100 25.79 24 100 27.04 24 100 25.98 24 100 27.48 24 100 27.03 24 100 26.92 24 100 27.69 24 100 26.83 24 100 25.38 24 100 25.87 24 100 26.81 24 100 27.36 24 100 27.3 24 100 26.73 Gregory Swartz, © 2008 (650) 274-6001 Page 41
  • 49. Metrics and Statistical Process Control Interpretation of Cp and Cpk Indices Cpk < 1.00 Not Capable Cp < 1 Cpk = 1.00 Barely Capable Cp = 1 Cpk > 1.33 Very Capable Cp = 1.33 Is the process truly capable of meeting the customer requirements? _________ Why or why not? Gregory Swartz, © 2008 (650) 274-6001 Page 42
  • 50. Metrics and Statistical Process Control Creating Confidence Intervals for Variables Data The fish and game commission have been feeding robin yearlings a special bird seed. Sample weights of 13 robins are listed below. What are the 95% and 99% confidence intervals? Procedure: 1. Determine the Mean and Std. Deviation of the data set. 2. Create Lower and Upper Confidence Intervals based on the “t” values provided. Data Set 95% Confidence Interval (Mean) (in Grams) Mean = 12.5 Std Dev.= Tinv(95)= 2.178813 12.3 n= 13 Tinv(99)= 3.05454 12.7 Confidencence Limits 12.5 Lower= 0 Upper= 0 12.4 12.1 12.6 12.7 99% Confidence Interval (Mean) 12.2 Mean = 12.1 StdDev= 11.9 n= 13 12.3 Confidence Limits 12.6 Lower 0 Upper 0 Sum = 160.9 Question: Why are we using “t” scores versus standardized “Z” scores? Gregory Swartz, © 2008 (650) 274-6001 Page 43
  • 51. Metrics and Statistical Process Control Sample Size Determination for Means and Proportions Determining a sample size for means. The formula for determining a sample size for a mean is Ζ 2σ 2 η= (χ − μ ) 2 The Ζ -value depends on the level of confidence required. Remembering that: A 99 percent confidence results in a Ζ -value of 2.58. A 95 percent confidence results in a Ζ -value of 1.96. A 90 percent confidence results in a Ζ -value of 1.645. σ is the standard deviation or variance. χ −μ is the difference between the sample mean and the population mean referred to as the error. Sample Size Determination Z-Value = 2.576321008 Std. Dev.= 0.75 error= 0.15 sample size= 165.9357483 Gregory Swartz, © 2008 (650) 274-6001 Page 44
  • 52. Metrics and Statistical Process Control Determining a sample size for proportion: The formula for determining a sample size for a proportion is n = Ζ 2 ( p 1− p ) (ρ − p )2 The Ζ -value depends on the level of confidence required. p is the population proportion if known. If the proportion is not known, π is assigned a value of .5 ρ − p is the difference between the sample proportion and the population proportion referred to as the error. The Easy technique for determining sample “n”: np > 5 Gregory Swartz, © 2008 (650) 274-6001 Page 45
  • 53. Metrics and Statistical Process Control Scenario: You have been selected as the “improvement Expert” in your lab to determine the appropriate “n” size per sample after your team has determined an average failure rate of .035. Due to new equipment in the lab an initial confidence level of 95% is selected, and degree of precision (error) @ .02. Procedure: 1. On a worksheet, key in the following information: Sample Size Determination - Proportion Z-Value= Pop.Prop.= error= sample size= #DIV/0! 2. In cell B3, input the Z value for 95% Confidence 3. In cell B4, input the failure rate 4. In cell B5, input the error. 5. In cell B6, key in =B3^2*B4*(1-B4)/B5^2 Questions: Gregory Swartz, © 2008 (650) 274-6001 Page 46
  • 54. Metrics and Statistical Process Control 1. What is the required random sample size for a degree of precision of .05? 2. What sample size is required for the same precision, with 99% confidence? Chapter Five: Process Control Tools for Variables Data ♦ X Bar and R Charts ♦ X Bar and S Charts (n>10) for reference ♦ Short Run SPC Charting Technique Gregory Swartz, © 2008 (650) 274-6001 Page 47
