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Deviation Detection in Process Enactment
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Fahad Golra
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for instrumentation study
Controlling interests editors
Controlling interests editors
eldhoev
Functional verification is one of the key bottlenecks in the rapid design of integrated circuits. It is estimated that verification in its entirety accounts for up to 60% of design resources, including duration, computer resources and total personnel. The three primary tools used in logic and functional verification of commercial integrated circuits are simulation (at various levels), emulation at the chip level, and formal verification.
Functional verification techniques EW16 session
Functional verification techniques EW16 session
Sameh El-Ashry
Electronics & Communication Engineering, Computational mathematics, Image processing, Civil Engineering, Structural Engineering, Environmental Engineering, VLSI Testing & Low Power VLSI Design etc.
C044061518
C044061518
IJERA Editor
Tian's ASE 2013 Presentation
Personalized Defect Prediction
Personalized Defect Prediction
Sung Kim
Yida's FSE presentation.
Automatically Generated Patches as Debugging Aids: A Human Study (FSE 2014)
Automatically Generated Patches as Debugging Aids: A Human Study (FSE 2014)
Sung Kim
As the complexity of Very Large Scale Integration (VLSI) is growing, testing becomes tedious and tougher. As of now fault models are used to test digital circuits at the gate level or below that level. By using fault models at the lower levels, testing becomes cumbersome and will lead to delays in the design cycle. In addition, developments in deep submicron technology provide an opening to new defects. We must develop efficient fault detection and location methods in order to reduce manufacturing costs and time to market. Thus there is a need to look for a new approach of testing the circuits at higher levels to speed up the design cycle. This paper proposes on Register Transfer Level (RTL) modeling for digital circuits and computing the fault coverage. The result obtained through this work establishes that the fault coverage with the RTL fault model is comparable to the gate level fault coverage.
FAULT MODELING OF COMBINATIONAL AND SEQUENTIAL CIRCUITS AT REGISTER TRANSFER ...
FAULT MODELING OF COMBINATIONAL AND SEQUENTIAL CIRCUITS AT REGISTER TRANSFER ...
VLSICS Design
Introduction to SOC Verification Fundamentals and System Verilog language coding. Explains concepts on Functional Verification methodologies used in industry like OVM, UVM
SOC Verification using SystemVerilog
SOC Verification using SystemVerilog
Ramdas Mozhikunnath
system verilog
system verilog
Vinchipsytm Vlsitraining
Recommandé
for instrumentation study
Controlling interests editors
Controlling interests editors
eldhoev
Functional verification is one of the key bottlenecks in the rapid design of integrated circuits. It is estimated that verification in its entirety accounts for up to 60% of design resources, including duration, computer resources and total personnel. The three primary tools used in logic and functional verification of commercial integrated circuits are simulation (at various levels), emulation at the chip level, and formal verification.
Functional verification techniques EW16 session
Functional verification techniques EW16 session
Sameh El-Ashry
Electronics & Communication Engineering, Computational mathematics, Image processing, Civil Engineering, Structural Engineering, Environmental Engineering, VLSI Testing & Low Power VLSI Design etc.
C044061518
C044061518
IJERA Editor
Tian's ASE 2013 Presentation
Personalized Defect Prediction
Personalized Defect Prediction
Sung Kim
Yida's FSE presentation.
Automatically Generated Patches as Debugging Aids: A Human Study (FSE 2014)
Automatically Generated Patches as Debugging Aids: A Human Study (FSE 2014)
Sung Kim
As the complexity of Very Large Scale Integration (VLSI) is growing, testing becomes tedious and tougher. As of now fault models are used to test digital circuits at the gate level or below that level. By using fault models at the lower levels, testing becomes cumbersome and will lead to delays in the design cycle. In addition, developments in deep submicron technology provide an opening to new defects. We must develop efficient fault detection and location methods in order to reduce manufacturing costs and time to market. Thus there is a need to look for a new approach of testing the circuits at higher levels to speed up the design cycle. This paper proposes on Register Transfer Level (RTL) modeling for digital circuits and computing the fault coverage. The result obtained through this work establishes that the fault coverage with the RTL fault model is comparable to the gate level fault coverage.
FAULT MODELING OF COMBINATIONAL AND SEQUENTIAL CIRCUITS AT REGISTER TRANSFER ...
FAULT MODELING OF COMBINATIONAL AND SEQUENTIAL CIRCUITS AT REGISTER TRANSFER ...
VLSICS Design
Introduction to SOC Verification Fundamentals and System Verilog language coding. Explains concepts on Functional Verification methodologies used in industry like OVM, UVM
SOC Verification using SystemVerilog
SOC Verification using SystemVerilog
Ramdas Mozhikunnath
system verilog
system verilog
Vinchipsytm Vlsitraining
In considering the techniques that may be used for digital circuit testing, two distinct philosophies may be found, First is Functional Testing, which undertake a series of functional tests and check for the correct (fault free) 0 or 1 output response. It does not consider how the circuit is designed, but only that it gives the correct output during test and second one is Fault Modelling in whichto consider the possible Faults that may occur within the circuit, and then to apply a series of tests which are specifically formulated to check whether each of these faults is present or not.The faults which are likely to occur on the wafer during the manufacture of the ICs, and compute the result on the circuit output(s) with or without each fault present. Each of the final series of tests is then designed to show that a particular fault is present or not.
Faults in Digital VLSI Circuits
Faults in Digital VLSI Circuits
ijsrd.com
this ppt presents a brief information about testability and automatic test pattern generation used in making of CMOS circuits
Design for testability and automatic test pattern generation
Design for testability and automatic test pattern generation
Dilip Mathuria
this ppt presents various types of faults and testings in vlsi
Vlsi testing
Vlsi testing
Dilip Mathuria
Programs are susceptible to malformed data coming from untrusted sources. Occasionally the programming logic or constructs used are inappropriate to handle all types of constraints that are imposed by legal and well-formed data. As a result programs produce unexpected results or even worse, they may crash. Program behavior in both of these cases would be highly undesirable. In this thesis work, we present a novel hybrid approach that saves programs from crashing when the failures originate from malformed strings or inappropriate handling of strings. Our approach statically analyses a program to identify statements that are vulnerable to failures related to associate string data. It then generates patches that are likely to satisfy constraints on the data, and in case of failures produce program behavior which would be close to the expected. The precision of the patches is improved with the help of a dynamic analysis. The patches are activated only after a failure is detected, and the technique incurs no runtime overhead during normal course of execution, and negligible overhead in case of failures. We have experimented with Java String API, and applied Clotho to several hugely popular open-source libraries to patch 30 bugs, several of them rated either critical or major. Our evaluation shows that Clotho is both practical and effective. The comparison of the patches generated by our technique with the actual patches developed by the programmers in the later versions shows that they are semantically similar.
Clotho: Saving Programs from Malformed Strings and Incorrect String-handling