  • 55. Metrics and Statistical Process Control Control Limits • Help define acceptable variations of the process. • Are calculated and represent true capability of the target process, or where baseline metrics have been implemented. • Can change in time as the process improves. UCL X LCL 1 2 3 4 5 6 7 8 9 10 11 12 Time or Sample Number General Rule: Don’t apply specification limits on control charts. Gregory Swartz, © 2008 (650) 274-6001 Page 48
  • 56. Metrics and Statistical Process Control X and R Control Chart UCL x M E A S U R E x M E N T LCL x UCL R R Gregory Swartz, © 2008 (650) 274-6001 Page 49
  • 57. Metrics and Statistical Process Control Control Limits vs. Spec. Limits Control limits monitor the performance of the process. y UCL X Measure X LCL X X 1 2 3 4 5 6 7 8 9 10 time or sample number --> Spec. limits monitor the quality of the product as to the individual distribution below: X LS US Gregory Swartz, © 2008 (650) 274-6001 Page 50
  • 58. Metrics and Statistical Process Control Short Run SPC The Short Run Individual X and Moving Range Charts can be applied to the following: • Low production volume • Temperature, humidity, concentration of solutions • When data must be obtained at the end of a reporting period (per quarter, month, day) • When the testing is costly or time consuming Gregory Swartz, © 2008 (650) 274-6001 Page 51
  • 59. Metrics and Statistical Process Control X & R Charts Control Chart Plotting Procedure: 1. Accurately measure the required number of readings for the lot. 2. Calculate the mean. (Add readings together and divide by the number of readings.) 3.Calculate the range. (Subtract lowest reading from the highest reading.) 4. Plot both the mean and range on the SPC chart. Log the lot number and date. pg. 59 Gregory Swartz, © 2008 (650) 274-6001 Page 52
  • 60. Metrics and Statistical Process Control Example Data /Analysis for Control Date MEAS 1 Meas. 2 Meas. 3 Ave. Grand AveUCL LCL 1/18/2007 0:00 0.3637 0.3663 0.2118 1/19/2007 0:00 0.1322 0.426 0.2178 1/20/2007 0:00 0.09442 -0.02428 0.02284 1/21/2007 0:00 0.3333 0.1105 0.2807 1/22/2007 0:00 0.04403 0.2663 0.02492 1/23/2007 0:00 0.4842 0.1715 0.0816 1/24/2007 0:00 0.07829 0.1304 0.1919 1/25/2007 0:00 -0.04909 -0.09284 -0.2375 1/26/2007 0:00 0.1948 0.4446 -0.02368 1/27/2007 0:00 0.1614 -0.1326 0.2387 1/28/2007 0:00 -0.206 0.0127 0.2065 1/29/2007 0:00 0.0201 0.1632 0.2199 1/30/2007 0:00 0.04176 0.1323 0.2523 1/31/2007 0:00 0.338 0.09527 0.9097 2/1/2007 0:00 0.2842 -0.05588 -8.97 2/2/2007 0:00 -0.1014 0.04255 0.07366 2/3/2007 0:00 -0.2253 0.3117 0.2042 2/4/2007 0:00 6.543 0.2073 0.000886 2/5/2007 0:00 10.03 -0.1436 9.883 2/6/2007 0:00 0.2127 0.1612 0.4555 2/7/2007 0:00 0.4352 0.1162 0.1387 2/8/2007 0:00 0.744 0.2604 0.5681 2/9/2007 0:00 0.1054 0.2471 0.04124 2/10/2007 0:00 -0.2962 0.05815 0.6354 2/11/2007 0:00 0.4714 9.732 0.2281 2/12/2007 0:00 0.2151 0.0752 0.2977 2/13/2007 0:00 0.2146 0.6519 0.6632 2/14/2007 0:00 0.3294 0.7231 0.1349 2/15/2007 0:00 0.7159 0.2251 0.3108 2/16/2007 0:00 0.5853 0.4141 0.2791 Gregory Swartz, © 2008 (650) 274-6001 Page 53
  • 61. Metrics and Statistical Process Control Average Control Chart using 2 Sigma Limits Below is an Average Control Chart using the data from the previous page. Limits were generated in Excel at the 95% confidence interval using 1.96 Sigma + Grand Average. Control Chart of Plate Data w ith 2 Sigma Limits 180.0 175.0 170.0 165.0 Average 160.0 UCL 155.0 LCL 150.0 Grand Ave. 145.0 140.0 135.0 4 4 4 4 4 4 4 04 04 04 00 00 00 00 00 00 00 20 20 20 /2 /2 /2 /2 /2 /2 /2 4/ 6/ 8/ 10 12 14 16 18 20 22 1/ 1/ 1/ 1/ 1/ 1/ 1/ 1/ 1/ 1/ Interpretation: There is good reason with the above data set to consider implementing 2 Sigma Control Limits as shown. In this case, data point on 1/09/04 fell just outside the Upper Control Limit. Do you think 3 Sigma Limits would have caught the abnormal cause? Gregory Swartz, © 2008 (650) 274-6001 Page 54
  • 62. Metrics and Statistical Process Control Factors and Control Limits Shewhart Factors n 2 3 4 5 6 D4 3.268 2.574 2.282 2.115 2.004 D3 0 0 0 0 0 A2 1.880 1.023 0.729 0.577 0.483 d2 1.128 1.693 2.059 2.326 2.534 Control Limit Formulas UCL X = X + (A2• R) LCL X = X − (A2• R) UCL R = RD4 LCL = RD 3 R Gregory Swartz, © 2008 (650) 274-6001 Page 55
  • 63. Metrics and Statistical Process Control Exercise - Short-Run Control Charts Key Points for Plotting the X (individual) Control Charts: • X is the individual measurement to be plotted. • X is the average of the individual plot points. This becomes the center line for the control chart. • UCL is the Upper Control Limit and is calculated by: UCL = [ Average + (2 x σ) ] • LCL is the Lower Control Limit and is calculated by: LCL = [ Average - (2 x σ) ] Gregory Swartz, © 2008 (650) 274-6001 Page 56
  • 64. Metrics and Statistical Process Control Creating a Short-Run Control Chart in ExcelTM 1. Arrange your data from left to right as seen in table below. 2. Assign a # or date for the individual data being collected (see table below). 3. Calculate the average of your data with the function wizard and create separate rows repeating the average across all data points. 4. Determine the Standard Deviation (σ ) with the function wizard. 5. Calculate the Upper & Lower Control Limits (UCL & LCL) by multiplying the Standard Deviation times 2, and then both add and subtract the product from the [X ± (2 xσ )] 6. Repeat the Control Limits across all data points. 7. Use the mouse to block off date, data, average, & control limits. 8. Use the Chart Wizard to create your Control Chart (see below). 9. Interpret Control Chart for shifts, trends, or out-of-control points. pp. 51-63 Gregory Swartz, © 2008 (650) 274-6001 Page 57
  • 65. Metrics and Statistical Process Control Variables Data Excel Exercise 1. Determine Averages across date or assay type 2. Create Upper Control Limit = Ave. plus 1.96 Std. Dev. 3. Create Lower Control Limit = Ave. minus 1.96 Std. Dev. 4. Create 3 additional columns for UCL, LCL, and Ave. 5. Swipe Mouse over Dates, Averages, UCL, LCL, and Average 6. Use chart wizard to create a multiple line chart 7. Include Interpretation Section for Out-Of-Control points Date Phred 20 Ave. UCLx LCLx 5/1/2007 351 5/2/2007 375 5/3/2007 368 5/4/2007 364 5/5/2007 321 5/6/2007 289 5/7/2007 325 5/8/2007 366 5/9/2007 378 5/10/2007 347 5/11/2007 339 5/12/2007 335 5/13/2007 389 5/14/2007 348 5/15/2007 354 5/16/2007 368 5/17/2007 356 5/18/2007 392 5/19/2007 373 5/20/2007 352 Sum= Ave. = Std. Dev.= Questions: 1. Since the above Phred scores are individual readings, what might be a realistic lower specification limit? 2. What degree of confidence in % have you created with your control limits? Gregory Swartz, © 2008 (650) 274-6001 Page 58
  • 66. Metrics and Statistical Process Control Now: Let’s try this with another example with min and max specifications: Date MEAS MIN MAX 7/23/2007 26.81 24 100 7/24/2007 26.67 24 100 7/25/2007 26.9 24 100 7/26/2007 27.04 24 100 7/27/2007 26.63 24 100 7/28/2007 26.92 24 100 7/29/2007 26.73 24 100 7/30/2007 26.8 24 100 7/31/2007 26.94 24 100 8/1/2007 26.85 24 100 8/2/2007 27.54 24 100 8/3/2007 27.22 24 100 8/4/2007 25.84 24 100 8/5/2007 25.77 24 100 8/6/2007 26.93 24 100 8/7/2007 26 24 100 8/8/2007 26.96 24 100 8/9/2007 25.79 24 100 8/10/2007 27.04 24 100 Gregory Swartz, © 2008 (650) 274-6001 Page 59
  • 67. Metrics and Statistical Process Control Control Chart Tools Overview Data Yes/No Measurable Good/Bad Pass/ Fail Variable Data Attribute Data Defects Defects Unlimited Limited X/MR X/R Chart X/S Chart c Chart u Chart p Chart np Chart Chart Sample Sample Fixed Variable Variable Fixed size less size more Individuals Sample Sample Sample Sample than 7 than 6 Size Size Size Size Gregory Swartz, © 2008 (650) 274-6001 Page 60
  • 68. Metrics and Statistical Process Control Chapter Six: Process Control Tools For Attribute Data NP Charts - # of defective in a sample (sample size is constant P Charts - fraction defective (sample size can vary C Charts - # of defects per unit SPC Charting Guidelines Gregory Swartz, © 2008 (650) 274-6001 Page 1
  • 69. Metrics and Statistical Process Control Attribute Control Charts Attribute Control Charts consist of primarily three basic types of charts following the binomial and poisson distributions: • np Charts - used for monitoring the # of defects per sample when the sample size is constant, for example, n = 50. • p Charts - can be used either with a constant sample size or variable sample (n) size. (variable control limits or average control limits may be imposed) • c Charts – is applicable for the number on defects per sample unit, e.g. # of defects on a car. Sample unit size is constant. • u Charts – is used in the same way as a c Chart, but the sample unit size may vary. Gregory Swartz, © 2008 (650) 274-6001 Page 2
  • 70. Metrics and Statistical Process Control p Chart Formulas NP Chart Formulas ( p 1− p ) UCL p = p + 3. n ( UCLnp = np + 3. np 1 − p ) ( p 1− p ) LCL p = p − 3. n ( LCLnp = np − 3. np 1 − p ) C Chart Formulas UCLc = c + 3. c LCLc = c − 3. c Gregory Swartz, © 2008 (650) 274-6001 Page 3
  • 71. Metrics and Statistical Process Control Benefits of an “Attribute P Chart” Allows for accurate monitoring of fraction defective. Control Limits act as guidelines when your process is producing bad product. The average fraction defective is a good indicator of “Failure Rate.” Attribute P Chart Procedure 1. Determine fraction defective for each sample in adjacent column 2. Calculate the average fraction defective (Ave. p) into additional column 3. Determine the Std. Dev. Of the proportion defective. 4. Create Upper and Lower Control Limits based on 1.96 Sigma 5. Drag mouse over p, Ave. p, UCLp, and LCLp 6. Create multiple line chart in Chart Wizard 7. Interpret Results and comment on Outliers Gregory Swartz, © 2008 (650) 274-6001 Page 4
  • 72. Metrics and Statistical Process Control P Chart Exercise with variable sample sizes in Excel Instructions: Using the data set below with varying sample n, construct a P Chart in Excel, using +/- 2.58 standard deviation limits. Question: What confidence Interval am I generating? sample n np (defects np/n =p Ave. p UCLp LCLp 1 50 2 0.040 2 35 4 0.114 3 45 3 0.067 4 65 5 0.077 5 75 1 0.013 6 35 3 0.086 7 45 2 0.044 8 75 3 0.040 9 50 2 0.040 10 45 5 0.111 11 58 8 0.138 12 25 5 0.200 13 40 3 0.075 14 60 1 0.017 15 80 0 0.000 16 65 1 0.015 17 46 4 0.087 18 50 3 0.060 19 25 4 0.160 20 85 5 0.059 Totals 1054 64 Average P 0.060721 Questions: 1. Is the average fraction defective a good indicator of the failure rate? 2. What processes would lend themselves to p charts in your lab areas? Gregory Swartz, © 2008 (650) 274-6001 Page 5
  • 73. Metrics and Statistical Process Control Process Control Tools Overview Flowchart Data Attribute Variable Display Display Data Over Data Over Time? Time? No Yes No Yes Check Data X and MR P, NP, or Sheet Collection Run Chart C Charts Sheet _ Pareto X and R Chart Histogram Control Chart Pie Process Chart Capability Tools Gregory Swartz, © 2008 (650) 274-6001 Page 6
  • 74. Metrics and Statistical Process Control Chapter Seven: INTERPRETATION & CORRECTIVE ACTION • Interpreting Trends and Shifts in Data • Planning Corrective Action • Implementing Continuous Process Improvement Gregory Swartz, © 2008 (650) 274-6001 Page 7
  • 75. Metrics and Statistical Process Control Control Chart Interpretation • Detecting "Out-of-Control" Conditions • Assigning Causes to Problems • Guidelines for Control and Stability Corrective Action • Assigning Causes to Problems • Selecting SPC Tools • Corrective Action Plan • SPC Report Form Gregory Swartz, © 2008 (650) 274-6001 Page 8
  • 76. Metrics and Statistical Process Control Detecting Out of Control Conditions Bonnie Small's guidelines for interpreting control chart data • Points beyond the control limits usually indicate: - The process performance is sporadic - Measurement has changed (inspector, shift, gage, etc.) • Runs indicate a shift or trend. Runs include: - 7 points in a row on one side of the average - 7 points in a row that are consistently increasing or decreasing • Non-random patterns may indicate: - The plot points have been miscalculated or misplotted. - Subgroups may have data from two or more processes Gregory Swartz, © 2008 (650) 274-6001 Page 9
  • 77. Metrics and Statistical Process Control Determine whether Bonnie Small rules were broken: • One average (mean) above or below control limit. • Seven consecutive averages (means) above or below the center line. • A trend of seven consecutive points in an upward or downward trend. Now, take corrective action as follows: 1. Circle the point or group of points 2. Comment on the cause(s) of the unstable point(s). 3. Detail Corrective Action Plan. Gregory Swartz, © 2008 (650) 274-6001 Page 10
  • 78. Metrics and Statistical Process Control Taking Corrective Action • Implementing change in the process • Identify key problem area(s) • Determine root cause(s) • Document causes and Corrective Action • Implement SPC Team Action Plan Gregory Swartz, © 2008 (650) 274-6001 Page 11
  • 79. Metrics and Statistical Process Control SPC Report Form Name: Date: Department: Extension: Statement of the Problem: Corrective Action Objective: Method: Results: (attach charts, data analysis to form) Corrective Action/Recommendation: Gregory Swartz, © 2008 (650) 274-6001 Page 12
  • 80. Metrics and Statistical Process Control Chapter Eight: Correlation and Regression Procedure for Creating a Scatter Diagram in ExcelTM Arrange your paired (X and Y) data in table format. Assign a # for each pair of data being collected (see table below). Conc. % Genotype 1.50 72 1.00 65 2.50 87 1.00 63 3.00 92 4.00 95 1.00 60 2.00 80 1.50 68 3.00 90 Use the mouse to block off the X and Y data columns. Use the Chart Wizard to create your Scatter Diagram. Gregory Swartz, © 2008 (650) 274-6001 Page 13
  • 81. Metrics and Statistical Process Control Appendix: Terms & Definitions: Acceptance Criteria -the amount of acceptable rejects before a lot will be rejected based on the sample. Used in sampling plans as the criteria for passing or failing a lot of items inferred from the sample. Acceptable Quality Level (AQL) - a coordinate point for the fraction defective on the x axis of the Operating Characteristic Curve of an attribute sampling plan. This point is the region of good quality and reasonably low rejection probability - 5% alpha error. Accuracy - how close a measurement comes to its actual value. In a particular process, accuracy could be a function of calibration. See Precision. Alpha Error - the probability of error in making an assumption incorrectly. In sampling plans, it is the probability of rejecting a lot which is truly good. In Control Charts, it is the assumption that a process point is out-of-control, when in fact it is not, and is due to statistical chance alone. Therefore, the smaller the alpha error in any case, the more confidence there is in the result(s) we‘ve obtained. Analysis - implies some conclusion based on statistical results in order to interpret some meaning from the statistical test(s) performed. Interpretation. Ambient -certain intervening variables in a environment that have some effect on the result being measured. Generally, ambient variables or factors in an industrial environment are those which are not wanted, such as dust particles, temperatures, or sources of light. Arithmetic Average - the mean of the distribution. It is a measure of Central Tendency indicating the center weight of a distribution of scores. Assignable Causes - those causes to problems which are sporadic in nature and not due to statistical chance alone. Assignable causes can be assigned a reason as to why that problem point exists. Usually, points outside of control chart limits are associated with an assignable cause and this cause can be identified. Attribute Data - qualitative data based on the absence or presence of a characteristic, usually determined by a specification. Common types of attribute data would include: go no-go data, pass-fail, Gregory Swartz, © 2008 (650) 274-6001 Page 14
  • 82. Metrics and Statistical Process Control accept/reject, yield/reject. Attribute data is based on binomial population of mutually exclusive events designated by P and Q= (1-P). Average Outgoing Quality (A.O.Q.) - based on the fraction defective (P) and the probability of acceptance (PA) for that fraction defective. Also takes into account the characteristics of an attribute sampling plan, that is, its sample size and decision criteria. A.O.Q. = P.A. x P. Average Outgoing Quality Limit (A.O.Q.L.) - the threshold point on the A.O.Q. curve. It is the worst possible case outgoing quality, and is generally derived from the area of indifference off the Operating Characteristic Curve. Awareness - attention to the relationships between quality and productivity. Directing this attention to the requirement for management commitment and statistical thinking leads toward improvement. Beta Error - In sampling plans, beta error is associated with the L.T.P.D. point and implies a 10% risk in accepting a lot which is truly rejectable. In hypothesis testing, it is the error made in rejecting an alternative hypothesis when in fact, it is true. In control charts, beta is the error made in assuming the process is in control when in fact, it is not. Bimodal Distribution - a distribution having two modes depicted by two distinctive humps in the curve. The presence of two frequently occurring scores, or groups of scores is noticeable. Binomial Distribution - A discrete probability distribution for attributes data that applies to the conformance and non conformance of units. This distribution also is the basis for attribute control charts such as p and np charts. Capability - whether or not product is truly capable of conforming to specifications. This capability can only be determined after the process is in statistical control. A process may be defined as being truly capable when the aim of the process is well centered and the variance or spread of the process on an individual unit basis does not exceed the specification limits. Cause and Effect Diagram - a simple tool for individual or group problem-solving that uses a graphic description of the various process elements to analyze potential sources of process variation. Also called Gregory Swartz, © 2008 (650) 274-6001 Page 15
  • 83. Metrics and Statistical Process Control a fishbone diagram (because of its appearance) and developed by Ishikawa. Capricious Data - the natural occurring chaos in all things, or the unexpected results one derives from attempting to sort out dirty data, like sudden shifts or abnormal changes. Central Limit Theorem (C.L.T.) - when collecting a distribution of averages or subgroup scores, the distribution will tend to centralize around the center value. The distribution will be evenly distributed about the mean or average. This is true if the averages are sampled from an abnormal distribution (skewed, bimodal, etc.). Control - in Statistical Quality Control, control means to get a handle on the process and be able to manipulate it in a desirable fashion. Control Charts - a tool one uses to visualize a particular process over time and/or across units. It is a way to graphically represent a parameter in an unbiased manner. The various types of control charts are as follows: C Charts - used to depict the number of defects per unit. For example, the number of defects per automobile. An average number of defects per automobile can also be obtained - (C bar). P Charts - used when the Percent or Fraction Defective is graphically desired. It depicts the fraction defection per sample, and an average can be obtained. NP Charts - used to the depict the number of defects per sample. Similar to a C Chart, NP easily counts the number of defects which makes charting fairly simple. The main requirement for a NP Chart is the sample size must remain constant. R Charts - used to monitor the range variation when collecting averaged or subgroup data. Usually seen in conjunction with an X Bar Chart, the range chart gives information to the variance of a process over time, across units, or across samples. S Charts - similar to R charts and measure the process variation via the sample standard deviations. The S Chart is especially applicable with larger sample sizes. Gregory Swartz, © 2008 (650) 274-6001 Page 16
  • 84. Metrics and Statistical Process Control X Bar Charts - used to monitor variables data (continuous variables) over time. Generally, X Bar Charts, graphically represent averages or groups of data over time. They serve as a good indication of any process which has been identified as a problem area or for monitoring purposes. Control Limits - c the boundary lines set up on any control chart for the purpose of determining whether a process is in or out of control. Typically, the area between the control limits account for 99.7% of the distribution of scores making up the control chart. When control limits are set plus and minus three sigma (standard deviations), it will accommodate again 99.7% of the distribution. Control Limits for Averages - when taking average or subgroup data, these limits are used for averages on an X Bar Chart. They also serve as a boundary parameter for a majority of the scores being marked on the chart (99.7%), but in this case it applies for averages and not individual scores. Control Limits for Individuals - also known as the natural process limits help determine, with 99.7% confidence, where the expected process will go. Because these limits are for individual scores, they assist in determining the yield for a particular process. Cost-Effectiveness - The reduction of quality costs, such as rework, and waste, makes any operation more cost-effective. By being cost- effective, savings and efficient operations will ensue. Quality is really free, it only cost money when you don’t have it. Fault-Tree Analysis - is a brainstorming and communication tool in order to figure out all the possible causes to any particular yield, productivity, or quality problem. This tool uses a fish-bone diagram to analyze all the possible causes to an identified problem in the categorized areas of People, Equipment, Specifications, Flow, Raw Materials, and Measurement. Kurtosis - Refers to the height of a distribution of scores. Platykurtic means a flat and very dispersed distribution, whereas leptokurtic means a tall and very tightened distribution. L.T.P.D. - Lot Tolerance Percent Defective. Let Them Pay Dearly. This particular defective level is guaranteed with 90% confidence of meeting the plan, and a 10% Beta Error or probability of rejection. See Beta Error. Gregory Swartz, © 2008 (650) 274-6001 Page 17
  • 85. Metrics and Statistical Process Control Mean - arithmetic average. Measure - the dictionary defines measure as the dimensions, quantity, or capacity of anything ascertained by a scale or by the variable condition. In S.Q.C., measure could be a reference standard or sample used for the quantitative comparison of properties. Median - is the middle score when the scores are ranked from highest to lowest or lowest to highest. When the median is resolved half of the scores will be on one side, and the other half will be on the other side. Methodology - the systematic way in which an application is addressed to a problem. S.Q.C. methodology involves a logical approach with statistical tools to effectively solve problems. Midpoint - in reference to cell intervals, it is the middle point of any particular cell. Modified Control Limits - are generally performed when the process is well within the Specification Limits, and both the upper and lower specification limits are outside the natural limits of the process. Mode - a measure of central tendency indicating where the most frequently occurring score or group of scores lies in a distribution. Motivation - the impetus influencing the use of S.P.C. to its maximum potential. Participation. Normal - a continuous, symmetrical, bell-shaped frequency distribution for variables data which is the basis for control charts for variables. The mean, median, and mode are approximately the same, and a standard deviation (S) exists where plus and minus one S = 68%, plus and minus two S = 95%, and plus and minus three S = 99.7% which is a standard setting for control charts limits. Pareto Chart - A simple tool for problem-solving that involves making all potential problem areas or sources of variation. Pareto was an Italian economist who resolved that a majority of the wealth resides in Gregory Swartz, © 2008 (650) 274-6001 Page 18
  • 86. Metrics and Statistical Process Control a few elite or upper class. In relation to a process, this means a few causes account for most of the cost (or variation). Poisson Distribution - Another discrete probability distribution for attributes data used as an approximation to the binomial. It can be used when p<.1 and np<5. It is the basis for C charts using attributes data. Prevention - a strategy for maintenance of a process. This implies an awareness of potential problems that can occur in the process and to act on those problems before an “out-of-control” situation happens. A preventative maintenance program (PM). Process - a series of events leading to a desired result or product. A process can involve any part of a business. Process Control - having a process behave under an expected frequency of occurrence or within the limits which have been statistically derived. It is a state in which all the points fall in and around the average in a random manner and very few of these approach the limits of the distribution. Quality - usually determined by the customer, quality is a current issue today that challenges U.S. companies to surpass its competition. Quality gives a product a characteristic of customer satisfaction. If we care for good quality we should have the priority of pleasing our customer. Randomness - the state of collecting individual data values without any expected frequency or basis. They may become defined once a distribution is perceived. Range - the difference between the minimum and maximum score. Sample - a known quantity designated by (n) or the size of the sample. It is randomly pulled from a population parameter in order to provide statistical data. Statistics - derived from a sampled population, the information is arranged to make interpretation of the data easy and to infer something about the population from the sample which has been randomly drawn. Gregory Swartz, © 2008 (650) 274-6001 Page 19
  • 87. Metrics and Statistical Process Control Special Cause - cause attributable to an assignable item off the x axis of a control chart. Special Causes are People, Machine, Materials, etc. Specification - These may be quality specs. or product specs. They are set by engineering or determined by the demands of the customer, keeping in mind Deming’s philosophy: “The customer is King”. Spread - variability in a distribution of data. Can also be thought of as the dispersion of data around the measures of Central Tendency such as the mean. Stable Process - a process which is under statistical control as well as lacking in assignable or special causes of variation. Standard Deviation - the main statistic to measure the spread or dispersion of a distribution or of a process when applied with the use of Control Charts. Student’s t Distribution - used when the sample size is less than 50 or the variance of the distribution is unknown. This distribution compensates for smaller sample sizes, and is used primarily for mean comparisons or process capability studies. Type I Error - see Alpha Error. Type II Error - see Beta Error. Variables Data - continuous data obtainable via measurable results such as dimensional data (heights, widths), or electrical data (resistance, current). Variation - the degree of change in the spread of a distribution of scores. Many things built by man and nature have some inherent natural variability. This variation shows up graphically in a distribution of scores. Gregory Swartz, © 2008 (650) 274-6001 Page 20